Transmission electron microscopy (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Transmission electron microscopy" in English language version.

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Legros, Marc (February 2014). "In situ mechanical TEM: Seeing and measuring under stress with electrons". Comptes Rendus Physique. 15 (2–3): 224–240. Bibcode:2014CRPhy..15..224L. doi:10.1016/j.crhy.2014.02.002.

aip.org

pubs.aip.org

Minor, A. M.; Morris, J. W.; Stach, E. A. (2001). "Quantitativein situnanoindentation in an electron microscope". Applied Physics Letters. 79 (11): 1625–1627. Bibcode:2001ApPhL..79.1625M. doi:10.1063/1.1400768. OSTI 860719. Retrieved 2023-05-08.

archive.org

Williams, D. & Carter, C. B. (1996). Transmission Electron Microscopy, Vol. 1 – Basics. Plenum Press. ISBN 978-0-306-45324-3.^{[page needed]}

arxiv.org

Levin, B. D. A.; et al. (2016). "Nanomaterial datasets to advance tomography in scanning transmission electron microscopy". Scientific Data. 3: 160041. arXiv:1606.02938. Bibcode:2016NatSD...360041L. doi:10.1038/sdata.2016.41. PMC 4896123. PMID 27272459.
Shimizu, Toshiki; Lungerich, Dominik; Harano, Koji; Nakamura, Eiichi (2022). "Time-Resolved Imaging of Stochastic Cascade Reactions over a Submillisecond to Second Time Range at the Angstrom Level". Journal of the American Chemical Society. 144 (22): 9797–9805. arXiv:2202.13332. doi:10.1021/jacs.2c02297. PMID 35609254. S2CID 247158917.
Feist, Armin; Bach, Nora; Rubiano da Silva, Nara; Danz, Thomas; Möller, Marcel; Priebe, Katharina E.; Domröse, Till; Gatzmann, J. Gregor; Rost, Stefan; Schauss, Jakob; Strauch, Stefanie; Bormann, Reiner; Sivis, Murat; Schäfer, Sascha; Ropers, Claus (2017-05-01). "Ultrafast Transmission Electron Microscopy Using a Laser-Driven Field Emitter: Femtosecond Resolution with a High Coherence Electron Beam". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 63–73. arXiv:1611.05022. doi:10.1016/j.ultramic.2016.12.005. PMID 28139341. S2CID 31779409.
Hassan, M. Th.; Baskin, J. S.; Liao, B.; Zewail, A. H. (July 2017). "High-temporal-resolution electron microscopy for imaging ultrafast electron dynamics". Nature Photonics. 11 (7): 425–430. arXiv:1704.04246. Bibcode:2017NaPho..11..425H. doi:10.1038/nphoton.2017.79. ISSN 1749-4885.

bfree.on.ca

comdir.bfree.on.ca

"Dr. James Hillier, Biography". comdir.bfree.on.ca. Archived from the original on 2008-06-19. Retrieved 2008-09-09.

books.google.com

Plücker, J. (1858). "Über die Einwirkung des Magneten auf die elektrischen Entladungen in verdünnten Gasen" [On the effect of a magnet on the electric discharge in rarified gases]. Poggendorffs Annalen der Physik und Chemie. 103 (1): 88–106. Bibcode:1858AnP...179...88P. doi:10.1002/andp.18581790106.

britannica.com

ultraviolet microscope. (2010). In Encyclopædia Britannica. Retrieved November 20, 2010, from Encyclopædia Britannica Online

cam.ac.uk

repository.cam.ac.uk

Kosasih, Felix Utama; Ducati, Caterina (May 2018). "Characterising degradation of perovskite solar cells through in-situ and operando electron microscopy". Nano Energy. 47: 243–256. doi:10.1016/j.nanoen.2018.02.055.

