Transmission electron microscopy (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Transmission electron microscopy" in English language version.

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academie-sciences.fr (Global: 7,547^th place; English: low place)

comptes-rendus.academie-sciences.fr

Legros, Marc (February 2014). "In situ mechanical TEM: Seeing and measuring under stress with electrons". Comptes Rendus Physique. 15 (2–3): 224–240. Bibcode:2014CRPhy..15..224L. doi:10.1016/j.crhy.2014.02.002.

aip.org (Global: 2,204^th place; English: 1,735^th place)

pubs.aip.org

Minor, A. M.; Morris, J. W.; Stach, E. A. (2001). "Quantitativein situnanoindentation in an electron microscope". Applied Physics Letters. 79 (11): 1625–1627. Bibcode:2001ApPhL..79.1625M. doi:10.1063/1.1400768. OSTI 860719. Retrieved 2023-05-08.

archive.org (Global: 6^th place; English: 6^th place)

Williams, D. & Carter, C. B. (1996). Transmission Electron Microscopy, Vol. 1 – Basics. Plenum Press. ISBN 978-0-306-45324-3.^{[page needed]}

arxiv.org (Global: 69^th place; English: 59^th place)

Levin, B. D. A.; et al. (2016). "Nanomaterial datasets to advance tomography in scanning transmission electron microscopy". Scientific Data. 3 160041. arXiv:1606.02938. Bibcode:2016NatSD...360041L. doi:10.1038/sdata.2016.41. PMC 4896123. PMID 27272459.
Rennich, Emily; Sung, Suk Hyun; Hovden, Robert; El Baggari, Ismail (9 September 2025). "Ultracold cryogenic TEM with liquid helium and high stability". Proceedings of the National Academy of Sciences of the United States of America. 122 (36) e2509736122. arXiv:2402.00636. Bibcode:2025PNAS..12209736R. doi:10.1073/pnas.2509736122. PMC 12435197. PMID 40911601.
Shimizu, Toshiki; Lungerich, Dominik; Harano, Koji; Nakamura, Eiichi (2022). "Time-Resolved Imaging of Stochastic Cascade Reactions over a Submillisecond to Second Time Range at the Angstrom Level". Journal of the American Chemical Society. 144 (22): 9797–9805. arXiv:2202.13332. Bibcode:2022JAChS.144.9797S. doi:10.1021/jacs.2c02297. PMID 35609254. S2CID 247158917.
Feist, Armin; Bach, Nora; Rubiano da Silva, Nara; Danz, Thomas; Möller, Marcel; Priebe, Katharina E.; Domröse, Till; Gatzmann, J. Gregor; Rost, Stefan; Schauss, Jakob; Strauch, Stefanie; Bormann, Reiner; Sivis, Murat; Schäfer, Sascha; Ropers, Claus (2017-05-01). "Ultrafast Transmission Electron Microscopy Using a Laser-Driven Field Emitter: Femtosecond Resolution with a High Coherence Electron Beam". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 63–73. arXiv:1611.05022. doi:10.1016/j.ultramic.2016.12.005. PMID 28139341. S2CID 31779409.
Hassan, M. Th.; Baskin, J. S.; Liao, B.; Zewail, A. H. (July 2017). "High-temporal-resolution electron microscopy for imaging ultrafast electron dynamics". Nature Photonics. 11 (7): 425–430. arXiv:1704.04246. Bibcode:2017NaPho..11..425H. doi:10.1038/nphoton.2017.79. ISSN 1749-4885.

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"Dr. James Hillier, Biography". comdir.bfree.on.ca. Archived from the original on 2008-06-19. Retrieved 2008-09-09.

books.google.com (Global: 3^rd place; English: 3^rd place)

Plücker, J. (1858). "Über die Einwirkung des Magneten auf die elektrischen Entladungen in verdünnten Gasen" [On the effect of a magnet on the electric discharge in rarified gases]. Poggendorffs Annalen der Physik und Chemie. 103 (1): 88–106. Bibcode:1858AnP...179...88P. doi:10.1002/andp.18581790106.

britannica.com (Global: 40^th place; English: 58^th place)

ultraviolet microscope. (2010). In Encyclopædia Britannica. Retrieved November 20, 2010, from Encyclopædia Britannica Online

cam.ac.uk (Global: 670^th place; English: 480^th place)

repository.cam.ac.uk

Kosasih, Felix Utama; Ducati, Caterina (May 2018). "Characterising degradation of perovskite solar cells through in-situ and operando electron microscopy". Nano Energy. 47: 243–256. Bibcode:2018NEne...47..243K. doi:10.1016/j.nanoen.2018.02.055.

doi.org (Global: 2^nd place; English: 2^nd place)

