Transmission Electron Aberration-Corrected Microscope (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Transmission Electron Aberration-Corrected Microscope" in English language version.

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13doi.org

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8nih.gov

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7worldcat.org

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6web.archive.org

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4harvard.edu

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3lbl.gov

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2semanticscholar.org

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2books.google.com

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2science.org

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2sciencedirect.com

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2patents.google.com

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2oup.com

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2arxiv.org

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1cern.ch

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1microscopy.org

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1nature.com

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1seattletimes.com

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1royalsocietypublishing.org

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1elsevier.com

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arxiv.org

Vega Ibanez, Francisco; Beche, Armand; Verbeeck, Jo (2024). "Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?". Microscopy and Microanalysis. 29 (1): 341–351. arXiv:2205.07697. doi:10.1017/S1431927622012260.
Ribet, Stephanie M; Zeltmann, Steven E; Bustillo, Karen C; Dhall, Rohan; Denes, Peter; Minor, Andrew M; dos Reis, Roberto; Dravid, Vinayak P; Ophus, Colin (2023-12-21). "Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis. 29 (6): 1950–1960. arXiv:2303.09693. doi:10.1093/micmic/ozad111. ISSN 1431-9276. PMID 37851063.

books.google.com

Orloff, Jon (1997). Orloff, Jon; Chemical Rubber Company (eds.). Handbook of Charged Particle Optics. Boca Raton, Fla.: CRC Press. p. 234. ISBN 978-0-8493-2513-7.
Ernst, Frank (2003). Rühle, Manfred; Ernst, F. (eds.). High-Resolution Imaging and Spectrometry of Materials. Springer series in materials science. Berlin ; New York: Springer. p. 237. ISBN 978-3-540-41818-4.

cern.ch

accelconf.web.cern.ch

Rose, H. (2005). "Aberration Correction in Electron Microscopy" (PDF). Proceedings of the 2005 Particle Accelerator Conference. pp. 44–48. doi:10.1109/PAC.2005.1590354. ISBN 0-7803-8859-3. S2CID 122693745. Retrieved 5 April 2020.

doi.org

Scherzer, Otto (September 1936). "Über einige Fehler von Elektronenlinsen". Zeitschrift für Physik. 101 (9–10): 593–603. Bibcode:1936ZPhy..101..593S. doi:10.1007/BF01349606. S2CID 120073021.
Schönhense, G. (2006). "Time-Resolved Photoemission Electron Microscopy". Advances in Imaging and Electron Physics. 142: 159–323. doi:10.1016/S1076-5670(05)42003-0. ISBN 9780120147847.
Rose, H. (2005). "Aberration Correction in Electron Microscopy" (PDF). Proceedings of the 2005 Particle Accelerator Conference. pp. 44–48. doi:10.1109/PAC.2005.1590354. ISBN 0-7803-8859-3. S2CID 122693745. Retrieved 5 April 2020.
Crewe, Albert V. (1966-11-11). "Scanning Electron Microscopes: Is High Resolution Possible?: Use of a field-emission electron source may make it possible to overcome existing limitations on resolution". Science. 154 (3750): 729–738. doi:10.1126/science.154.3750.729. ISSN 0036-8075. PMID 17745977.
Pennycook, S. J. (2012-12-01). "Seeing the atoms more clearly: STEM imaging from the Crewe era to today". Ultramicroscopy. Albert Victor Crewe Memorial Issue. 123: 28–37. doi:10.1016/j.ultramic.2012.05.005. ISSN 0304-3991. PMID 22727567.
Crewe, A. V.; Wall, J.; Langmore, J. (1970-06-12). "Visibility of Single Atoms". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. ISSN 0036-8075. PMID 17731040.
Verbeeck, Jo; Béché, Armand; Müller-Caspary, Knut; Guzzinati, Giulio; Luong, Minh Anh; Den Hertog, Martien (2018). "Demonstration of a 2 × 2 programmable phase plate for electrons". Ultramicroscopy. 190: 58–65. doi:10.1016/j.ultramic.2018.03.017. PMID 29689445.
Vega Ibanez, Francisco; Beche, Armand; Verbeeck, Jo (2024). "Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?". Microscopy and Microanalysis. 29 (1): 341–351. arXiv:2205.07697. doi:10.1017/S1431927622012260.
Ribet, Stephanie M; Zeltmann, Steven E; Bustillo, Karen C; Dhall, Rohan; Denes, Peter; Minor, Andrew M; dos Reis, Roberto; Dravid, Vinayak P; Ophus, Colin (2023-12-21). "Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis. 29 (6): 1950–1960. arXiv:2303.09693. doi:10.1093/micmic/ozad111. ISSN 1431-9276. PMID 37851063.
Batson, P. E.; Dellby, N.; Krivanek, O. L. (2002-08-08). "Sub-ångstrom resolution using aberration corrected electron optics". Nature. 418 (6898): 617–620. Bibcode:2002Natur.418..617B. doi:10.1038/nature00972. ISSN 0028-0836. PMID 12167855.
Dahmen, Ulrich; Erni, Rolf; Radmilovic, Velimir; Ksielowski, Christian; Rossell, Marta-Dacil; Denes, Peter (2009-09-28). "Background, status and future of the Transmission Electron Aberration-corrected Microscope project". Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences. 367 (1903): 3795–3808. Bibcode:2009RSPTA.367.3795D. doi:10.1098/rsta.2009.0094. ISSN 1364-503X. PMID 19687066.
Sawada, H.; Hosokawa, F.; Kaneyama, T.; Tomita, T.; Kondo, Y.; Tanaka, T.; Oshima, Y.; Tanishiro, Y.; Yamamoto, N. (2008). Luysberg, Martina; Tillmann, Karsten; Weirich, Thomas (eds.). Performance of R005 Microscope and Aberration Correction System. EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. Berlin, Heidelberg: Springer Berlin Heidelberg. pp. 47–48. doi:10.1007/978-3-540-85156-1_24. ISBN 978-3-540-85154-7.
Tromp, R.M.; Hannon, J.B.; Ellis, A.W.; Wan, W.; Berghaus, A.; Schaff, O. (June 2010). "A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design". Ultramicroscopy. 110 (7): 852–861. doi:10.1016/j.ultramic.2010.03.005. PMID 20395048.