doi.org

Ernst Ruska (January 1980). The Early Development of Electron Lenses and Electron Microscopy. Applied Optics. Vol. 25. Translated by T. Mulvey. p. 820. Bibcode:1986ApOpt..25..820R. doi:10.1364/AO.25.000820. ISBN 978-3-7776-0364-3.
Plücker, J. (1858). "Über die Einwirkung des Magneten auf die elektrischen Entladungen in verdünnten Gasen" [On the effect of a magnet on the electric discharge in rarified gases]. Poggendorffs Annalen der Physik und Chemie. 103 (1): 88–106. Bibcode:1858AnP...179...88P. doi:10.1002/andp.18581790106.
Crewe, Albert V; Isaacson, M.; Johnson, D. (1969). "A Simple Scanning Electron Microscope". Rev. Sci. Instrum. 40 (2): 241–246. Bibcode:1969RScI...40..241C. doi:10.1063/1.1683910.
Crewe, Albert V.; Wall, J.; Langmore, J. (1970). "Visibility of a single atom". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. PMID 17731040. S2CID 31952480.
Rose, H H (2008). "Optics of high-performance electron Microscopes". Science and Technology of Advanced Materials. 9 (1): 014107. Bibcode:2008STAdM...9a4107R. doi:10.1088/0031-8949/9/1/014107. PMC 5099802. PMID 27877933.
Pogany, A. P.; Turner, P. S. (1968-01-23). "Reciprocity in electron diffraction and microscopy". Acta Crystallographica Section A. 24 (1): 103–109. Bibcode:1968AcCrA..24..103P. doi:10.1107/S0567739468000136. ISSN 1600-5724.
Hren, John J.; Goldstein, Joseph I.; Joy, David C., eds. (1979). Introduction to Analytical Electron Microscopy. doi:10.1007/978-1-4757-5581-7. ISBN 978-1-4757-5583-1.^{[page needed]}
Faruqi, A.R; Henderson, R. (October 2007). "Electronic detectors for electron microscopy". Current Opinion in Structural Biology. 17 (5): 549–555. doi:10.1016/j.sbi.2007.08.014. PMID 17913494.
Henderson, R.; Cattermole, D.; McMullan, G.; Scotcher, S.; Fordham, M.; Amos, W.B.; Faruqi, A.R. (February 2007). "Digitisation of electron microscope films: Six useful tests applied to three film scanners". Ultramicroscopy. 107 (2–3): 73–80. doi:10.1016/j.ultramic.2006.05.003. PMID 16872749.
Roberts, P. T. E.; Chapman, J. N.; MacLeod, A. M. (1982-01-01). "A CCD-based image recording system for the CTEM". Ultramicroscopy. 8 (4): 385–396. doi:10.1016/0304-3991(82)90061-4. ISSN 0304-3991.
Fan, G. Y.; Ellisman, M. H. (24 December 2001). "Digital imaging in transmission electron microscopy". Journal of Microscopy. 200 (1): 1–13. doi:10.1046/j.1365-2818.2000.00737.x. ISSN 0022-2720. PMID 11012823. S2CID 2034467.
McMullan, G.; Faruqi, A.R.; Henderson, R. (2016). "Direct Electron Detectors". The Resolution Revolution: Recent Advances in cryoEM. Methods in Enzymology. Vol. 579. pp. 1–17. doi:10.1016/bs.mie.2016.05.056. ISBN 978-0-12-805382-9. PMID 27572721.
Faruqi, A.R.; Henderson, R.; Pryddetch, M.; Allport, P.; Evans, A. (October 2006). "Erratum to: "Direct single electron detection with a CMOS detector for electron microscopy"". Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 566 (2): 770. doi:10.1016/j.nima.2006.07.013. ISSN 0168-9002.
Ercius, P.; Caswell, T.; Tate, M.W.; Ercan, A.; Gruner, S.M.; Muller, D. (September 2005). "A Pixel Array Detector for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis. 14 (S2): 806–807. doi:10.1017/s1431927608085711. ISSN 1431-9276. S2CID 137491811.
McMullan, G.; Faruqi, A.R.; Henderson, R.; Guerrini, N.; Turchetta, R.; Jacobs, A.; van Hoften, G. (18 May 2009). "Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector". Ultramicroscopy. 109 (9): 1144–1147. doi:10.1016/j.ultramic.2009.05.005. PMC 2937214. PMID 19541421.
Ruskin, Rachel S.; Yu, Zhiheng; Grigorieff, Nikolaus (1 November 2013). "Quantitative characterization of electron detectors for transmission electron microscopy". Journal of Structural Biology. 184 (3): 385–393. doi:10.1016/j.jsb.2013.10.016. PMC 3876735. PMID 24189638.
Pulokas, James; Green, Carmen; Kisseberth, Nick; Potter, Clinton S.; Carragher, Bridget (1999). "Improving the Positional Accuracy of the Goniometer on the Philips CM Series TEM". Journal of Structural Biology. 128 (3): 250–256. doi:10.1006/jsbi.1999.4181. PMID 10633064.
Buckingham, J (1965). "Thermionic emission properties of a lanthanum hexaboride/rhenium cathode". British Journal of Applied Physics. 16 (12): 1821. Bibcode:1965BJAP...16.1821B. doi:10.1088/0508-3443/16/12/306.
Cowley, J. M.; Moodie, A. F. (1957). "The Scattering of Electrons by Atoms and Crystals. I. A New Theoretical Approach" (PDF). Acta Crystallographica. 199 (3): 609–619. Bibcode:1957AcCry..10..609C. doi:10.1107/S0365110X57002194.
Mast, Jan; Demeestere, Lien (2009). "Electron tomography of negatively stained complex viruses: application in their diagnosis". Diagnostic Pathology. 4: 5. doi:10.1186/1746-1596-4-5. PMC 2649040. PMID 19208223.
Levin, B. D. A.; et al. (2016). "Nanomaterial datasets to advance tomography in scanning transmission electron microscopy". Scientific Data. 3: 160041. arXiv:1606.02938. Bibcode:2016NatSD...360041L. doi:10.1038/sdata.2016.41. PMC 4896123. PMID 27272459.
Kawase, Noboru; Kato, Mitsuro; Jinnai, Hiroshi; Jinnai, H (2007). "Transmission electron microtomography without the 'missing wedge' for quantitative structural analysis". Ultramicroscopy. 107 (1): 8–15. doi:10.1016/j.ultramic.2006.04.007. PMID 16730409.
Heidari, Hamed; Van den Broek, Wouter; Bals, Sara (2013). "Quantitative electron tomography: The effect of the three-dimensional point spread function". Ultramicroscopy. 135: 1–5. doi:10.1016/j.ultramic.2013.06.005. hdl:10067/1113970151162165141. PMID 23872036.
Cheville, NF; Stasko J (2014). "Techniques in Electron Microscopy of Animal Tissue". Veterinary Pathology. 51 (1): 28–41. doi:10.1177/0300985813505114. PMID 24114311.
Amzallag, Arnaud; Vaillant, Cédric; Jacob, Mathews; Unser, Michael; Bednar, Jan; Kahn, Jason D.; Dubochet, Jacques; Stasiak, Andrzej; Maddocks, John H. (2006). "3D reconstruction and comparison of shapes of DNA minicircles observed by cryo-electron microscopy". Nucleic Acids Research. 34 (18): e125. doi:10.1093/nar/gkl675. PMC 1635295. PMID 17012274.
Winey, M.; Meehl, J. B.; O’Toole, E. T. & Giddings, T. H. (2014). "Conventional transmission electron microscopy". Molecular Biology of the Cell. 25 (3): 319–323. doi:10.1091/mbc.e12-12-0863. PMC 3907272. PMID 24482357. S2CID 37311577.
Porter, K & Blum, J (1953). "A study in Microtomy for Electron Microscopy". The Anatomical Record. 117 (4): 685–710. doi:10.1002/ar.1091170403. PMID 13124776. S2CID 37311577.
Phillips (1961). "Diamond knife ultra microtomy of metals and the structure of microtomed sections". British Journal of Applied Physics. 12 (10): 554. Bibcode:1961BJAP...12..554P. doi:10.1088/0508-3443/12/10/308.
Thompson, Rebecca F.; Walker, Matt; Siebert, C. Alistair; Muench, Stephen P.; Ranson, Neil A. (2016-05-01). "An introduction to sample preparation and imaging by cryo-electron microscopy for structural biology". Methods. Single Particle Cryo-EM, from sample to reconstruction. 100: 3–15. doi:10.1016/j.ymeth.2016.02.017. ISSN 1046-2023. PMC 4854231. PMID 26931652.
Bean, J. J.; Saito, M.; Fukami, S.; Sato, H.; Ikeda, S.; Ohno, H.; Ikuhara, Y.; Mckenna, K. P. (2017). "Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices". Scientific Reports. 7: 45594. Bibcode:2017NatSR...745594B. doi:10.1038/srep45594. ISSN 2045-2322. PMC 5379487. PMID 28374755.
Baram, M. & Kaplan W. D. (2008). "Quantitative HRTEM analysis of FIB prepared specimens". Journal of Microscopy. 232 (3): 395–405. doi:10.1111/j.1365-2818.2008.02134.x. PMID 19094016. S2CID 6487344.
Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219: 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.
Nebesářová1, Jana; Vancová, Marie (2007). "How to Observe Small Biological Objects in Low-Voltage Electron Microscope". Microscopy and Microanalysis. 13 (3): 248–249. Bibcode:2007MiMic..13S.248N. doi:10.1017/S143192760708124X. S2CID 138891812.{{cite journal}}: CS1 maint: numeric names: authors list (link)
Drummy, Lawrence, F.; Yang, Junyan; Martin, David C. (2004). "Low-voltage electron microscopy of polymer and organic molecular thin films". Ultramicroscopy. 99 (4): 247–256. doi:10.1016/j.ultramic.2004.01.011. PMID 15149719.{{cite journal}}: CS1 maint: multiple names: authors list (link)
Li, Z; Baker, ML; Jiang, W; Estes, MK; Prasad, BV (2009). "Rotavirus Architecture at Subnanometer Resolution". Journal of Virology. 83 (4): 1754–1766. doi:10.1128/JVI.01855-08. PMC 2643745. PMID 19036817.
M.J. Zachman; et al. (2016). "Site-Specific Preparation of Intact Solid–Liquid Interfaces by Label-Free In Situ Localization and Cryo-Focused Ion Beam Lift-Out". Microscopy and Microanalysis. 22 (6): 1338–1349. Bibcode:2016MiMic..22.1338Z. doi:10.1017/S1431927616011892. PMID 27869059.
Levin, B. D. A.; et al. (2017). "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts". Microscopy and Microanalysis. 23 (1): 155–162. Bibcode:2017MiMic..23..155L. doi:10.1017/S1431927617000058. PMID 28228169. S2CID 6801783.
P.A. Crozier; T.W. Hansen (2014). "In situ and operando transmission electron microscopy of catalytic materials". MRS Bulletin. 40: 38–45. doi:10.1557/mrs.2014.304. hdl:2286/R.I.35693. S2CID 138802942.
Kosasih, Felix Utama; Ducati, Caterina (May 2018). "Characterising degradation of perovskite solar cells through in-situ and operando electron microscopy". Nano Energy. 47: 243–256. doi:10.1016/j.nanoen.2018.02.055.
Shimizu, Toshiki; Lungerich, Dominik; Harano, Koji; Nakamura, Eiichi (2022). "Time-Resolved Imaging of Stochastic Cascade Reactions over a Submillisecond to Second Time Range at the Angstrom Level". Journal of the American Chemical Society. 144 (22): 9797–9805. arXiv:2202.13332. doi:10.1021/jacs.2c02297. PMID 35609254. S2CID 247158917.
de Jonge, N.; Ross, F.M. (2011). "Electron microscopy of specimens in liquid". Nature Nanotechnology. 6 (8): 695–704. Bibcode:2003NatMa...2..532W. doi:10.1038/nmat944. PMID 12872162. S2CID 21379512.
F. M. Ross (2015). "Opportunities and challenges in liquid cell electron microscopy". Science. 350 (6267): 1490–1501. doi:10.1126/science.aaa9886. PMID 26680204.