Ernst Ruska (January 1980). The Early Development of Electron Lenses and Electron Microscopy. Applied Optics. Vol. 25. Translated by T. Mulvey. p. 820. Bibcode:1986ApOpt..25..820R. doi:10.1364/AO.25.000820. ISBN 978-3-7776-0364-3.
Plücker, J. (1858). "Über die Einwirkung des Magneten auf die elektrischen Entladungen in verdünnten Gasen" [On the effect of a magnet on the electric discharge in rarified gases]. Poggendorffs Annalen der Physik und Chemie. 103 (1): 88–106. Bibcode:1858AnP...179...88P. doi:10.1002/andp.18581790106.
Crewe, Albert V; Isaacson, M.; Johnson, D. (1969). "A Simple Scanning Electron Microscope". Rev. Sci. Instrum. 40 (2): 241–246. Bibcode:1969RScI...40..241C. doi:10.1063/1.1683910.
Crewe, Albert V.; Wall, J.; Langmore, J. (1970). "Visibility of a single atom". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. PMID 17731040. S2CID 31952480.
Rose, H H (2008). "Optics of high-performance electron Microscopes". Science and Technology of Advanced Materials. 9 (1) 014107. Bibcode:2008STAdM...9a4107R. doi:10.1088/0031-8949/9/1/014107. PMC 5099802. PMID 27877933.
Pogany, A. P.; Turner, P. S. (1968-01-23). "Reciprocity in electron diffraction and microscopy". Acta Crystallographica Section A. 24 (1): 103–109. Bibcode:1968AcCrA..24..103P. doi:10.1107/S0567739468000136. ISSN 1600-5724.
Hren, John J.; Goldstein, Joseph I.; Joy, David C., eds. (1979). Introduction to Analytical Electron Microscopy. doi:10.1007/978-1-4757-5581-7. ISBN 978-1-4757-5583-1.^{[page needed]}
Faruqi, A.R; Henderson, R. (October 2007). "Electronic detectors for electron microscopy". Current Opinion in Structural Biology. 17 (5): 549–555. doi:10.1016/j.sbi.2007.08.014. PMID 17913494.
Henderson, R.; Cattermole, D.; McMullan, G.; Scotcher, S.; Fordham, M.; Amos, W.B.; Faruqi, A.R. (February 2007). "Digitisation of electron microscope films: Six useful tests applied to three film scanners". Ultramicroscopy. 107 (2–3): 73–80. doi:10.1016/j.ultramic.2006.05.003. PMID 16872749.
Roberts, P. T. E.; Chapman, J. N.; MacLeod, A. M. (1982-01-01). "A CCD-based image recording system for the CTEM". Ultramicroscopy. 8 (4): 385–396. doi:10.1016/0304-3991(82)90061-4. ISSN 0304-3991.
Fan, G. Y.; Ellisman, M. H. (24 December 2001). "Digital imaging in transmission electron microscopy". Journal of Microscopy. 200 (1): 1–13. doi:10.1046/j.1365-2818.2000.00737.x. ISSN 0022-2720. PMID 11012823. S2CID 2034467.
McMullan, G.; Faruqi, A.R.; Henderson, R. (2016). "Direct Electron Detectors". The Resolution Revolution: Recent Advances in cryoEM. Methods in Enzymology. Vol. 579. pp. 1–17. doi:10.1016/bs.mie.2016.05.056. ISBN 978-0-12-805382-9. PMID 27572721.
Faruqi, A.R.; Henderson, R.; Pryddetch, M.; Allport, P.; Evans, A. (October 2006). "Erratum to: "Direct single electron detection with a CMOS detector for electron microscopy"". Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 566 (2): 770. doi:10.1016/j.nima.2006.07.013. ISSN 0168-9002.
Ercius, P.; Caswell, T.; Tate, M.W.; Ercan, A.; Gruner, S.M.; Muller, D. (September 2005). "A Pixel Array Detector for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis. 14 (S2): 806–807. doi:10.1017/s1431927608085711. ISSN 1431-9276. S2CID 137491811.
McMullan, G.; Faruqi, A.R.; Henderson, R.; Guerrini, N.; Turchetta, R.; Jacobs, A.; van Hoften, G. (18 May 2009). "Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector". Ultramicroscopy. 109 (9): 1144–1147. doi:10.1016/j.ultramic.2009.05.005. PMC 2937214. PMID 19541421.
Ruskin, Rachel S.; Yu, Zhiheng; Grigorieff, Nikolaus (1 November 2013). "Quantitative characterization of electron detectors for transmission electron microscopy". Journal of Structural Biology. 184 (3): 385–393. doi:10.1016/j.jsb.2013.10.016. PMC 3876735. PMID 24189638.
Pulokas, James; Green, Carmen; Kisseberth, Nick; Potter, Clinton S.; Carragher, Bridget (1999). "Improving the Positional Accuracy of the Goniometer on the Philips CM Series TEM". Journal of Structural Biology. 128 (3): 250–256. doi:10.1006/jsbi.1999.4181. PMID 10633064.
Buckingham, J (1965). "Thermionic emission properties of a lanthanum hexaboride/rhenium cathode". British Journal of Applied Physics. 16 (12): 1821. Bibcode:1965BJAP...16.1821B. doi:10.1088/0508-3443/16/12/306.
Cowley, J. M.; Moodie, A. F. (1957). "The Scattering of Electrons by Atoms and Crystals. I. A New Theoretical Approach" (PDF). Acta Crystallographica. 199 (3): 609–619. Bibcode:1957AcCry..10..609C. doi:10.1107/S0365110X57002194.
Mast, Jan; Demeestere, Lien (2009). "Electron tomography of negatively stained complex viruses: application in their diagnosis". Diagnostic Pathology. 4: 5. doi:10.1186/1746-1596-4-5. PMC 2649040. PMID 19208223.
Levin, B. D. A.; et al. (2016). "Nanomaterial datasets to advance tomography in scanning transmission electron microscopy". Scientific Data. 3 160041. arXiv:1606.02938. Bibcode:2016NatSD...360041L. doi:10.1038/sdata.2016.41. PMC 4896123. PMID 27272459.
Kawase, Noboru; Kato, Mitsuro; Jinnai, Hiroshi; Jinnai, H (2007). "Transmission electron microtomography without the 'missing wedge' for quantitative structural analysis". Ultramicroscopy. 107 (1): 8–15. doi:10.1016/j.ultramic.2006.04.007. PMID 16730409.
Heidari, Hamed; Van den Broek, Wouter; Bals, Sara (2013). "Quantitative electron tomography: The effect of the three-dimensional point spread function". Ultramicroscopy. 135: 1–5. doi:10.1016/j.ultramic.2013.06.005. hdl:10067/1113970151162165141. PMID 23872036.
Cheville, NF; Stasko J (2014). "Techniques in Electron Microscopy of Animal Tissue". Veterinary Pathology. 51 (1): 28–41. doi:10.1177/0300985813505114. PMID 24114311.
Amzallag, Arnaud; Vaillant, Cédric; Jacob, Mathews; Unser, Michael; Bednar, Jan; Kahn, Jason D.; Dubochet, Jacques; Stasiak, Andrzej; Maddocks, John H. (2006). "3D reconstruction and comparison of shapes of DNA minicircles observed by cryo-electron microscopy". Nucleic Acids Research. 34 (18): e125. doi:10.1093/nar/gkl675. PMC 1635295. PMID 17012274.
Winey, M.; Meehl, J. B.; O'Toole, E. T. & Giddings, T. H. (2014). "Conventional transmission electron microscopy". Molecular Biology of the Cell. 25 (3): 319–323. doi:10.1091/mbc.e12-12-0863. PMC 3907272. PMID 24482357. S2CID 37311577.
Porter, K & Blum, J (1953). "A study in Microtomy for Electron Microscopy". The Anatomical Record. 117 (4): 685–710. doi:10.1002/ar.1091170403. PMID 13124776. S2CID 37311577.
Phillips (1961). "Diamond knife ultra microtomy of metals and the structure of microtomed sections". British Journal of Applied Physics. 12 (10): 554. Bibcode:1961BJAP...12..554P. doi:10.1088/0508-3443/12/10/308.
Thompson, Rebecca F.; Walker, Matt; Siebert, C. Alistair; Muench, Stephen P.; Ranson, Neil A. (2016-05-01). "An introduction to sample preparation and imaging by cryo-electron microscopy for structural biology". Methods. Single Particle Cryo-EM, from sample to reconstruction. 100: 3–15. doi:10.1016/j.ymeth.2016.02.017. ISSN 1046-2023. PMC 4854231. PMID 26931652.