elsevier.com

linkinghub.elsevier.com

Tromp, R.M.; Hannon, J.B.; Ellis, A.W.; Wan, W.; Berghaus, A.; Schaff, O. (June 2010). "A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design". Ultramicroscopy. 110 (7): 852–861. doi:10.1016/j.ultramic.2010.03.005. PMID 20395048.

globalsino.com

Liao, Yougui. "Correction of Chromatic Aberration in Charged Particle Accelerators with Time-varying Fields". Practical Electron Microscopy and Database. Retrieved 5 April 2020.

harvard.edu

ui.adsabs.harvard.edu

Scherzer, Otto (September 1936). "Über einige Fehler von Elektronenlinsen". Zeitschrift für Physik. 101 (9–10): 593–603. Bibcode:1936ZPhy..101..593S. doi:10.1007/BF01349606. S2CID 120073021.
Crewe, A. V.; Wall, J.; Langmore, J. (1970-06-12). "Visibility of Single Atoms". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. ISSN 0036-8075. PMID 17731040.
Batson, P. E.; Dellby, N.; Krivanek, O. L. (2002-08-08). "Sub-ångstrom resolution using aberration corrected electron optics". Nature. 418 (6898): 617–620. Bibcode:2002Natur.418..617B. doi:10.1038/nature00972. ISSN 0028-0836. PMID 12167855.
Dahmen, Ulrich; Erni, Rolf; Radmilovic, Velimir; Ksielowski, Christian; Rossell, Marta-Dacil; Denes, Peter (2009-09-28). "Background, status and future of the Transmission Electron Aberration-corrected Microscope project". Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences. 367 (1903): 3795–3808. Bibcode:2009RSPTA.367.3795D. doi:10.1098/rsta.2009.0094. ISSN 1364-503X. PMID 19687066.

lbl.gov

foundry.lbl.gov

"TEAM 0.5". Molecular Foundry. Lawrence Berkeley National Laboratory. Archived from the original on 2024-05-12. Retrieved 2024-05-27.
"TEAM I". Molecular Foundry. Lawrence Berkeley National Laboratory. Archived from the original on 2024-03-10. Retrieved 2024-05-27.

ncem.lbl.gov

"The TEAM Project: What is the TEAM microscope?". 2011-02-11. Archived from the original on 2011-02-11. Retrieved 2024-05-27.

microscopy.org

"Otto Scherzer. The father of aberration correction" (PDF). Microscopy Society of America. Retrieved 5 April 2020.

nature.com

Batson, P. E.; Dellby, N.; Krivanek, O. L. (2002-08-08). "Sub-ångstrom resolution using aberration corrected electron optics". Nature. 418 (6898): 617–620. Bibcode:2002Natur.418..617B. doi:10.1038/nature00972. ISSN 0028-0836. PMID 12167855.