Haque, M. A. & Saif, M. T. A. (2001). "In-situ tensile testing of nano-scale specimens in SEM and TEM". Experimental Mechanics. 42: 123. doi:10.1007/BF02411059. S2CID 136678366.
Yaguchi, T.; Suzuki, M.; Watabe, A.; Nagakubo, Y.; Ueda, K.; Kamino, T. (2011-03-22). "Development of a high temperature-atmospheric pressure environmental cell for high-resolution TEM". Journal of Electron Microscopy. 60 (3): 217–225. doi:10.1093/jmicro/dfr011. ISSN 0022-0744. PMID 21427119.
Taheri, Mitra L.; Stach, Eric A.; Arslan, Ilke; Crozier, P.A.; Kabius, Bernd C.; LaGrange, Thomas; Minor, Andrew M.; Takeda, Seiji; Tanase, Mihaela; Wagner, Jakob B.; Sharma, Renu (November 2016). "Current status and future directions for in situ transmission electron microscopy". Ultramicroscopy. 170: 86–95. doi:10.1016/j.ultramic.2016.08.007. PMC 5100813. PMID 27566048.
van Omme, J. Tijn; Zakhozheva, Marina; Spruit, Ronald G.; Sholkina, Mariya; Pérez Garza, H. Hugo (September 2018). "Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability". Ultramicroscopy. 192: 14–20. doi:10.1016/j.ultramic.2018.05.005. PMID 29802911. S2CID 44069323.
Saka, Hiroyasu; Kamino, Takeo; Ara, Shigeo; Sasaki, Katsuhiro (2008-02-01). "In Situ Heating Transmission Electron Microscopy". MRS Bulletin. 33 (2): 93–100. doi:10.1557/mrs2008.21. ISSN 1938-1425. S2CID 136475122.
Zhang, Chao; Firestein, Konstantin L.; Fernando, Joseph F. S.; Siriwardena, Dumindu; Treifeldt, Joel E.; Golberg, Dmitri (2019-09-30). "Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials" (PDF). Advanced Materials. 32 (18): 1904094. doi:10.1002/adma.201904094. ISSN 0935-9648. PMID 31566272. S2CID 203607267.
Picher, Matthieu; Mazzucco, Stefano; Blankenship, Steve; Sharma, Renu (March 2015). "Vibrational and optical spectroscopies integrated with environmental transmission electron microscopy". Ultramicroscopy. 150: 10–15. doi:10.1016/j.ultramic.2014.11.023. PMID 25490533.
Niekiel, Florian; Kraschewski, Simon M.; Müller, Julian; Butz, Benjamin; Spiecker, Erdmann (2017-05-01). "Local temperature measurement in TEM by parallel beam electron diffraction". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 161–169. doi:10.1016/j.ultramic.2016.11.028. ISSN 0304-3991. PMID 28049586.
Vendelbo, S.B.; Kooyman, P.J.; Creemer, J.F.; Morana, B.; Mele, L.; Dona, P.; Nelissen, B.J.; Helveg, S. (October 2013). "Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy". Ultramicroscopy. 133: 72–79. Bibcode:2013IJMSI.133...72V. doi:10.1016/j.ultramic.2013.04.004. PMID 23831940.
Minor, Andrew M.; Dehm, Gerhard (June 2019). "Advances in in situ nanomechanical testing". MRS Bulletin. 44 (6): 438–442. Bibcode:2019MRSBu..44..438M. doi:10.1557/mrs.2019.127. hdl:21.11116/0000-0005-884D-C. S2CID 197631706.
Filleter, Tobin; Beese, Allison M. (2016), "In Situ Transmission Electron Microscopy: Mechanical Testing", in Bhushan, Bharat (ed.), Encyclopedia of Nanotechnology, Dordrecht: Springer Netherlands, pp. 1543–1554, doi:10.1007/978-94-017-9780-1_100990, ISBN 978-94-017-9780-1
Wilsdorf, H. G. F. (April 1958). "Apparatus for the Deformation of Foils in an Electron Microscope". Review of Scientific Instruments. 29 (4): 323–324. Bibcode:1958RScI...29..323W. doi:10.1063/1.1716192.
Castany, P.; Legros, M. (January 2011). "Preparation of H-bar cross-sectional specimen for in situ TEM straining experiments: A FIB-based method applied to a nitrided Ti–6Al–4V alloy". Materials Science and Engineering: A. 528 (3): 1367–1371. doi:10.1016/j.msea.2010.10.025.
Legros, Marc; Cabié, Martiane; Gianola, Daniel S. (March 2009). "In situ deformation of thin films on substrates". Microscopy Research and Technique. 72 (3): 270–283. doi:10.1002/jemt.20680. PMID 19189313. S2CID 10431993.
Kubin, L.P.; Lépinoux, J.; Rabier, J.; Veyssière, P.; Fourdeux, A. (1982). "In situ Plastic Deformation of Metals and Alloys in the 200 kV Electron Microscope". Strength of Metals and Alloys (ICSMA 6). pp. 953–957. doi:10.1016/B978-1-4832-8423-1.50153-X. ISBN 978-1-4832-8423-1.
Pethicai, J. B.; Hutchings, R.; Oliver, W. C. (April 1983). "Hardness measurement at penetration depths as small as 20 nm". Philosophical Magazine A. 48 (4): 593–606. Bibcode:1983PMagA..48..593P. doi:10.1080/01418618308234914.
Minor, A. M.; Morris, J. W.; Stach, E. A. (2001). "Quantitativein situnanoindentation in an electron microscope". Applied Physics Letters. 79 (11): 1625–1627. Bibcode:2001ApPhL..79.1625M. doi:10.1063/1.1400768. OSTI 860719. Retrieved 2023-05-08.
Legros, Marc (February 2014). "In situ mechanical TEM: Seeing and measuring under stress with electrons". Comptes Rendus Physique. 15 (2–3): 224–240. Bibcode:2014CRPhy..15..224L. doi:10.1016/j.crhy.2014.02.002.
Oliver, W. C.; Pharr, G. M. (June 1992). "An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments". Journal of Materials Research. 7 (6): 1564–1583. Bibcode:1992JMatR...7.1564O. doi:10.1557/JMR.1992.1564. S2CID 137098960.
Haque, M. A.; Espinosa, H. D.; Lee, H. J. (May 2010). "MEMS for In Situ Testing—Handling, Actuation, Loading, and Displacement Measurements". MRS Bulletin. 35 (5): 375–381. doi:10.1557/mrs2010.570. S2CID 12455370.
Zhu, Yong; Espinosa, Horacio D. (11 October 2005). "An electromechanical material testing system for in situ electron microscopy and applications". Proceedings of the National Academy of Sciences. 102 (41): 14503–14508. Bibcode:2005PNAS..10214503Z. doi:10.1073/pnas.0506544102. PMC 1253576. PMID 16195381.
Ishida, T; Nakajima, Y; Kakushima, K; Mita, M; Toshiyoshi, H; Fujita, H (1 July 2010). "Design and fabrication of MEMS-controlled probes for studying the nano-interface under in situ TEM observation". Journal of Micromechanics and Microengineering. 20 (7): 075011. Bibcode:2010JMiMi..20g5011I. doi:10.1088/0960-1317/20/7/075011. S2CID 137919989.
Williams, David B.; Carter, C. Barry (1996), Williams, David B.; Carter, C. Barry (eds.), "The Transmission Electron Microscope", Transmission Electron Microscopy: A Textbook for Materials Science, Boston, MA: Springer US, pp. 3–17, doi:10.1007/978-1-4757-2519-3_1, ISBN 978-1-4757-2519-3
Dömer, H.; Bostanjoglo, O. (2003-09-25). "High-speed transmission electron microscope". Review of Scientific Instruments. 74 (10): 4369–4372. Bibcode:2003RScI...74.4369D. doi:10.1063/1.1611612. ISSN 0034-6748.
Oldfield, L. C. (June 1976). "A rotationally symmetric electron beam chopper for picosecond pulses". Journal of Physics E: Scientific Instruments. 9 (6): 455–463. Bibcode:1976JPhE....9..455O. doi:10.1088/0022-3735/9/6/011. ISSN 0022-3735.
Feist, Armin; Bach, Nora; Rubiano da Silva, Nara; Danz, Thomas; Möller, Marcel; Priebe, Katharina E.; Domröse, Till; Gatzmann, J. Gregor; Rost, Stefan; Schauss, Jakob; Strauch, Stefanie; Bormann, Reiner; Sivis, Murat; Schäfer, Sascha; Ropers, Claus (2017-05-01). "Ultrafast Transmission Electron Microscopy Using a Laser-Driven Field Emitter: Femtosecond Resolution with a High Coherence Electron Beam". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 63–73. arXiv:1611.05022. doi:10.1016/j.ultramic.2016.12.005. PMID 28139341. S2CID 31779409.
Hassan, Mohammed T.; Liu, Haihua; Baskin, John Spencer; Zewail, Ahmed H. (2015-10-20). "Photon gating in four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 112 (42): 12944–12949. Bibcode:2015PNAS..11212944H. doi:10.1073/pnas.1517942112. ISSN 0027-8424. PMC 4620897. PMID 26438835.
Hassan, M. Th.; Baskin, J. S.; Liao, B.; Zewail, A. H. (July 2017). "High-temporal-resolution electron microscopy for imaging ultrafast electron dynamics". Nature Photonics. 11 (7): 425–430. arXiv:1704.04246. Bibcode:2017NaPho..11..425H. doi:10.1038/nphoton.2017.79. ISSN 1749-4885.
Campbell, Geoffrey H.; McKeown, Joseph T.; Santala, Melissa K. (2014-11-03). "Time resolved electron microscopy for in situ experiments". Applied Physics Reviews. 1 (4): 041101. Bibcode:2014ApPRv...1d1101C. doi:10.1063/1.4900509. OSTI 1186765.
Zewail, Ahmed H. (9 April 2010). "Four-Dimensional Electron Microscopy". Science. 328 (5975): 187–193. Bibcode:2010Sci...328..187Z. doi:10.1126/science.1166135. PMID 20378810. S2CID 5449372.
Lobatsov, Vladimir A.; Ramesh Srinivasan; Ahmed H. Zewail (2005-05-09). "Four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 102 (20): 7069–7073. Bibcode:2005PNAS..102.7069L. doi:10.1073/pnas.0502607102. PMC 1129142. PMID 15883380.
Browning, N.D.; Bonds, M.A.; Campbell, G.H.; Evans, J.E.; LaGrange, T.; Jungjohann, K.L.; Masiel, D.J.; McKeown, J.; Mehraeen, S.; Reed, B.W.; Santala, M. (February 2012). "Recent developments in dynamic transmission electron microscopy". Current Opinion in Solid State and Materials Science. 16 (1): 23–30. Bibcode:2012COSSM..16...23B. doi:10.1016/j.cossms.2011.07.001.
King, Wayne E.; Geoffrey H. Campbell; Alan Frank; Bryan Reed (2005). "Ultrafast electron microscopy in materials science, biology, and chemistry". Journal of Applied Physics. 97 (11): 111101–111101–27. Bibcode:2005JAP....97k1101K. doi:10.1063/1.1927699.
B. Barwick; D. J. Flannigan; A. H. Zewail (December 2009). "Photon-induced near-field electron microscopy". Nature. 462 (7275): 902–906. Bibcode:2009Natur.462..902B. doi:10.1038/nature08662. PMID 20016598. S2CID 4423704.
Pennycook, S.J.; Varela, M.; Hetherington, C.J.D.; Kirkland, A.I. (2011). "Materials Advances through Aberration-Corrected Electron Microscopy" (PDF). MRS Bulletin. 31 (1): 36–43. Bibcode:2011MRSBu..31...36P. doi:10.1557/mrs2006.4. S2CID 41889433.
Furuya, Kazuo (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Science and Technology of Advanced Materials. 9 (1). 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
Erni R, Rossell MD, Kisielowski C, Dahmen U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9). 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. PMID 19392535.
Tanaka, Nobuo (2008). "Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials". Sci. Technol. Adv. Mater. 9 (1): 014111. Bibcode:2008STAdM...9a4111T. doi:10.1088/1468-6996/9/1/014111. PMC 5099806. PMID 27877937.

