Test probe (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Test probe" in English language version.

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Ford, Doug (October 2009), "The Secret World of Oscilloscope Probes" (PDF), Silicon Chip, Silicon Chip Publications: 16–23
Doug Ford, "The Secret World of Oscilloscope Probes", Silicon Chip magazine, Oct 2009, accessed 2016-10-19

US 2883619, Kobbe, John R. & Polits, William J., "Electrical Probe", published 1959-04-21
US 3532982, Zeidlhack, Donald F. & White, Richard K., "Transmission Line Termination Circuit", published 1970-10-06

Wedlock, Bruce D.; Roberge, James K. (1969), Electronic Components and Measurements, Prentice-Hall, Bibcode:1969ecm..book.....W, ISBN 0-13-250464-2

Williams, Jim; Beebe, David (January 2009), Diode Turn-On Time Induced Failures in Switching Regulators: Never Has so Much Trouble Been Had By so Many with so Few Terminals (PDF), Application Notes, Linear Technology, Appendix C: About Z₀ Probes, AN122f, If R1 equals 450Ω, 10x attenuation and 500Ω input resistance result. R1 of 4950Ω causes a 100x attenuation with 5k input resistance. The 50Ω line theoretically constitutes a distortioness transmission environment. The apparent simplicity seemingly permits 'do-it-yourself' construction but this section's remaining figures demonstrate a need for caution.
Williams 1991. Using probes, pp. 8–10; Appendix A: ABCs of probes, pp.69–81, by Tektronix. Appendix E: An Ultra-Fast High Impedance Probe, pp. 96–97, describes an active probe with 58 MHz bandwidth. Williams, Jim (August 1991), High Speed Amplifier Techniques: A Designer's Companion for Wideband Circuitry (PDF), Application Note, Linear Technology, AN-47

"Active FET Probes | Tektronix". Archived from the original on 2012-06-06. Retrieved 2012-05-02.

"Active FET Probes | Tektronix". Archived from the original on 2012-06-06. Retrieved 2012-05-02.