Bean, J. J.; Saito, M.; Fukami, S.; Sato, H.; Ikeda, S.; Ohno, H.; Ikuhara, Y.; Mckenna, K. P. (2017). "Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices". Scientific Reports. 7 45594. Bibcode:2017NatSR...745594B. doi:10.1038/srep45594. ISSN 2045-2322. PMC 5379487. PMID 28374755.
Baram, M. & Kaplan W. D. (2008). "Quantitative HRTEM analysis of FIB prepared specimens". Journal of Microscopy. 232 (3): 395–405. doi:10.1111/j.1365-2818.2008.02134.x. PMID 19094016. S2CID 6487344.
Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.
Nebesářová, Jana; Vancová, Marie (2007). "How to Observe Small Biological Objects in Low-Voltage Electron Microscope". Microscopy and Microanalysis. 13 (3): 248–249. Bibcode:2007MiMic..13S.248N. doi:10.1017/S143192760708124X. S2CID 138891812.
Drummy, Lawrence F.; Yang, Junyan; Martin, David C. (2004). "Low-voltage electron microscopy of polymer and organic molecular thin films". Ultramicroscopy. 99 (4): 247–256. doi:10.1016/j.ultramic.2004.01.011. PMID 15149719.
Honjo G, Kitamura N, Shimaoka K, Mihama K (1956). "Low temperature specimen method for electron diffraction and electron microscopy". Journal of the Physical Society of Japan. 11 (5): 527–536. Bibcode:1956JPSJ...11..527H. doi:10.1143/JPSJ.11.527.
Venables JA (1963). "Liquid helium cooled tilting stage for an electron microscope". Review of Scientific Instruments. 34 (5): 582–583. Bibcode:1963RScI...34..582V. doi:10.1063/1.1718509.
Rennich, Emily; Sung, Suk Hyun; Hovden, Robert; El Baggari, Ismail (9 September 2025). "Ultracold cryogenic TEM with liquid helium and high stability". Proceedings of the National Academy of Sciences of the United States of America. 122 (36) e2509736122. arXiv:2402.00636. Bibcode:2025PNAS..12209736R. doi:10.1073/pnas.2509736122. PMC 12435197. PMID 40911601.
Li, Z; Baker, ML; Jiang, W; Estes, MK; Prasad, BV (2009). "Rotavirus Architecture at Subnanometer Resolution". Journal of Virology. 83 (4): 1754–1766. doi:10.1128/JVI.01855-08. PMC 2643745. PMID 19036817.
M.J. Zachman; et al. (2016). "Site-Specific Preparation of Intact Solid–Liquid Interfaces by Label-Free In Situ Localization and Cryo-Focused Ion Beam Lift-Out". Microscopy and Microanalysis. 22 (6): 1338–1349. Bibcode:2016MiMic..22.1338Z. doi:10.1017/S1431927616011892. PMID 27869059.
Levin, B. D. A.; et al. (2017). "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts". Microscopy and Microanalysis. 23 (1): 155–162. Bibcode:2017MiMic..23..155L. doi:10.1017/S1431927617000058. PMID 28228169. S2CID 6801783.
Rennich E, Sung SH, Agarwal N, Gates M, Kerns R, Hovden R, El Baggari I (September 2025). "Ultracold cryogenic TEM with liquid helium and high stability". Proceedings of the National Academy of Sciences. 122 (36) e2509736122: 122. Bibcode:2025PNAS..12209736R. doi:10.1073/pnas.2509736122. PMC 12435197. PMID 40911601.
Minor AM, Denes P, Muller DA (December 2019). "Cryogenic electron microscopy for quantum science". MRS Bulletin. 44 (12): 961–966. Bibcode:2019MRSBu..44..961M. doi:10.1557/mrs.2019.288.
P.A. Crozier; T.W. Hansen (2014). "In situ and operando transmission electron microscopy of catalytic materials". MRS Bulletin. 40: 38–45. doi:10.1557/mrs.2014.304. hdl:2286/R.I.35693. S2CID 138802942.
Kosasih, Felix Utama; Ducati, Caterina (May 2018). "Characterising degradation of perovskite solar cells through in-situ and operando electron microscopy". Nano Energy. 47: 243–256. Bibcode:2018NEne...47..243K. doi:10.1016/j.nanoen.2018.02.055.
Shimizu, Toshiki; Lungerich, Dominik; Harano, Koji; Nakamura, Eiichi (2022). "Time-Resolved Imaging of Stochastic Cascade Reactions over a Submillisecond to Second Time Range at the Angstrom Level". Journal of the American Chemical Society. 144 (22): 9797–9805. arXiv:2202.13332. Bibcode:2022JAChS.144.9797S. doi:10.1021/jacs.2c02297. PMID 35609254. S2CID 247158917.
de Jonge, N.; Ross, F.M. (2011). "Electron microscopy of specimens in liquid". Nature Nanotechnology. 6 (8): 695–704. Bibcode:2003NatMa...2..532W. doi:10.1038/nmat944. PMID 12872162. S2CID 21379512.
F. M. Ross (2015). "Opportunities and challenges in liquid cell electron microscopy". Science. 350 (6267) aaa9886: 1490–1501. Bibcode:2015Sci...350a9886R. doi:10.1126/science.aaa9886. PMID 26680204.
Haque, M. A. & Saif, M. T. A. (2001). "In-situ tensile testing of nano-scale specimens in SEM and TEM". Experimental Mechanics. 42: 123. doi:10.1007/BF02411059. S2CID 136678366.
Yaguchi, T.; Suzuki, M.; Watabe, A.; Nagakubo, Y.; Ueda, K.; Kamino, T. (2011-03-22). "Development of a high temperature-atmospheric pressure environmental cell for high-resolution TEM". Journal of Electron Microscopy. 60 (3): 217–225. doi:10.1093/jmicro/dfr011. ISSN 0022-0744. PMID 21427119.
Taheri, Mitra L.; Stach, Eric A.; Arslan, Ilke; Crozier, P.A.; Kabius, Bernd C.; LaGrange, Thomas; Minor, Andrew M.; Takeda, Seiji; Tanase, Mihaela; Wagner, Jakob B.; Sharma, Renu (November 2016). "Current status and future directions for in situ transmission electron microscopy". Ultramicroscopy. 170: 86–95. Bibcode:2016Ultmi.170...86T. doi:10.1016/j.ultramic.2016.08.007. PMC 5100813. PMID 27566048.
van Omme, J. Tijn; Zakhozheva, Marina; Spruit, Ronald G.; Sholkina, Mariya; Pérez Garza, H. Hugo (September 2018). "Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability". Ultramicroscopy. 192: 14–20. doi:10.1016/j.ultramic.2018.05.005. PMID 29802911. S2CID 44069323.
Saka, Hiroyasu; Kamino, Takeo; Ara, Shigeo; Sasaki, Katsuhiro (2008-02-01). "In Situ Heating Transmission Electron Microscopy". MRS Bulletin. 33 (2): 93–100. doi:10.1557/mrs2008.21. ISSN 1938-1425. S2CID 136475122.
Zhang, Chao; Firestein, Konstantin L.; Fernando, Joseph F. S.; Siriwardena, Dumindu; Treifeldt, Joel E.; Golberg, Dmitri (2019-09-30). "Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials" (PDF). Advanced Materials. 32 (18) 1904094. doi:10.1002/adma.201904094. ISSN 0935-9648. PMID 31566272. S2CID 203607267.
Picher, Matthieu; Mazzucco, Stefano; Blankenship, Steve; Sharma, Renu (March 2015). "Vibrational and optical spectroscopies integrated with environmental transmission electron microscopy". Ultramicroscopy. 150: 10–15. doi:10.1016/j.ultramic.2014.11.023. PMID 25490533.
Niekiel, Florian; Kraschewski, Simon M.; Müller, Julian; Butz, Benjamin; Spiecker, Erdmann (2017-05-01). "Local temperature measurement in TEM by parallel beam electron diffraction". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 161–169. doi:10.1016/j.ultramic.2016.11.028. ISSN 0304-3991. PMID 28049586.
Vendelbo, S.B.; Kooyman, P.J.; Creemer, J.F.; Morana, B.; Mele, L.; Dona, P.; Nelissen, B.J.; Helveg, S. (October 2013). "Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy". Ultramicroscopy. 133: 72–79. Bibcode:2013IJMSI.133...72V. doi:10.1016/j.ultramic.2013.04.004. PMID 23831940.
Minor, Andrew M.; Dehm, Gerhard (June 2019). "Advances in in situ nanomechanical testing". MRS Bulletin. 44 (6): 438–442. Bibcode:2019MRSBu..44..438M. doi:10.1557/mrs.2019.127. hdl:21.11116/0000-0005-884D-C. S2CID 197631706.
Filleter, Tobin; Beese, Allison M. (2016), "In Situ Transmission Electron Microscopy: Mechanical Testing", in Bhushan, Bharat (ed.), Encyclopedia of Nanotechnology, Dordrecht: Springer Netherlands, pp. 1543–1554, doi:10.1007/978-94-017-9780-1_100990, ISBN 978-94-017-9780-1