energy.gov

science.energy.gov

Scale of Things Chart. Science.energy.gov

escholarship.org

O'Keefe, Michael A.; Shao-Horn, Yang (2004). Imaging lithium atoms at sub-Ångström resolution (Report). Lawrence Berkeley National Laboratory. LBNL-56646.
O'Keefe, Michael A.; Allard, Lawrence F. (18 January 2004). "Sub-Angstrom electron microscopy for sub-Angstrom nano-metrology". OSTI 821768. {{cite journal}}: Cite journal requires |journal= (help)

espacenet.com

v3.espacenet.com

Rudenberg, Reinhold (May 30, 1931). "Configuration for the enlarged imaging of objects by electron beams". Patent DE906737.

fondationlouisdebroglie.org

de Broglie, Louis Victor. "On the Theory of Quanta" (PDF). Foundation of Louis de Broglie (English translation by A.F. Kracklauer, 2004. ed.). Retrieved 25 February 2023.

handle.net

hdl.handle.net

Heidari, Hamed; Van den Broek, Wouter; Bals, Sara (2013). "Quantitative electron tomography: The effect of the three-dimensional point spread function". Ultramicroscopy. 135: 1–5. doi:10.1016/j.ultramic.2013.06.005. hdl:10067/1113970151162165141. PMID 23872036.
P.A. Crozier; T.W. Hansen (2014). "In situ and operando transmission electron microscopy of catalytic materials". MRS Bulletin. 40: 38–45. doi:10.1557/mrs.2014.304. hdl:2286/R.I.35693. S2CID 138802942.
Minor, Andrew M.; Dehm, Gerhard (June 2019). "Advances in in situ nanomechanical testing". MRS Bulletin. 44 (6): 438–442. Bibcode:2019MRSBu..44..438M. doi:10.1557/mrs.2019.127. hdl:21.11116/0000-0005-884D-C. S2CID 197631706.

harvard.edu

ui.adsabs.harvard.edu

Ernst Ruska (January 1980). The Early Development of Electron Lenses and Electron Microscopy. Applied Optics. Vol. 25. Translated by T. Mulvey. p. 820. Bibcode:1986ApOpt..25..820R. doi:10.1364/AO.25.000820. ISBN 978-3-7776-0364-3.
Plücker, J. (1858). "Über die Einwirkung des Magneten auf die elektrischen Entladungen in verdünnten Gasen" [On the effect of a magnet on the electric discharge in rarified gases]. Poggendorffs Annalen der Physik und Chemie. 103 (1): 88–106. Bibcode:1858AnP...179...88P. doi:10.1002/andp.18581790106.
Crewe, Albert V; Isaacson, M.; Johnson, D. (1969). "A Simple Scanning Electron Microscope". Rev. Sci. Instrum. 40 (2): 241–246. Bibcode:1969RScI...40..241C. doi:10.1063/1.1683910.
Crewe, Albert V.; Wall, J.; Langmore, J. (1970). "Visibility of a single atom". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. PMID 17731040. S2CID 31952480.
Rose, H H (2008). "Optics of high-performance electron Microscopes". Science and Technology of Advanced Materials. 9 (1): 014107. Bibcode:2008STAdM...9a4107R. doi:10.1088/0031-8949/9/1/014107. PMC 5099802. PMID 27877933.
Pogany, A. P.; Turner, P. S. (1968-01-23). "Reciprocity in electron diffraction and microscopy". Acta Crystallographica Section A. 24 (1): 103–109. Bibcode:1968AcCrA..24..103P. doi:10.1107/S0567739468000136. ISSN 1600-5724.
Buckingham, J (1965). "Thermionic emission properties of a lanthanum hexaboride/rhenium cathode". British Journal of Applied Physics. 16 (12): 1821. Bibcode:1965BJAP...16.1821B. doi:10.1088/0508-3443/16/12/306.
Cowley, J. M.; Moodie, A. F. (1957). "The Scattering of Electrons by Atoms and Crystals. I. A New Theoretical Approach" (PDF). Acta Crystallographica. 199 (3): 609–619. Bibcode:1957AcCry..10..609C. doi:10.1107/S0365110X57002194.
Levin, B. D. A.; et al. (2016). "Nanomaterial datasets to advance tomography in scanning transmission electron microscopy". Scientific Data. 3: 160041. arXiv:1606.02938. Bibcode:2016NatSD...360041L. doi:10.1038/sdata.2016.41. PMC 4896123. PMID 27272459.
Phillips (1961). "Diamond knife ultra microtomy of metals and the structure of microtomed sections". British Journal of Applied Physics. 12 (10): 554. Bibcode:1961BJAP...12..554P. doi:10.1088/0508-3443/12/10/308.
Bean, J. J.; Saito, M.; Fukami, S.; Sato, H.; Ikeda, S.; Ohno, H.; Ikuhara, Y.; Mckenna, K. P. (2017). "Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices". Scientific Reports. 7: 45594. Bibcode:2017NatSR...745594B. doi:10.1038/srep45594. ISSN 2045-2322. PMC 5379487. PMID 28374755.
Nebesářová1, Jana; Vancová, Marie (2007). "How to Observe Small Biological Objects in Low-Voltage Electron Microscope". Microscopy and Microanalysis. 13 (3): 248–249. Bibcode:2007MiMic..13S.248N. doi:10.1017/S143192760708124X. S2CID 138891812.{{cite journal}}: CS1 maint: numeric names: authors list (link)
M.J. Zachman; et al. (2016). "Site-Specific Preparation of Intact Solid–Liquid Interfaces by Label-Free In Situ Localization and Cryo-Focused Ion Beam Lift-Out". Microscopy and Microanalysis. 22 (6): 1338–1349. Bibcode:2016MiMic..22.1338Z. doi:10.1017/S1431927616011892. PMID 27869059.
Levin, B. D. A.; et al. (2017). "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts". Microscopy and Microanalysis. 23 (1): 155–162. Bibcode:2017MiMic..23..155L. doi:10.1017/S1431927617000058. PMID 28228169. S2CID 6801783.
de Jonge, N.; Ross, F.M. (2011). "Electron microscopy of specimens in liquid". Nature Nanotechnology. 6 (8): 695–704. Bibcode:2003NatMa...2..532W. doi:10.1038/nmat944. PMID 12872162. S2CID 21379512.
Vendelbo, S.B.; Kooyman, P.J.; Creemer, J.F.; Morana, B.; Mele, L.; Dona, P.; Nelissen, B.J.; Helveg, S. (October 2013). "Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy". Ultramicroscopy. 133: 72–79. Bibcode:2013IJMSI.133...72V. doi:10.1016/j.ultramic.2013.04.004. PMID 23831940.
Minor, Andrew M.; Dehm, Gerhard (June 2019). "Advances in in situ nanomechanical testing". MRS Bulletin. 44 (6): 438–442. Bibcode:2019MRSBu..44..438M. doi:10.1557/mrs.2019.127. hdl:21.11116/0000-0005-884D-C. S2CID 197631706.
Wilsdorf, H. G. F. (April 1958). "Apparatus for the Deformation of Foils in an Electron Microscope". Review of Scientific Instruments. 29 (4): 323–324. Bibcode:1958RScI...29..323W. doi:10.1063/1.1716192.
Pethicai, J. B.; Hutchings, R.; Oliver, W. C. (April 1983). "Hardness measurement at penetration depths as small as 20 nm". Philosophical Magazine A. 48 (4): 593–606. Bibcode:1983PMagA..48..593P. doi:10.1080/01418618308234914.
Minor, A. M.; Morris, J. W.; Stach, E. A. (2001). "Quantitativein situnanoindentation in an electron microscope". Applied Physics Letters. 79 (11): 1625–1627. Bibcode:2001ApPhL..79.1625M. doi:10.1063/1.1400768. OSTI 860719. Retrieved 2023-05-08.
Legros, Marc (February 2014). "In situ mechanical TEM: Seeing and measuring under stress with electrons". Comptes Rendus Physique. 15 (2–3): 224–240. Bibcode:2014CRPhy..15..224L. doi:10.1016/j.crhy.2014.02.002.
Oliver, W. C.; Pharr, G. M. (June 1992). "An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments". Journal of Materials Research. 7 (6): 1564–1583. Bibcode:1992JMatR...7.1564O. doi:10.1557/JMR.1992.1564. S2CID 137098960.
Zhu, Yong; Espinosa, Horacio D. (11 October 2005). "An electromechanical material testing system for in situ electron microscopy and applications". Proceedings of the National Academy of Sciences. 102 (41): 14503–14508. Bibcode:2005PNAS..10214503Z. doi:10.1073/pnas.0506544102. PMC 1253576. PMID 16195381.
Ishida, T; Nakajima, Y; Kakushima, K; Mita, M; Toshiyoshi, H; Fujita, H (1 July 2010). "Design and fabrication of MEMS-controlled probes for studying the nano-interface under in situ TEM observation". Journal of Micromechanics and Microengineering. 20 (7): 075011. Bibcode:2010JMiMi..20g5011I. doi:10.1088/0960-1317/20/7/075011. S2CID 137919989.
Dömer, H.; Bostanjoglo, O. (2003-09-25). "High-speed transmission electron microscope". Review of Scientific Instruments. 74 (10): 4369–4372. Bibcode:2003RScI...74.4369D. doi:10.1063/1.1611612. ISSN 0034-6748.
Oldfield, L. C. (June 1976). "A rotationally symmetric electron beam chopper for picosecond pulses". Journal of Physics E: Scientific Instruments. 9 (6): 455–463. Bibcode:1976JPhE....9..455O. doi:10.1088/0022-3735/9/6/011. ISSN 0022-3735.
Hassan, Mohammed T.; Liu, Haihua; Baskin, John Spencer; Zewail, Ahmed H. (2015-10-20). "Photon gating in four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 112 (42): 12944–12949. Bibcode:2015PNAS..11212944H. doi:10.1073/pnas.1517942112. ISSN 0027-8424. PMC 4620897. PMID 26438835.
Hassan, M. Th.; Baskin, J. S.; Liao, B.; Zewail, A. H. (July 2017). "High-temporal-resolution electron microscopy for imaging ultrafast electron dynamics". Nature Photonics. 11 (7): 425–430. arXiv:1704.04246. Bibcode:2017NaPho..11..425H. doi:10.1038/nphoton.2017.79. ISSN 1749-4885.
Campbell, Geoffrey H.; McKeown, Joseph T.; Santala, Melissa K. (2014-11-03). "Time resolved electron microscopy for in situ experiments". Applied Physics Reviews. 1 (4): 041101. Bibcode:2014ApPRv...1d1101C. doi:10.1063/1.4900509. OSTI 1186765.
Zewail, Ahmed H. (9 April 2010). "Four-Dimensional Electron Microscopy". Science. 328 (5975): 187–193. Bibcode:2010Sci...328..187Z. doi:10.1126/science.1166135. PMID 20378810. S2CID 5449372.
Lobatsov, Vladimir A.; Ramesh Srinivasan; Ahmed H. Zewail (2005-05-09). "Four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 102 (20): 7069–7073. Bibcode:2005PNAS..102.7069L. doi:10.1073/pnas.0502607102. PMC 1129142. PMID 15883380.
Browning, N.D.; Bonds, M.A.; Campbell, G.H.; Evans, J.E.; LaGrange, T.; Jungjohann, K.L.; Masiel, D.J.; McKeown, J.; Mehraeen, S.; Reed, B.W.; Santala, M. (February 2012). "Recent developments in dynamic transmission electron microscopy". Current Opinion in Solid State and Materials Science. 16 (1): 23–30. Bibcode:2012COSSM..16...23B. doi:10.1016/j.cossms.2011.07.001.
King, Wayne E.; Geoffrey H. Campbell; Alan Frank; Bryan Reed (2005). "Ultrafast electron microscopy in materials science, biology, and chemistry". Journal of Applied Physics. 97 (11): 111101–111101–27. Bibcode:2005JAP....97k1101K. doi:10.1063/1.1927699.
B. Barwick; D. J. Flannigan; A. H. Zewail (December 2009). "Photon-induced near-field electron microscopy". Nature. 462 (7275): 902–906. Bibcode:2009Natur.462..902B. doi:10.1038/nature08662. PMID 20016598. S2CID 4423704.
Pennycook, S.J.; Varela, M.; Hetherington, C.J.D.; Kirkland, A.I. (2011). "Materials Advances through Aberration-Corrected Electron Microscopy" (PDF). MRS Bulletin. 31 (1): 36–43. Bibcode:2011MRSBu..31...36P. doi:10.1557/mrs2006.4. S2CID 41889433.
Furuya, Kazuo (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Science and Technology of Advanced Materials. 9 (1). 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
Erni R, Rossell MD, Kisielowski C, Dahmen U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9). 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. PMID 19392535.
Tanaka, Nobuo (2008). "Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials". Sci. Technol. Adv. Mater. 9 (1): 014111. Bibcode:2008STAdM...9a4111T. doi:10.1088/1468-6996/9/1/014111. PMC 5099806. PMID 27877937.