nih.gov

pubmed.ncbi.nlm.nih.gov

Crewe, Albert V. (1966-11-11). "Scanning Electron Microscopes: Is High Resolution Possible?: Use of a field-emission electron source may make it possible to overcome existing limitations on resolution". Science. 154 (3750): 729–738. doi:10.1126/science.154.3750.729. ISSN 0036-8075. PMID 17745977.
Pennycook, S. J. (2012-12-01). "Seeing the atoms more clearly: STEM imaging from the Crewe era to today". Ultramicroscopy. Albert Victor Crewe Memorial Issue. 123: 28–37. doi:10.1016/j.ultramic.2012.05.005. ISSN 0304-3991. PMID 22727567.
Crewe, A. V.; Wall, J.; Langmore, J. (1970-06-12). "Visibility of Single Atoms". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. ISSN 0036-8075. PMID 17731040.
Verbeeck, Jo; Béché, Armand; Müller-Caspary, Knut; Guzzinati, Giulio; Luong, Minh Anh; Den Hertog, Martien (2018). "Demonstration of a 2 × 2 programmable phase plate for electrons". Ultramicroscopy. 190: 58–65. doi:10.1016/j.ultramic.2018.03.017. PMID 29689445.
Ribet, Stephanie M; Zeltmann, Steven E; Bustillo, Karen C; Dhall, Rohan; Denes, Peter; Minor, Andrew M; dos Reis, Roberto; Dravid, Vinayak P; Ophus, Colin (2023-12-21). "Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis. 29 (6): 1950–1960. arXiv:2303.09693. doi:10.1093/micmic/ozad111. ISSN 1431-9276. PMID 37851063.
Batson, P. E.; Dellby, N.; Krivanek, O. L. (2002-08-08). "Sub-ångstrom resolution using aberration corrected electron optics". Nature. 418 (6898): 617–620. Bibcode:2002Natur.418..617B. doi:10.1038/nature00972. ISSN 0028-0836. PMID 12167855.
Dahmen, Ulrich; Erni, Rolf; Radmilovic, Velimir; Ksielowski, Christian; Rossell, Marta-Dacil; Denes, Peter (2009-09-28). "Background, status and future of the Transmission Electron Aberration-corrected Microscope project". Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences. 367 (1903): 3795–3808. Bibcode:2009RSPTA.367.3795D. doi:10.1098/rsta.2009.0094. ISSN 1364-503X. PMID 19687066.
Tromp, R.M.; Hannon, J.B.; Ellis, A.W.; Wan, W.; Berghaus, A.; Schaff, O. (June 2010). "A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design". Ultramicroscopy. 110 (7): 852–861. doi:10.1016/j.ultramic.2010.03.005. PMID 20395048.

oup.com

academic.oup.com

Vega Ibanez, Francisco; Beche, Armand; Verbeeck, Jo (2024). "Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?". Microscopy and Microanalysis. 29 (1): 341–351. arXiv:2205.07697. doi:10.1017/S1431927622012260.
Ribet, Stephanie M; Zeltmann, Steven E; Bustillo, Karen C; Dhall, Rohan; Denes, Peter; Minor, Andrew M; dos Reis, Roberto; Dravid, Vinayak P; Ophus, Colin (2023-12-21). "Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis. 29 (6): 1950–1960. arXiv:2303.09693. doi:10.1093/micmic/ozad111. ISSN 1431-9276. PMID 37851063.

patents.google.com

US4303864A, Crewe, Albert V. & Kopf, David A., "Sextupole system for the correction of spherical aberration", issued 1981-12-01
US4389571A, Crewe, Albert V., "Multiple sextupole system for the correction of third and higher order aberration", issued 1983-06-21

royalsocietypublishing.org

Dahmen, Ulrich; Erni, Rolf; Radmilovic, Velimir; Ksielowski, Christian; Rossell, Marta-Dacil; Denes, Peter (2009-09-28). "Background, status and future of the Transmission Electron Aberration-corrected Microscope project". Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences. 367 (1903): 3795–3808. Bibcode:2009RSPTA.367.3795D. doi:10.1098/rsta.2009.0094. ISSN 1364-503X. PMID 19687066.

science.org

Crewe, Albert V. (1966-11-11). "Scanning Electron Microscopes: Is High Resolution Possible?: Use of a field-emission electron source may make it possible to overcome existing limitations on resolution". Science. 154 (3750): 729–738. doi:10.1126/science.154.3750.729. ISSN 0036-8075. PMID 17745977.
Crewe, A. V.; Wall, J.; Langmore, J. (1970-06-12). "Visibility of Single Atoms". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. ISSN 0036-8075. PMID 17731040.