Wilsdorf, H. G. F. (April 1958). "Apparatus for the Deformation of Foils in an Electron Microscope". Review of Scientific Instruments. 29 (4): 323–324. Bibcode:1958RScI...29..323W. doi:10.1063/1.1716192.
Castany, P.; Legros, M. (January 2011). "Preparation of H-bar cross-sectional specimen for in situ TEM straining experiments: A FIB-based method applied to a nitrided Ti–6Al–4V alloy". Materials Science and Engineering: A. 528 (3): 1367–1371. doi:10.1016/j.msea.2010.10.025.
Legros, Marc; Cabié, Martiane; Gianola, Daniel S. (March 2009). "In situ deformation of thin films on substrates". Microscopy Research and Technique. 72 (3): 270–283. doi:10.1002/jemt.20680. PMID 19189313. S2CID 10431993.
Kubin, L.P.; Lépinoux, J.; Rabier, J.; Veyssière, P.; Fourdeux, A. (1982). "In situ Plastic Deformation of Metals and Alloys in the 200 kV Electron Microscope". Strength of Metals and Alloys (ICSMA 6). pp. 953–957. doi:10.1016/B978-1-4832-8423-1.50153-X. ISBN 978-1-4832-8423-1.
Pethicai, J. B.; Hutchings, R.; Oliver, W. C. (April 1983). "Hardness measurement at penetration depths as small as 20 nm". Philosophical Magazine A. 48 (4): 593–606. Bibcode:1983PMagA..48..593P. doi:10.1080/01418618308234914.
Minor, A. M.; Morris, J. W.; Stach, E. A. (2001). "Quantitativein situnanoindentation in an electron microscope". Applied Physics Letters. 79 (11): 1625–1627. Bibcode:2001ApPhL..79.1625M. doi:10.1063/1.1400768. OSTI 860719. Retrieved 2023-05-08.
Legros, Marc (February 2014). "In situ mechanical TEM: Seeing and measuring under stress with electrons". Comptes Rendus Physique. 15 (2–3): 224–240. Bibcode:2014CRPhy..15..224L. doi:10.1016/j.crhy.2014.02.002.
Oliver, W. C.; Pharr, G. M. (June 1992). "An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments". Journal of Materials Research. 7 (6): 1564–1583. Bibcode:1992JMatR...7.1564O. doi:10.1557/JMR.1992.1564. S2CID 137098960.
Haque, M. A.; Espinosa, H. D.; Lee, H. J. (May 2010). "MEMS for In Situ Testing—Handling, Actuation, Loading, and Displacement Measurements". MRS Bulletin. 35 (5): 375–381. doi:10.1557/mrs2010.570. S2CID 12455370.
Zhu, Yong; Espinosa, Horacio D. (11 October 2005). "An electromechanical material testing system for in situ electron microscopy and applications". Proceedings of the National Academy of Sciences. 102 (41): 14503–14508. Bibcode:2005PNAS..10214503Z. doi:10.1073/pnas.0506544102. PMC 1253576. PMID 16195381.
Ishida, T; Nakajima, Y; Kakushima, K; Mita, M; Toshiyoshi, H; Fujita, H (1 July 2010). "Design and fabrication of MEMS-controlled probes for studying the nano-interface under in situ TEM observation". Journal of Micromechanics and Microengineering. 20 (7) 075011. Bibcode:2010JMiMi..20g5011I. doi:10.1088/0960-1317/20/7/075011. S2CID 137919989.
Williams, David B.; Carter, C. Barry (1996), Williams, David B.; Carter, C. Barry (eds.), "The Transmission Electron Microscope", Transmission Electron Microscopy: A Textbook for Materials Science, Boston, MA: Springer US, pp. 3–17, doi:10.1007/978-1-4757-2519-3_1, ISBN 978-1-4757-2519-3
Dömer, H.; Bostanjoglo, O. (2003-09-25). "High-speed transmission electron microscope". Review of Scientific Instruments. 74 (10): 4369–4372. Bibcode:2003RScI...74.4369D. doi:10.1063/1.1611612. ISSN 0034-6748.
Oldfield, L. C. (June 1976). "A rotationally symmetric electron beam chopper for picosecond pulses". Journal of Physics E: Scientific Instruments. 9 (6): 455–463. Bibcode:1976JPhE....9..455O. doi:10.1088/0022-3735/9/6/011. ISSN 0022-3735.
Feist, Armin; Bach, Nora; Rubiano da Silva, Nara; Danz, Thomas; Möller, Marcel; Priebe, Katharina E.; Domröse, Till; Gatzmann, J. Gregor; Rost, Stefan; Schauss, Jakob; Strauch, Stefanie; Bormann, Reiner; Sivis, Murat; Schäfer, Sascha; Ropers, Claus (2017-05-01). "Ultrafast Transmission Electron Microscopy Using a Laser-Driven Field Emitter: Femtosecond Resolution with a High Coherence Electron Beam". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 63–73. arXiv:1611.05022. doi:10.1016/j.ultramic.2016.12.005. PMID 28139341. S2CID 31779409.
Hassan, Mohammed T.; Liu, Haihua; Baskin, John Spencer; Zewail, Ahmed H. (2015-10-20). "Photon gating in four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 112 (42): 12944–12949. Bibcode:2015PNAS..11212944H. doi:10.1073/pnas.1517942112. ISSN 0027-8424. PMC 4620897. PMID 26438835.
Hassan, M. Th.; Baskin, J. S.; Liao, B.; Zewail, A. H. (July 2017). "High-temporal-resolution electron microscopy for imaging ultrafast electron dynamics". Nature Photonics. 11 (7): 425–430. arXiv:1704.04246. Bibcode:2017NaPho..11..425H. doi:10.1038/nphoton.2017.79. ISSN 1749-4885.
Campbell, Geoffrey H.; McKeown, Joseph T.; Santala, Melissa K. (2014-11-03). "Time resolved electron microscopy for in situ experiments". Applied Physics Reviews. 1 (4): 041101. Bibcode:2014ApPRv...1d1101C. doi:10.1063/1.4900509. OSTI 1186765.
Zewail, Ahmed H. (9 April 2010). "Four-Dimensional Electron Microscopy". Science. 328 (5975): 187–193. Bibcode:2010Sci...328..187Z. doi:10.1126/science.1166135. PMID 20378810. S2CID 5449372.
Lobatsov, Vladimir A.; Ramesh Srinivasan; Ahmed H. Zewail (2005-05-09). "Four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 102 (20): 7069–7073. Bibcode:2005PNAS..102.7069L. doi:10.1073/pnas.0502607102. PMC 1129142. PMID 15883380.
Browning, N.D.; Bonds, M.A.; Campbell, G.H.; Evans, J.E.; LaGrange, T.; Jungjohann, K.L.; Masiel, D.J.; McKeown, J.; Mehraeen, S.; Reed, B.W.; Santala, M. (February 2012). "Recent developments in dynamic transmission electron microscopy". Current Opinion in Solid State and Materials Science. 16 (1): 23–30. Bibcode:2012COSSM..16...23B. doi:10.1016/j.cossms.2011.07.001.
King, Wayne E.; Geoffrey H. Campbell; Alan Frank; Bryan Reed (2005). "Ultrafast electron microscopy in materials science, biology, and chemistry". Journal of Applied Physics. 97 (11): 111101–111101–27. Bibcode:2005JAP....97k1101K. doi:10.1063/1.1927699.
B. Barwick; D. J. Flannigan; A. H. Zewail (December 2009). "Photon-induced near-field electron microscopy". Nature. 462 (7275): 902–906. Bibcode:2009Natur.462..902B. doi:10.1038/nature08662. PMID 20016598. S2CID 4423704.
Pennycook, S.J.; Varela, M.; Hetherington, C.J.D.; Kirkland, A.I. (2011). "Materials Advances through Aberration-Corrected Electron Microscopy" (PDF). MRS Bulletin. 31 (1): 36–43. Bibcode:2011MRSBu..31...36P. doi:10.1557/mrs2006.4. S2CID 41889433.
Furuya, Kazuo (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Science and Technology of Advanced Materials. 9 (1). 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
Erni R, Rossell MD, Kisielowski C, Dahmen U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9) 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. OSTI 960283. PMID 19392535.
Tanaka, Nobuo (2008). "Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials". Sci. Technol. Adv. Mater. 9 (1) 014111. Bibcode:2008STAdM...9a4111T. doi:10.1088/1468-6996/9/1/014111. PMC 5099806. PMID 27877937.