iucr.org

journals.iucr.org

Cowley, J. M.; Moodie, A. F. (1957). "The Scattering of Electrons by Atoms and Crystals. I. A New Theoretical Approach" (PDF). Acta Crystallographica. 199 (3): 609–619. Bibcode:1957AcCry..10..609C. doi:10.1107/S0365110X57002194.

lbl.gov

foundry.lbl.gov

"TEAM 0.5". foundry.lbl.gov. Retrieved 2022-03-15.

microscopy.org

"A Brief History of the Microscopy Society of America". microscopy.org.

nature.com

Hassan, M. Th.; Baskin, J. S.; Liao, B.; Zewail, A. H. (July 2017). "High-temporal-resolution electron microscopy for imaging ultrafast electron dynamics". Nature Photonics. 11 (7): 425–430. arXiv:1704.04246. Bibcode:2017NaPho..11..425H. doi:10.1038/nphoton.2017.79. ISSN 1749-4885.
B. Barwick; D. J. Flannigan; A. H. Zewail (December 2009). "Photon-induced near-field electron microscopy". Nature. 462 (7275): 902–906. Bibcode:2009Natur.462..902B. doi:10.1038/nature08662. PMID 20016598. S2CID 4423704.

nih.gov

pubmed.ncbi.nlm.nih.gov

Crewe, Albert V.; Wall, J.; Langmore, J. (1970). "Visibility of a single atom". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. PMID 17731040. S2CID 31952480.
Rose, H H (2008). "Optics of high-performance electron Microscopes". Science and Technology of Advanced Materials. 9 (1): 014107. Bibcode:2008STAdM...9a4107R. doi:10.1088/0031-8949/9/1/014107. PMC 5099802. PMID 27877933.
Faruqi, A.R; Henderson, R. (October 2007). "Electronic detectors for electron microscopy". Current Opinion in Structural Biology. 17 (5): 549–555. doi:10.1016/j.sbi.2007.08.014. PMID 17913494.
Henderson, R.; Cattermole, D.; McMullan, G.; Scotcher, S.; Fordham, M.; Amos, W.B.; Faruqi, A.R. (February 2007). "Digitisation of electron microscope films: Six useful tests applied to three film scanners". Ultramicroscopy. 107 (2–3): 73–80. doi:10.1016/j.ultramic.2006.05.003. PMID 16872749.
Fan, G. Y.; Ellisman, M. H. (24 December 2001). "Digital imaging in transmission electron microscopy". Journal of Microscopy. 200 (1): 1–13. doi:10.1046/j.1365-2818.2000.00737.x. ISSN 0022-2720. PMID 11012823. S2CID 2034467.
McMullan, G.; Faruqi, A.R.; Henderson, R. (2016). "Direct Electron Detectors". The Resolution Revolution: Recent Advances in cryoEM. Methods in Enzymology. Vol. 579. pp. 1–17. doi:10.1016/bs.mie.2016.05.056. ISBN 978-0-12-805382-9. PMID 27572721.
McMullan, G.; Faruqi, A.R.; Henderson, R.; Guerrini, N.; Turchetta, R.; Jacobs, A.; van Hoften, G. (18 May 2009). "Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector". Ultramicroscopy. 109 (9): 1144–1147. doi:10.1016/j.ultramic.2009.05.005. PMC 2937214. PMID 19541421.
Ruskin, Rachel S.; Yu, Zhiheng; Grigorieff, Nikolaus (1 November 2013). "Quantitative characterization of electron detectors for transmission electron microscopy". Journal of Structural Biology. 184 (3): 385–393. doi:10.1016/j.jsb.2013.10.016. PMC 3876735. PMID 24189638.
Pulokas, James; Green, Carmen; Kisseberth, Nick; Potter, Clinton S.; Carragher, Bridget (1999). "Improving the Positional Accuracy of the Goniometer on the Philips CM Series TEM". Journal of Structural Biology. 128 (3): 250–256. doi:10.1006/jsbi.1999.4181. PMID 10633064.
Mast, Jan; Demeestere, Lien (2009). "Electron tomography of negatively stained complex viruses: application in their diagnosis". Diagnostic Pathology. 4: 5. doi:10.1186/1746-1596-4-5. PMC 2649040. PMID 19208223.
Levin, B. D. A.; et al. (2016). "Nanomaterial datasets to advance tomography in scanning transmission electron microscopy". Scientific Data. 3: 160041. arXiv:1606.02938. Bibcode:2016NatSD...360041L. doi:10.1038/sdata.2016.41. PMC 4896123. PMID 27272459.
Kawase, Noboru; Kato, Mitsuro; Jinnai, Hiroshi; Jinnai, H (2007). "Transmission electron microtomography without the 'missing wedge' for quantitative structural analysis". Ultramicroscopy. 107 (1): 8–15. doi:10.1016/j.ultramic.2006.04.007. PMID 16730409.
Heidari, Hamed; Van den Broek, Wouter; Bals, Sara (2013). "Quantitative electron tomography: The effect of the three-dimensional point spread function". Ultramicroscopy. 135: 1–5. doi:10.1016/j.ultramic.2013.06.005. hdl:10067/1113970151162165141. PMID 23872036.
Cheville, NF; Stasko J (2014). "Techniques in Electron Microscopy of Animal Tissue". Veterinary Pathology. 51 (1): 28–41. doi:10.1177/0300985813505114. PMID 24114311.
Amzallag, Arnaud; Vaillant, Cédric; Jacob, Mathews; Unser, Michael; Bednar, Jan; Kahn, Jason D.; Dubochet, Jacques; Stasiak, Andrzej; Maddocks, John H. (2006). "3D reconstruction and comparison of shapes of DNA minicircles observed by cryo-electron microscopy". Nucleic Acids Research. 34 (18): e125. doi:10.1093/nar/gkl675. PMC 1635295. PMID 17012274.
Winey, M.; Meehl, J. B.; O’Toole, E. T. & Giddings, T. H. (2014). "Conventional transmission electron microscopy". Molecular Biology of the Cell. 25 (3): 319–323. doi:10.1091/mbc.e12-12-0863. PMC 3907272. PMID 24482357. S2CID 37311577.
Porter, K & Blum, J (1953). "A study in Microtomy for Electron Microscopy". The Anatomical Record. 117 (4): 685–710. doi:10.1002/ar.1091170403. PMID 13124776. S2CID 37311577.
Thompson, Rebecca F.; Walker, Matt; Siebert, C. Alistair; Muench, Stephen P.; Ranson, Neil A. (2016-05-01). "An introduction to sample preparation and imaging by cryo-electron microscopy for structural biology". Methods. Single Particle Cryo-EM, from sample to reconstruction. 100: 3–15. doi:10.1016/j.ymeth.2016.02.017. ISSN 1046-2023. PMC 4854231. PMID 26931652.
Bean, J. J.; Saito, M.; Fukami, S.; Sato, H.; Ikeda, S.; Ohno, H.; Ikuhara, Y.; Mckenna, K. P. (2017). "Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices". Scientific Reports. 7: 45594. Bibcode:2017NatSR...745594B. doi:10.1038/srep45594. ISSN 2045-2322. PMC 5379487. PMID 28374755.
Baram, M. & Kaplan W. D. (2008). "Quantitative HRTEM analysis of FIB prepared specimens". Journal of Microscopy. 232 (3): 395–405. doi:10.1111/j.1365-2818.2008.02134.x. PMID 19094016. S2CID 6487344.
Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219: 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.
Drummy, Lawrence, F.; Yang, Junyan; Martin, David C. (2004). "Low-voltage electron microscopy of polymer and organic molecular thin films". Ultramicroscopy. 99 (4): 247–256. doi:10.1016/j.ultramic.2004.01.011. PMID 15149719.{{cite journal}}: CS1 maint: multiple names: authors list (link)
Li, Z; Baker, ML; Jiang, W; Estes, MK; Prasad, BV (2009). "Rotavirus Architecture at Subnanometer Resolution". Journal of Virology. 83 (4): 1754–1766. doi:10.1128/JVI.01855-08. PMC 2643745. PMID 19036817.
M.J. Zachman; et al. (2016). "Site-Specific Preparation of Intact Solid–Liquid Interfaces by Label-Free In Situ Localization and Cryo-Focused Ion Beam Lift-Out". Microscopy and Microanalysis. 22 (6): 1338–1349. Bibcode:2016MiMic..22.1338Z. doi:10.1017/S1431927616011892. PMID 27869059.
Levin, B. D. A.; et al. (2017). "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts". Microscopy and Microanalysis. 23 (1): 155–162. Bibcode:2017MiMic..23..155L. doi:10.1017/S1431927617000058. PMID 28228169. S2CID 6801783.
Shimizu, Toshiki; Lungerich, Dominik; Harano, Koji; Nakamura, Eiichi (2022). "Time-Resolved Imaging of Stochastic Cascade Reactions over a Submillisecond to Second Time Range at the Angstrom Level". Journal of the American Chemical Society. 144 (22): 9797–9805. arXiv:2202.13332. doi:10.1021/jacs.2c02297. PMID 35609254. S2CID 247158917.
de Jonge, N.; Ross, F.M. (2011). "Electron microscopy of specimens in liquid". Nature Nanotechnology. 6 (8): 695–704. Bibcode:2003NatMa...2..532W. doi:10.1038/nmat944. PMID 12872162. S2CID 21379512.
F. M. Ross (2015). "Opportunities and challenges in liquid cell electron microscopy". Science. 350 (6267): 1490–1501. doi:10.1126/science.aaa9886. PMID 26680204.
Yaguchi, T.; Suzuki, M.; Watabe, A.; Nagakubo, Y.; Ueda, K.; Kamino, T. (2011-03-22). "Development of a high temperature-atmospheric pressure environmental cell for high-resolution TEM". Journal of Electron Microscopy. 60 (3): 217–225. doi:10.1093/jmicro/dfr011. ISSN 0022-0744. PMID 21427119.
Taheri, Mitra L.; Stach, Eric A.; Arslan, Ilke; Crozier, P.A.; Kabius, Bernd C.; LaGrange, Thomas; Minor, Andrew M.; Takeda, Seiji; Tanase, Mihaela; Wagner, Jakob B.; Sharma, Renu (November 2016). "Current status and future directions for in situ transmission electron microscopy". Ultramicroscopy. 170: 86–95. doi:10.1016/j.ultramic.2016.08.007. PMC 5100813. PMID 27566048.
van Omme, J. Tijn; Zakhozheva, Marina; Spruit, Ronald G.; Sholkina, Mariya; Pérez Garza, H. Hugo (September 2018). "Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability". Ultramicroscopy. 192: 14–20. doi:10.1016/j.ultramic.2018.05.005. PMID 29802911. S2CID 44069323.
Zhang, Chao; Firestein, Konstantin L.; Fernando, Joseph F. S.; Siriwardena, Dumindu; Treifeldt, Joel E.; Golberg, Dmitri (2019-09-30). "Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials" (PDF). Advanced Materials. 32 (18): 1904094. doi:10.1002/adma.201904094. ISSN 0935-9648. PMID 31566272. S2CID 203607267.
Picher, Matthieu; Mazzucco, Stefano; Blankenship, Steve; Sharma, Renu (March 2015). "Vibrational and optical spectroscopies integrated with environmental transmission electron microscopy". Ultramicroscopy. 150: 10–15. doi:10.1016/j.ultramic.2014.11.023. PMID 25490533.
Niekiel, Florian; Kraschewski, Simon M.; Müller, Julian; Butz, Benjamin; Spiecker, Erdmann (2017-05-01). "Local temperature measurement in TEM by parallel beam electron diffraction". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 161–169. doi:10.1016/j.ultramic.2016.11.028. ISSN 0304-3991. PMID 28049586.
Vendelbo, S.B.; Kooyman, P.J.; Creemer, J.F.; Morana, B.; Mele, L.; Dona, P.; Nelissen, B.J.; Helveg, S. (October 2013). "Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy". Ultramicroscopy. 133: 72–79. Bibcode:2013IJMSI.133...72V. doi:10.1016/j.ultramic.2013.04.004. PMID 23831940.
Legros, Marc; Cabié, Martiane; Gianola, Daniel S. (March 2009). "In situ deformation of thin films on substrates". Microscopy Research and Technique. 72 (3): 270–283. doi:10.1002/jemt.20680. PMID 19189313. S2CID 10431993.
Zhu, Yong; Espinosa, Horacio D. (11 October 2005). "An electromechanical material testing system for in situ electron microscopy and applications". Proceedings of the National Academy of Sciences. 102 (41): 14503–14508. Bibcode:2005PNAS..10214503Z. doi:10.1073/pnas.0506544102. PMC 1253576. PMID 16195381.
Feist, Armin; Bach, Nora; Rubiano da Silva, Nara; Danz, Thomas; Möller, Marcel; Priebe, Katharina E.; Domröse, Till; Gatzmann, J. Gregor; Rost, Stefan; Schauss, Jakob; Strauch, Stefanie; Bormann, Reiner; Sivis, Murat; Schäfer, Sascha; Ropers, Claus (2017-05-01). "Ultrafast Transmission Electron Microscopy Using a Laser-Driven Field Emitter: Femtosecond Resolution with a High Coherence Electron Beam". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 63–73. arXiv:1611.05022. doi:10.1016/j.ultramic.2016.12.005. PMID 28139341. S2CID 31779409.
Hassan, Mohammed T.; Liu, Haihua; Baskin, John Spencer; Zewail, Ahmed H. (2015-10-20). "Photon gating in four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 112 (42): 12944–12949. Bibcode:2015PNAS..11212944H. doi:10.1073/pnas.1517942112. ISSN 0027-8424. PMC 4620897. PMID 26438835.
Zewail, Ahmed H. (9 April 2010). "Four-Dimensional Electron Microscopy". Science. 328 (5975): 187–193. Bibcode:2010Sci...328..187Z. doi:10.1126/science.1166135. PMID 20378810. S2CID 5449372.
Lobatsov, Vladimir A.; Ramesh Srinivasan; Ahmed H. Zewail (2005-05-09). "Four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 102 (20): 7069–7073. Bibcode:2005PNAS..102.7069L. doi:10.1073/pnas.0502607102. PMC 1129142. PMID 15883380.
B. Barwick; D. J. Flannigan; A. H. Zewail (December 2009). "Photon-induced near-field electron microscopy". Nature. 462 (7275): 902–906. Bibcode:2009Natur.462..902B. doi:10.1038/nature08662. PMID 20016598. S2CID 4423704.
Furuya, Kazuo (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Science and Technology of Advanced Materials. 9 (1). 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
Erni R, Rossell MD, Kisielowski C, Dahmen U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9). 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. PMID 19392535.
Tanaka, Nobuo (2008). "Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials". Sci. Technol. Adv. Mater. 9 (1): 014111. Bibcode:2008STAdM...9a4111T. doi:10.1088/1468-6996/9/1/014111. PMC 5099806. PMID 27877937.