sciencedirect.com

Pennycook, S. J. (2012-12-01). "Seeing the atoms more clearly: STEM imaging from the Crewe era to today". Ultramicroscopy. Albert Victor Crewe Memorial Issue. 123: 28–37. doi:10.1016/j.ultramic.2012.05.005. ISSN 0304-3991. PMID 22727567.
Verbeeck, Jo; Béché, Armand; Müller-Caspary, Knut; Guzzinati, Giulio; Luong, Minh Anh; Den Hertog, Martien (2018). "Demonstration of a 2 × 2 programmable phase plate for electrons". Ultramicroscopy. 190: 58–65. doi:10.1016/j.ultramic.2018.03.017. PMID 29689445.

seattletimes.com

Doughton, Sandi (2010-09-05). "Kirkland microscopes can examine matter one atom at a time". The Seattle Times. Archived from the original on 2016-03-25. Retrieved 2024-05-25.

semanticscholar.org

api.semanticscholar.org

Scherzer, Otto (September 1936). "Über einige Fehler von Elektronenlinsen". Zeitschrift für Physik. 101 (9–10): 593–603. Bibcode:1936ZPhy..101..593S. doi:10.1007/BF01349606. S2CID 120073021.
Rose, H. (2005). "Aberration Correction in Electron Microscopy" (PDF). Proceedings of the 2005 Particle Accelerator Conference. pp. 44–48. doi:10.1109/PAC.2005.1590354. ISBN 0-7803-8859-3. S2CID 122693745. Retrieved 5 April 2020.

web.archive.org

Pool, Rebecca (2022-11-21). "Nion: The company that transformed microscopy". Wiley Analytical Science. Archived from the original on 2024-05-24. Retrieved 2024-05-24.
Doughton, Sandi (2010-09-05). "Kirkland microscopes can examine matter one atom at a time". The Seattle Times. Archived from the original on 2016-03-25. Retrieved 2024-05-25.
"The TEAM Project: When/Where". web.archive.org. Retrieved 2024-05-27.
"The TEAM Project: What is the TEAM microscope?". 2011-02-11. Archived from the original on 2011-02-11. Retrieved 2024-05-27.
"TEAM 0.5". Molecular Foundry. Lawrence Berkeley National Laboratory. Archived from the original on 2024-05-12. Retrieved 2024-05-27.
"TEAM I". Molecular Foundry. Lawrence Berkeley National Laboratory. Archived from the original on 2024-03-10. Retrieved 2024-05-27.

wiley.com

analyticalscience.wiley.com

Pool, Rebecca (2022-11-21). "Nion: The company that transformed microscopy". Wiley Analytical Science. Archived from the original on 2024-05-24. Retrieved 2024-05-24.

worldcat.org

search.worldcat.org

Crewe, Albert V. (1966-11-11). "Scanning Electron Microscopes: Is High Resolution Possible?: Use of a field-emission electron source may make it possible to overcome existing limitations on resolution". Science. 154 (3750): 729–738. doi:10.1126/science.154.3750.729. ISSN 0036-8075. PMID 17745977.
Pennycook, S. J. (2012-12-01). "Seeing the atoms more clearly: STEM imaging from the Crewe era to today". Ultramicroscopy. Albert Victor Crewe Memorial Issue. 123: 28–37. doi:10.1016/j.ultramic.2012.05.005. ISSN 0304-3991. PMID 22727567.
Crewe, A. V.; Wall, J.; Langmore, J. (1970-06-12). "Visibility of Single Atoms". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. ISSN 0036-8075. PMID 17731040.
Rose, Harald (June 1990). "Outline of a spherically corrected semiaplanatic medium-voltage transmission electron microscope". Optik. 85 (1). ISSN 0030-4026.
Ribet, Stephanie M; Zeltmann, Steven E; Bustillo, Karen C; Dhall, Rohan; Denes, Peter; Minor, Andrew M; dos Reis, Roberto; Dravid, Vinayak P; Ophus, Colin (2023-12-21). "Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis. 29 (6): 1950–1960. arXiv:2303.09693. doi:10.1093/micmic/ozad111. ISSN 1431-9276. PMID 37851063.
Batson, P. E.; Dellby, N.; Krivanek, O. L. (2002-08-08). "Sub-ångstrom resolution using aberration corrected electron optics". Nature. 418 (6898): 617–620. Bibcode:2002Natur.418..617B. doi:10.1038/nature00972. ISSN 0028-0836. PMID 12167855.
Dahmen, Ulrich; Erni, Rolf; Radmilovic, Velimir; Ksielowski, Christian; Rossell, Marta-Dacil; Denes, Peter (2009-09-28). "Background, status and future of the Transmission Electron Aberration-corrected Microscope project". Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences. 367 (1903): 3795–3808. Bibcode:2009RSPTA.367.3795D. doi:10.1098/rsta.2009.0094. ISSN 1364-503X. PMID 19687066.