energy.gov (Global: 2,081^st place; English: 1,387^th place)

science.energy.gov

Scale of Things Chart. Science.energy.gov

escholarship.org (Global: 1,523^rd place; English: 976^th place)

O'Keefe, Michael A.; Shao-Horn, Yang (2004). Imaging lithium atoms at sub-Ångström resolution (Report). Lawrence Berkeley National Laboratory. LBNL-56646.
O'Keefe, Michael A.; Allard, Lawrence F. (18 January 2004). "Sub-Angstrom electron microscopy for sub-Angstrom nano-metrology". OSTI 821768. {{cite journal}}: Cite journal requires |journal= (help)

espacenet.com (Global: 800^th place; English: 676^th place)

v3.espacenet.com

Rudenberg, Reinhold (May 30, 1931). "Configuration for the enlarged imaging of objects by electron beams". Patent DE906737.

fondationlouisdebroglie.org (Global: low place; English: low place)

de Broglie, Louis Victor. "On the Theory of Quanta" (PDF). Foundation of Louis de Broglie (English translation by A.F. Kracklauer, 2004. ed.). Retrieved 25 February 2023.

hal.science (Global: low place; English: low place)

Castany, P.; Legros, M. (January 2011). "Preparation of H-bar cross-sectional specimen for in situ TEM straining experiments: A FIB-based method applied to a nitrided Ti–6Al–4V alloy". Materials Science and Engineering: A. 528 (3): 1367–1371. doi:10.1016/j.msea.2010.10.025.

handle.net (Global: 102^nd place; English: 76^th place)

hdl.handle.net

Heidari, Hamed; Van den Broek, Wouter; Bals, Sara (2013). "Quantitative electron tomography: The effect of the three-dimensional point spread function". Ultramicroscopy. 135: 1–5. doi:10.1016/j.ultramic.2013.06.005. hdl:10067/1113970151162165141. PMID 23872036.
P.A. Crozier; T.W. Hansen (2014). "In situ and operando transmission electron microscopy of catalytic materials". MRS Bulletin. 40: 38–45. doi:10.1557/mrs.2014.304. hdl:2286/R.I.35693. S2CID 138802942.
Minor, Andrew M.; Dehm, Gerhard (June 2019). "Advances in in situ nanomechanical testing". MRS Bulletin. 44 (6): 438–442. Bibcode:2019MRSBu..44..438M. doi:10.1557/mrs.2019.127. hdl:21.11116/0000-0005-884D-C. S2CID 197631706.

harvard.edu (Global: 18^th place; English: 17^th place)