ncbi.nlm.nih.gov

Rose, H H (2008). "Optics of high-performance electron Microscopes". Science and Technology of Advanced Materials. 9 (1): 014107. Bibcode:2008STAdM...9a4107R. doi:10.1088/0031-8949/9/1/014107. PMC 5099802. PMID 27877933.
McMullan, G.; Faruqi, A.R.; Henderson, R.; Guerrini, N.; Turchetta, R.; Jacobs, A.; van Hoften, G. (18 May 2009). "Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector". Ultramicroscopy. 109 (9): 1144–1147. doi:10.1016/j.ultramic.2009.05.005. PMC 2937214. PMID 19541421.
Ruskin, Rachel S.; Yu, Zhiheng; Grigorieff, Nikolaus (1 November 2013). "Quantitative characterization of electron detectors for transmission electron microscopy". Journal of Structural Biology. 184 (3): 385–393. doi:10.1016/j.jsb.2013.10.016. PMC 3876735. PMID 24189638.
Mast, Jan; Demeestere, Lien (2009). "Electron tomography of negatively stained complex viruses: application in their diagnosis". Diagnostic Pathology. 4: 5. doi:10.1186/1746-1596-4-5. PMC 2649040. PMID 19208223.
Levin, B. D. A.; et al. (2016). "Nanomaterial datasets to advance tomography in scanning transmission electron microscopy". Scientific Data. 3: 160041. arXiv:1606.02938. Bibcode:2016NatSD...360041L. doi:10.1038/sdata.2016.41. PMC 4896123. PMID 27272459.
Amzallag, Arnaud; Vaillant, Cédric; Jacob, Mathews; Unser, Michael; Bednar, Jan; Kahn, Jason D.; Dubochet, Jacques; Stasiak, Andrzej; Maddocks, John H. (2006). "3D reconstruction and comparison of shapes of DNA minicircles observed by cryo-electron microscopy". Nucleic Acids Research. 34 (18): e125. doi:10.1093/nar/gkl675. PMC 1635295. PMID 17012274.
Winey, M.; Meehl, J. B.; O’Toole, E. T. & Giddings, T. H. (2014). "Conventional transmission electron microscopy". Molecular Biology of the Cell. 25 (3): 319–323. doi:10.1091/mbc.e12-12-0863. PMC 3907272. PMID 24482357. S2CID 37311577.
Thompson, Rebecca F.; Walker, Matt; Siebert, C. Alistair; Muench, Stephen P.; Ranson, Neil A. (2016-05-01). "An introduction to sample preparation and imaging by cryo-electron microscopy for structural biology". Methods. Single Particle Cryo-EM, from sample to reconstruction. 100: 3–15. doi:10.1016/j.ymeth.2016.02.017. ISSN 1046-2023. PMC 4854231. PMID 26931652.
Bean, J. J.; Saito, M.; Fukami, S.; Sato, H.; Ikeda, S.; Ohno, H.; Ikuhara, Y.; Mckenna, K. P. (2017). "Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices". Scientific Reports. 7: 45594. Bibcode:2017NatSR...745594B. doi:10.1038/srep45594. ISSN 2045-2322. PMC 5379487. PMID 28374755.
Li, Z; Baker, ML; Jiang, W; Estes, MK; Prasad, BV (2009). "Rotavirus Architecture at Subnanometer Resolution". Journal of Virology. 83 (4): 1754–1766. doi:10.1128/JVI.01855-08. PMC 2643745. PMID 19036817.
Taheri, Mitra L.; Stach, Eric A.; Arslan, Ilke; Crozier, P.A.; Kabius, Bernd C.; LaGrange, Thomas; Minor, Andrew M.; Takeda, Seiji; Tanase, Mihaela; Wagner, Jakob B.; Sharma, Renu (November 2016). "Current status and future directions for in situ transmission electron microscopy". Ultramicroscopy. 170: 86–95. doi:10.1016/j.ultramic.2016.08.007. PMC 5100813. PMID 27566048.
Zhu, Yong; Espinosa, Horacio D. (11 October 2005). "An electromechanical material testing system for in situ electron microscopy and applications". Proceedings of the National Academy of Sciences. 102 (41): 14503–14508. Bibcode:2005PNAS..10214503Z. doi:10.1073/pnas.0506544102. PMC 1253576. PMID 16195381.
Hassan, Mohammed T.; Liu, Haihua; Baskin, John Spencer; Zewail, Ahmed H. (2015-10-20). "Photon gating in four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 112 (42): 12944–12949. Bibcode:2015PNAS..11212944H. doi:10.1073/pnas.1517942112. ISSN 0027-8424. PMC 4620897. PMID 26438835.
Lobatsov, Vladimir A.; Ramesh Srinivasan; Ahmed H. Zewail (2005-05-09). "Four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 102 (20): 7069–7073. Bibcode:2005PNAS..102.7069L. doi:10.1073/pnas.0502607102. PMC 1129142. PMID 15883380.
Furuya, Kazuo (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Science and Technology of Advanced Materials. 9 (1). 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
Tanaka, Nobuo (2008). "Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials". Sci. Technol. Adv. Mater. 9 (1): 014111. Bibcode:2008STAdM...9a4111T. doi:10.1088/1468-6996/9/1/014111. PMC 5099806. PMID 27877937.

nobelprize.org

"The Nobel Prize in Physics 1986, Perspectives – Life through a Lens". nobelprize.org.
"Ferdinand Braun, The Nobel Prize in Physics 1909, Biography". nobelprize.org.
"Ernst Ruska, Nobel Prize Lecture". nobelprize.org.

osti.gov

Minor, A. M.; Morris, J. W.; Stach, E. A. (2001). "Quantitativein situnanoindentation in an electron microscope". Applied Physics Letters. 79 (11): 1625–1627. Bibcode:2001ApPhL..79.1625M. doi:10.1063/1.1400768. OSTI 860719. Retrieved 2023-05-08.
Campbell, Geoffrey H.; McKeown, Joseph T.; Santala, Melissa K. (2014-11-03). "Time resolved electron microscopy for in situ experiments". Applied Physics Reviews. 1 (4): 041101. Bibcode:2014ApPRv...1d1101C. doi:10.1063/1.4900509. OSTI 1186765.
O'Keefe, Michael A.; Allard, Lawrence F. (18 January 2004). "Sub-Angstrom electron microscopy for sub-Angstrom nano-metrology". OSTI 821768. {{cite journal}}: Cite journal requires |journal= (help)

pdx.edu

web.pdx.edu

Pennycook, S.J.; Varela, M.; Hetherington, C.J.D.; Kirkland, A.I. (2011). "Materials Advances through Aberration-Corrected Electron Microscopy" (PDF). MRS Bulletin. 31 (1): 36–43. Bibcode:2011MRSBu..31...36P. doi:10.1557/mrs2006.4. S2CID 41889433.

proquest.com

Bataineh, Khaled (2005). Development of precision TEM holder assemblies for use in extreme environments (Thesis). ProQuest 305444239.

qut.edu.au

eprints.qut.edu.au

Zhang, Chao; Firestein, Konstantin L.; Fernando, Joseph F. S.; Siriwardena, Dumindu; Treifeldt, Joel E.; Golberg, Dmitri (2019-09-30). "Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials" (PDF). Advanced Materials. 32 (18): 1904094. doi:10.1002/adma.201904094. ISSN 0935-9648. PMID 31566272. S2CID 203607267.

rcn.com

users.rcn.com

"Viruses". users.rcn.com.

researchgate.net

Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219: 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.

rodenburg.org

"The objective lens of a TEM, the heart of the electron microscope". rodenburg.org.
Rodenburg, J M. "The Vacuum System". rodenburg.org.

semanticscholar.org

api.semanticscholar.org

Crewe, Albert V.; Wall, J.; Langmore, J. (1970). "Visibility of a single atom". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. PMID 17731040. S2CID 31952480.
Fan, G. Y.; Ellisman, M. H. (24 December 2001). "Digital imaging in transmission electron microscopy". Journal of Microscopy. 200 (1): 1–13. doi:10.1046/j.1365-2818.2000.00737.x. ISSN 0022-2720. PMID 11012823. S2CID 2034467.
Ercius, P.; Caswell, T.; Tate, M.W.; Ercan, A.; Gruner, S.M.; Muller, D. (September 2005). "A Pixel Array Detector for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis. 14 (S2): 806–807. doi:10.1017/s1431927608085711. ISSN 1431-9276. S2CID 137491811.
Winey, M.; Meehl, J. B.; O’Toole, E. T. & Giddings, T. H. (2014). "Conventional transmission electron microscopy". Molecular Biology of the Cell. 25 (3): 319–323. doi:10.1091/mbc.e12-12-0863. PMC 3907272. PMID 24482357. S2CID 37311577.
Porter, K & Blum, J (1953). "A study in Microtomy for Electron Microscopy". The Anatomical Record. 117 (4): 685–710. doi:10.1002/ar.1091170403. PMID 13124776. S2CID 37311577.
Baram, M. & Kaplan W. D. (2008). "Quantitative HRTEM analysis of FIB prepared specimens". Journal of Microscopy. 232 (3): 395–405. doi:10.1111/j.1365-2818.2008.02134.x. PMID 19094016. S2CID 6487344.
Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219: 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.
Nebesářová1, Jana; Vancová, Marie (2007). "How to Observe Small Biological Objects in Low-Voltage Electron Microscope". Microscopy and Microanalysis. 13 (3): 248–249. Bibcode:2007MiMic..13S.248N. doi:10.1017/S143192760708124X. S2CID 138891812.{{cite journal}}: CS1 maint: numeric names: authors list (link)
Levin, B. D. A.; et al. (2017). "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts". Microscopy and Microanalysis. 23 (1): 155–162. Bibcode:2017MiMic..23..155L. doi:10.1017/S1431927617000058. PMID 28228169. S2CID 6801783.
P.A. Crozier; T.W. Hansen (2014). "In situ and operando transmission electron microscopy of catalytic materials". MRS Bulletin. 40: 38–45. doi:10.1557/mrs.2014.304. hdl:2286/R.I.35693. S2CID 138802942.
Shimizu, Toshiki; Lungerich, Dominik; Harano, Koji; Nakamura, Eiichi (2022). "Time-Resolved Imaging of Stochastic Cascade Reactions over a Submillisecond to Second Time Range at the Angstrom Level". Journal of the American Chemical Society. 144 (22): 9797–9805. arXiv:2202.13332. doi:10.1021/jacs.2c02297. PMID 35609254. S2CID 247158917.
de Jonge, N.; Ross, F.M. (2011). "Electron microscopy of specimens in liquid". Nature Nanotechnology. 6 (8): 695–704. Bibcode:2003NatMa...2..532W. doi:10.1038/nmat944. PMID 12872162. S2CID 21379512.
Haque, M. A. & Saif, M. T. A. (2001). "In-situ tensile testing of nano-scale specimens in SEM and TEM". Experimental Mechanics. 42: 123. doi:10.1007/BF02411059. S2CID 136678366.
van Omme, J. Tijn; Zakhozheva, Marina; Spruit, Ronald G.; Sholkina, Mariya; Pérez Garza, H. Hugo (September 2018). "Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability". Ultramicroscopy. 192: 14–20. doi:10.1016/j.ultramic.2018.05.005. PMID 29802911. S2CID 44069323.
Saka, Hiroyasu; Kamino, Takeo; Ara, Shigeo; Sasaki, Katsuhiro (2008-02-01). "In Situ Heating Transmission Electron Microscopy". MRS Bulletin. 33 (2): 93–100. doi:10.1557/mrs2008.21. ISSN 1938-1425. S2CID 136475122.
Zhang, Chao; Firestein, Konstantin L.; Fernando, Joseph F. S.; Siriwardena, Dumindu; Treifeldt, Joel E.; Golberg, Dmitri (2019-09-30). "Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials" (PDF). Advanced Materials. 32 (18): 1904094. doi:10.1002/adma.201904094. ISSN 0935-9648. PMID 31566272. S2CID 203607267.
Minor, Andrew M.; Dehm, Gerhard (June 2019). "Advances in in situ nanomechanical testing". MRS Bulletin. 44 (6): 438–442. Bibcode:2019MRSBu..44..438M. doi:10.1557/mrs.2019.127. hdl:21.11116/0000-0005-884D-C. S2CID 197631706.
Legros, Marc; Cabié, Martiane; Gianola, Daniel S. (March 2009). "In situ deformation of thin films on substrates". Microscopy Research and Technique. 72 (3): 270–283. doi:10.1002/jemt.20680. PMID 19189313. S2CID 10431993.
Oliver, W. C.; Pharr, G. M. (June 1992). "An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments". Journal of Materials Research. 7 (6): 1564–1583. Bibcode:1992JMatR...7.1564O. doi:10.1557/JMR.1992.1564. S2CID 137098960.
Haque, M. A.; Espinosa, H. D.; Lee, H. J. (May 2010). "MEMS for In Situ Testing—Handling, Actuation, Loading, and Displacement Measurements". MRS Bulletin. 35 (5): 375–381. doi:10.1557/mrs2010.570. S2CID 12455370.
Ishida, T; Nakajima, Y; Kakushima, K; Mita, M; Toshiyoshi, H; Fujita, H (1 July 2010). "Design and fabrication of MEMS-controlled probes for studying the nano-interface under in situ TEM observation". Journal of Micromechanics and Microengineering. 20 (7): 075011. Bibcode:2010JMiMi..20g5011I. doi:10.1088/0960-1317/20/7/075011. S2CID 137919989.
Feist, Armin; Bach, Nora; Rubiano da Silva, Nara; Danz, Thomas; Möller, Marcel; Priebe, Katharina E.; Domröse, Till; Gatzmann, J. Gregor; Rost, Stefan; Schauss, Jakob; Strauch, Stefanie; Bormann, Reiner; Sivis, Murat; Schäfer, Sascha; Ropers, Claus (2017-05-01). "Ultrafast Transmission Electron Microscopy Using a Laser-Driven Field Emitter: Femtosecond Resolution with a High Coherence Electron Beam". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 63–73. arXiv:1611.05022. doi:10.1016/j.ultramic.2016.12.005. PMID 28139341. S2CID 31779409.
Zewail, Ahmed H. (9 April 2010). "Four-Dimensional Electron Microscopy". Science. 328 (5975): 187–193. Bibcode:2010Sci...328..187Z. doi:10.1126/science.1166135. PMID 20378810. S2CID 5449372.
B. Barwick; D. J. Flannigan; A. H. Zewail (December 2009). "Photon-induced near-field electron microscopy". Nature. 462 (7275): 902–906. Bibcode:2009Natur.462..902B. doi:10.1038/nature08662. PMID 20016598. S2CID 4423704.
Pennycook, S.J.; Varela, M.; Hetherington, C.J.D.; Kirkland, A.I. (2011). "Materials Advances through Aberration-Corrected Electron Microscopy" (PDF). MRS Bulletin. 31 (1): 36–43. Bibcode:2011MRSBu..31...36P. doi:10.1557/mrs2006.4. S2CID 41889433.