ui.adsabs.harvard.edu

Ernst Ruska (January 1980). The Early Development of Electron Lenses and Electron Microscopy. Applied Optics. Vol. 25. Translated by T. Mulvey. p. 820. Bibcode:1986ApOpt..25..820R. doi:10.1364/AO.25.000820. ISBN 978-3-7776-0364-3.
Plücker, J. (1858). "Über die Einwirkung des Magneten auf die elektrischen Entladungen in verdünnten Gasen" [On the effect of a magnet on the electric discharge in rarified gases]. Poggendorffs Annalen der Physik und Chemie. 103 (1): 88–106. Bibcode:1858AnP...179...88P. doi:10.1002/andp.18581790106.
Crewe, Albert V; Isaacson, M.; Johnson, D. (1969). "A Simple Scanning Electron Microscope". Rev. Sci. Instrum. 40 (2): 241–246. Bibcode:1969RScI...40..241C. doi:10.1063/1.1683910.
Crewe, Albert V.; Wall, J.; Langmore, J. (1970). "Visibility of a single atom". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. PMID 17731040. S2CID 31952480.
Rose, H H (2008). "Optics of high-performance electron Microscopes". Science and Technology of Advanced Materials. 9 (1) 014107. Bibcode:2008STAdM...9a4107R. doi:10.1088/0031-8949/9/1/014107. PMC 5099802. PMID 27877933.
Pogany, A. P.; Turner, P. S. (1968-01-23). "Reciprocity in electron diffraction and microscopy". Acta Crystallographica Section A. 24 (1): 103–109. Bibcode:1968AcCrA..24..103P. doi:10.1107/S0567739468000136. ISSN 1600-5724.
Buckingham, J (1965). "Thermionic emission properties of a lanthanum hexaboride/rhenium cathode". British Journal of Applied Physics. 16 (12): 1821. Bibcode:1965BJAP...16.1821B. doi:10.1088/0508-3443/16/12/306.
Cowley, J. M.; Moodie, A. F. (1957). "The Scattering of Electrons by Atoms and Crystals. I. A New Theoretical Approach" (PDF). Acta Crystallographica. 199 (3): 609–619. Bibcode:1957AcCry..10..609C. doi:10.1107/S0365110X57002194.
Levin, B. D. A.; et al. (2016). "Nanomaterial datasets to advance tomography in scanning transmission electron microscopy". Scientific Data. 3 160041. arXiv:1606.02938. Bibcode:2016NatSD...360041L. doi:10.1038/sdata.2016.41. PMC 4896123. PMID 27272459.
Phillips (1961). "Diamond knife ultra microtomy of metals and the structure of microtomed sections". British Journal of Applied Physics. 12 (10): 554. Bibcode:1961BJAP...12..554P. doi:10.1088/0508-3443/12/10/308.
Bean, J. J.; Saito, M.; Fukami, S.; Sato, H.; Ikeda, S.; Ohno, H.; Ikuhara, Y.; Mckenna, K. P. (2017). "Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices". Scientific Reports. 7 45594. Bibcode:2017NatSR...745594B. doi:10.1038/srep45594. ISSN 2045-2322. PMC 5379487. PMID 28374755.
Nebesářová, Jana; Vancová, Marie (2007). "How to Observe Small Biological Objects in Low-Voltage Electron Microscope". Microscopy and Microanalysis. 13 (3): 248–249. Bibcode:2007MiMic..13S.248N. doi:10.1017/S143192760708124X. S2CID 138891812.
Honjo G, Kitamura N, Shimaoka K, Mihama K (1956). "Low temperature specimen method for electron diffraction and electron microscopy". Journal of the Physical Society of Japan. 11 (5): 527–536. Bibcode:1956JPSJ...11..527H. doi:10.1143/JPSJ.11.527.
Venables JA (1963). "Liquid helium cooled tilting stage for an electron microscope". Review of Scientific Instruments. 34 (5): 582–583. Bibcode:1963RScI...34..582V. doi:10.1063/1.1718509.
Rennich, Emily; Sung, Suk Hyun; Hovden, Robert; El Baggari, Ismail (9 September 2025). "Ultracold cryogenic TEM with liquid helium and high stability". Proceedings of the National Academy of Sciences of the United States of America. 122 (36) e2509736122. arXiv:2402.00636. Bibcode:2025PNAS..12209736R. doi:10.1073/pnas.2509736122. PMC 12435197. PMID 40911601.
M.J. Zachman; et al. (2016). "Site-Specific Preparation of Intact Solid–Liquid Interfaces by Label-Free In Situ Localization and Cryo-Focused Ion Beam Lift-Out". Microscopy and Microanalysis. 22 (6): 1338–1349. Bibcode:2016MiMic..22.1338Z. doi:10.1017/S1431927616011892. PMID 27869059.
Levin, B. D. A.; et al. (2017). "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts". Microscopy and Microanalysis. 23 (1): 155–162. Bibcode:2017MiMic..23..155L. doi:10.1017/S1431927617000058. PMID 28228169. S2CID 6801783.
Rennich E, Sung SH, Agarwal N, Gates M, Kerns R, Hovden R, El Baggari I (September 2025). "Ultracold cryogenic TEM with liquid helium and high stability". Proceedings of the National Academy of Sciences. 122 (36) e2509736122: 122. Bibcode:2025PNAS..12209736R. doi:10.1073/pnas.2509736122. PMC 12435197. PMID 40911601.
Minor AM, Denes P, Muller DA (December 2019). "Cryogenic electron microscopy for quantum science". MRS Bulletin. 44 (12): 961–966. Bibcode:2019MRSBu..44..961M. doi:10.1557/mrs.2019.288.
Kosasih, Felix Utama; Ducati, Caterina (May 2018). "Characterising degradation of perovskite solar cells through in-situ and operando electron microscopy". Nano Energy. 47: 243–256. Bibcode:2018NEne...47..243K. doi:10.1016/j.nanoen.2018.02.055.
Shimizu, Toshiki; Lungerich, Dominik; Harano, Koji; Nakamura, Eiichi (2022). "Time-Resolved Imaging of Stochastic Cascade Reactions over a Submillisecond to Second Time Range at the Angstrom Level". Journal of the American Chemical Society. 144 (22): 9797–9805. arXiv:2202.13332. Bibcode:2022JAChS.144.9797S. doi:10.1021/jacs.2c02297. PMID 35609254. S2CID 247158917.
de Jonge, N.; Ross, F.M. (2011). "Electron microscopy of specimens in liquid". Nature Nanotechnology. 6 (8): 695–704. Bibcode:2003NatMa...2..532W. doi:10.1038/nmat944. PMID 12872162. S2CID 21379512.
F. M. Ross (2015). "Opportunities and challenges in liquid cell electron microscopy". Science. 350 (6267) aaa9886: 1490–1501. Bibcode:2015Sci...350a9886R. doi:10.1126/science.aaa9886. PMID 26680204.
Taheri, Mitra L.; Stach, Eric A.; Arslan, Ilke; Crozier, P.A.; Kabius, Bernd C.; LaGrange, Thomas; Minor, Andrew M.; Takeda, Seiji; Tanase, Mihaela; Wagner, Jakob B.; Sharma, Renu (November 2016). "Current status and future directions for in situ transmission electron microscopy". Ultramicroscopy. 170: 86–95. Bibcode:2016Ultmi.170...86T. doi:10.1016/j.ultramic.2016.08.007. PMC 5100813. PMID 27566048.