unibas.ch

2dx.unibas.ch

Stahlberg, Henning (September 6, 2012). "Contrast Transfer Functions". 2dx.unibas.ch.

unt.edu

digital.library.unt.edu

Crewe, Albert V; Isaacson, M.; Johnson, D. (1969). "A Simple Scanning Electron Microscope". Rev. Sci. Instrum. 40 (2): 241–246. Bibcode:1969RScI...40..241C. doi:10.1063/1.1683910.
Browning, N.D.; Bonds, M.A.; Campbell, G.H.; Evans, J.E.; LaGrange, T.; Jungjohann, K.L.; Masiel, D.J.; McKeown, J.; Mehraeen, S.; Reed, B.W.; Santala, M. (February 2012). "Recent developments in dynamic transmission electron microscopy". Current Opinion in Solid State and Materials Science. 16 (1): 23–30. Bibcode:2012COSSM..16...23B. doi:10.1016/j.cossms.2011.07.001.
Erni R, Rossell MD, Kisielowski C, Dahmen U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9). 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. PMID 19392535.

web.archive.org

"Dr. James Hillier, Biography". comdir.bfree.on.ca. Archived from the original on 2008-06-19. Retrieved 2008-09-09.

worldcat.org

search.worldcat.org

Pogany, A. P.; Turner, P. S. (1968-01-23). "Reciprocity in electron diffraction and microscopy". Acta Crystallographica Section A. 24 (1): 103–109. Bibcode:1968AcCrA..24..103P. doi:10.1107/S0567739468000136. ISSN 1600-5724.
Roberts, P. T. E.; Chapman, J. N.; MacLeod, A. M. (1982-01-01). "A CCD-based image recording system for the CTEM". Ultramicroscopy. 8 (4): 385–396. doi:10.1016/0304-3991(82)90061-4. ISSN 0304-3991.
Fan, G. Y.; Ellisman, M. H. (24 December 2001). "Digital imaging in transmission electron microscopy". Journal of Microscopy. 200 (1): 1–13. doi:10.1046/j.1365-2818.2000.00737.x. ISSN 0022-2720. PMID 11012823. S2CID 2034467.
Faruqi, A.R.; Henderson, R.; Pryddetch, M.; Allport, P.; Evans, A. (October 2006). "Erratum to: "Direct single electron detection with a CMOS detector for electron microscopy"". Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 566 (2): 770. doi:10.1016/j.nima.2006.07.013. ISSN 0168-9002.
Ercius, P.; Caswell, T.; Tate, M.W.; Ercan, A.; Gruner, S.M.; Muller, D. (September 2005). "A Pixel Array Detector for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis. 14 (S2): 806–807. doi:10.1017/s1431927608085711. ISSN 1431-9276. S2CID 137491811.
Thompson, Rebecca F.; Walker, Matt; Siebert, C. Alistair; Muench, Stephen P.; Ranson, Neil A. (2016-05-01). "An introduction to sample preparation and imaging by cryo-electron microscopy for structural biology". Methods. Single Particle Cryo-EM, from sample to reconstruction. 100: 3–15. doi:10.1016/j.ymeth.2016.02.017. ISSN 1046-2023. PMC 4854231. PMID 26931652.
Bean, J. J.; Saito, M.; Fukami, S.; Sato, H.; Ikeda, S.; Ohno, H.; Ikuhara, Y.; Mckenna, K. P. (2017). "Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices". Scientific Reports. 7: 45594. Bibcode:2017NatSR...745594B. doi:10.1038/srep45594. ISSN 2045-2322. PMC 5379487. PMID 28374755.
Yaguchi, T.; Suzuki, M.; Watabe, A.; Nagakubo, Y.; Ueda, K.; Kamino, T. (2011-03-22). "Development of a high temperature-atmospheric pressure environmental cell for high-resolution TEM". Journal of Electron Microscopy. 60 (3): 217–225. doi:10.1093/jmicro/dfr011. ISSN 0022-0744. PMID 21427119.
Saka, Hiroyasu; Kamino, Takeo; Ara, Shigeo; Sasaki, Katsuhiro (2008-02-01). "In Situ Heating Transmission Electron Microscopy". MRS Bulletin. 33 (2): 93–100. doi:10.1557/mrs2008.21. ISSN 1938-1425. S2CID 136475122.
Zhang, Chao; Firestein, Konstantin L.; Fernando, Joseph F. S.; Siriwardena, Dumindu; Treifeldt, Joel E.; Golberg, Dmitri (2019-09-30). "Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials" (PDF). Advanced Materials. 32 (18): 1904094. doi:10.1002/adma.201904094. ISSN 0935-9648. PMID 31566272. S2CID 203607267.
Niekiel, Florian; Kraschewski, Simon M.; Müller, Julian; Butz, Benjamin; Spiecker, Erdmann (2017-05-01). "Local temperature measurement in TEM by parallel beam electron diffraction". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 161–169. doi:10.1016/j.ultramic.2016.11.028. ISSN 0304-3991. PMID 28049586.
Dömer, H.; Bostanjoglo, O. (2003-09-25). "High-speed transmission electron microscope". Review of Scientific Instruments. 74 (10): 4369–4372. Bibcode:2003RScI...74.4369D. doi:10.1063/1.1611612. ISSN 0034-6748.
Oldfield, L. C. (June 1976). "A rotationally symmetric electron beam chopper for picosecond pulses". Journal of Physics E: Scientific Instruments. 9 (6): 455–463. Bibcode:1976JPhE....9..455O. doi:10.1088/0022-3735/9/6/011. ISSN 0022-3735.
Hassan, Mohammed T.; Liu, Haihua; Baskin, John Spencer; Zewail, Ahmed H. (2015-10-20). "Photon gating in four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 112 (42): 12944–12949. Bibcode:2015PNAS..11212944H. doi:10.1073/pnas.1517942112. ISSN 0027-8424. PMC 4620897. PMID 26438835.
Hassan, M. Th.; Baskin, J. S.; Liao, B.; Zewail, A. H. (July 2017). "High-temporal-resolution electron microscopy for imaging ultrafast electron dynamics". Nature Photonics. 11 (7): 425–430. arXiv:1704.04246. Bibcode:2017NaPho..11..425H. doi:10.1038/nphoton.2017.79. ISSN 1749-4885.

zenodo.org

Levin, B. D. A.; et al. (2017). "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts". Microscopy and Microanalysis. 23 (1): 155–162. Bibcode:2017MiMic..23..155L. doi:10.1017/S1431927617000058. PMID 28228169. S2CID 6801783.
F. M. Ross (2015). "Opportunities and challenges in liquid cell electron microscopy". Science. 350 (6267): 1490–1501. doi:10.1126/science.aaa9886. PMID 26680204.