Vendelbo, S.B.; Kooyman, P.J.; Creemer, J.F.; Morana, B.; Mele, L.; Dona, P.; Nelissen, B.J.; Helveg, S. (October 2013). "Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy". Ultramicroscopy. 133: 72–79. Bibcode:2013IJMSI.133...72V. doi:10.1016/j.ultramic.2013.04.004. PMID 23831940.
Minor, Andrew M.; Dehm, Gerhard (June 2019). "Advances in in situ nanomechanical testing". MRS Bulletin. 44 (6): 438–442. Bibcode:2019MRSBu..44..438M. doi:10.1557/mrs.2019.127. hdl:21.11116/0000-0005-884D-C. S2CID 197631706.
Wilsdorf, H. G. F. (April 1958). "Apparatus for the Deformation of Foils in an Electron Microscope". Review of Scientific Instruments. 29 (4): 323–324. Bibcode:1958RScI...29..323W. doi:10.1063/1.1716192.
Pethicai, J. B.; Hutchings, R.; Oliver, W. C. (April 1983). "Hardness measurement at penetration depths as small as 20 nm". Philosophical Magazine A. 48 (4): 593–606. Bibcode:1983PMagA..48..593P. doi:10.1080/01418618308234914.
Minor, A. M.; Morris, J. W.; Stach, E. A. (2001). "Quantitativein situnanoindentation in an electron microscope". Applied Physics Letters. 79 (11): 1625–1627. Bibcode:2001ApPhL..79.1625M. doi:10.1063/1.1400768. OSTI 860719. Retrieved 2023-05-08.
Legros, Marc (February 2014). "In situ mechanical TEM: Seeing and measuring under stress with electrons". Comptes Rendus Physique. 15 (2–3): 224–240. Bibcode:2014CRPhy..15..224L. doi:10.1016/j.crhy.2014.02.002.
Oliver, W. C.; Pharr, G. M. (June 1992). "An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments". Journal of Materials Research. 7 (6): 1564–1583. Bibcode:1992JMatR...7.1564O. doi:10.1557/JMR.1992.1564. S2CID 137098960.
Zhu, Yong; Espinosa, Horacio D. (11 October 2005). "An electromechanical material testing system for in situ electron microscopy and applications". Proceedings of the National Academy of Sciences. 102 (41): 14503–14508. Bibcode:2005PNAS..10214503Z. doi:10.1073/pnas.0506544102. PMC 1253576. PMID 16195381.
Ishida, T; Nakajima, Y; Kakushima, K; Mita, M; Toshiyoshi, H; Fujita, H (1 July 2010). "Design and fabrication of MEMS-controlled probes for studying the nano-interface under in situ TEM observation". Journal of Micromechanics and Microengineering. 20 (7) 075011. Bibcode:2010JMiMi..20g5011I. doi:10.1088/0960-1317/20/7/075011. S2CID 137919989.
Dömer, H.; Bostanjoglo, O. (2003-09-25). "High-speed transmission electron microscope". Review of Scientific Instruments. 74 (10): 4369–4372. Bibcode:2003RScI...74.4369D. doi:10.1063/1.1611612. ISSN 0034-6748.
Oldfield, L. C. (June 1976). "A rotationally symmetric electron beam chopper for picosecond pulses". Journal of Physics E: Scientific Instruments. 9 (6): 455–463. Bibcode:1976JPhE....9..455O. doi:10.1088/0022-3735/9/6/011. ISSN 0022-3735.
Hassan, Mohammed T.; Liu, Haihua; Baskin, John Spencer; Zewail, Ahmed H. (2015-10-20). "Photon gating in four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 112 (42): 12944–12949. Bibcode:2015PNAS..11212944H. doi:10.1073/pnas.1517942112. ISSN 0027-8424. PMC 4620897. PMID 26438835.
Hassan, M. Th.; Baskin, J. S.; Liao, B.; Zewail, A. H. (July 2017). "High-temporal-resolution electron microscopy for imaging ultrafast electron dynamics". Nature Photonics. 11 (7): 425–430. arXiv:1704.04246. Bibcode:2017NaPho..11..425H. doi:10.1038/nphoton.2017.79. ISSN 1749-4885.
Campbell, Geoffrey H.; McKeown, Joseph T.; Santala, Melissa K. (2014-11-03). "Time resolved electron microscopy for in situ experiments". Applied Physics Reviews. 1 (4): 041101. Bibcode:2014ApPRv...1d1101C. doi:10.1063/1.4900509. OSTI 1186765.
Zewail, Ahmed H. (9 April 2010). "Four-Dimensional Electron Microscopy". Science. 328 (5975): 187–193. Bibcode:2010Sci...328..187Z. doi:10.1126/science.1166135. PMID 20378810. S2CID 5449372.
Lobatsov, Vladimir A.; Ramesh Srinivasan; Ahmed H. Zewail (2005-05-09). "Four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 102 (20): 7069–7073. Bibcode:2005PNAS..102.7069L. doi:10.1073/pnas.0502607102. PMC 1129142. PMID 15883380.
Browning, N.D.; Bonds, M.A.; Campbell, G.H.; Evans, J.E.; LaGrange, T.; Jungjohann, K.L.; Masiel, D.J.; McKeown, J.; Mehraeen, S.; Reed, B.W.; Santala, M. (February 2012). "Recent developments in dynamic transmission electron microscopy". Current Opinion in Solid State and Materials Science. 16 (1): 23–30. Bibcode:2012COSSM..16...23B. doi:10.1016/j.cossms.2011.07.001.
King, Wayne E.; Geoffrey H. Campbell; Alan Frank; Bryan Reed (2005). "Ultrafast electron microscopy in materials science, biology, and chemistry". Journal of Applied Physics. 97 (11): 111101–111101–27. Bibcode:2005JAP....97k1101K. doi:10.1063/1.1927699.
B. Barwick; D. J. Flannigan; A. H. Zewail (December 2009). "Photon-induced near-field electron microscopy". Nature. 462 (7275): 902–906. Bibcode:2009Natur.462..902B. doi:10.1038/nature08662. PMID 20016598. S2CID 4423704.
Pennycook, S.J.; Varela, M.; Hetherington, C.J.D.; Kirkland, A.I. (2011). "Materials Advances through Aberration-Corrected Electron Microscopy" (PDF). MRS Bulletin. 31 (1): 36–43. Bibcode:2011MRSBu..31...36P. doi:10.1557/mrs2006.4. S2CID 41889433.
Furuya, Kazuo (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Science and Technology of Advanced Materials. 9 (1). 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
Erni R, Rossell MD, Kisielowski C, Dahmen U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9) 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. OSTI 960283. PMID 19392535.
Tanaka, Nobuo (2008). "Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials". Sci. Technol. Adv. Mater. 9 (1) 014111. Bibcode:2008STAdM...9a4111T. doi:10.1088/1468-6996/9/1/014111. PMC 5099806. PMID 27877937.

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Cowley, J. M.; Moodie, A. F. (1957). "The Scattering of Electrons by Atoms and Crystals. I. A New Theoretical Approach" (PDF). Acta Crystallographica. 199 (3): 609–619. Bibcode:1957AcCry..10..609C. doi:10.1107/S0365110X57002194.

lbl.gov (Global: 2,509^th place; English: 2,329^th place)

foundry.lbl.gov

"TEAM 0.5". foundry.lbl.gov. Retrieved 2022-03-15.

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"A Brief History of the Microscopy Society of America". microscopy.org.

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Hassan, M. Th.; Baskin, J. S.; Liao, B.; Zewail, A. H. (July 2017). "High-temporal-resolution electron microscopy for imaging ultrafast electron dynamics". Nature Photonics. 11 (7): 425–430. arXiv:1704.04246. Bibcode:2017NaPho..11..425H. doi:10.1038/nphoton.2017.79. ISSN 1749-4885.
B. Barwick; D. J. Flannigan; A. H. Zewail (December 2009). "Photon-induced near-field electron microscopy". Nature. 462 (7275): 902–906. Bibcode:2009Natur.462..902B. doi:10.1038/nature08662. PMID 20016598. S2CID 4423704.

nih.gov (Global: 4^th place; English: 4^th place)

pubmed.ncbi.nlm.nih.gov

Crewe, Albert V.; Wall, J.; Langmore, J. (1970). "Visibility of a single atom". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. PMID 17731040. S2CID 31952480.
Rose, H H (2008). "Optics of high-performance electron Microscopes". Science and Technology of Advanced Materials. 9 (1) 014107. Bibcode:2008STAdM...9a4107R. doi:10.1088/0031-8949/9/1/014107. PMC 5099802. PMID 27877933.
Faruqi, A.R; Henderson, R. (October 2007). "Electronic detectors for electron microscopy". Current Opinion in Structural Biology. 17 (5): 549–555. doi:10.1016/j.sbi.2007.08.014. PMID 17913494.
Henderson, R.; Cattermole, D.; McMullan, G.; Scotcher, S.; Fordham, M.; Amos, W.B.; Faruqi, A.R. (February 2007). "Digitisation of electron microscope films: Six useful tests applied to three film scanners". Ultramicroscopy. 107 (2–3): 73–80. doi:10.1016/j.ultramic.2006.05.003. PMID 16872749.
Fan, G. Y.; Ellisman, M. H. (24 December 2001). "Digital imaging in transmission electron microscopy". Journal of Microscopy. 200 (1): 1–13. doi:10.1046/j.1365-2818.2000.00737.x. ISSN 0022-2720. PMID 11012823. S2CID 2034467.
McMullan, G.; Faruqi, A.R.; Henderson, R. (2016). "Direct Electron Detectors". The Resolution Revolution: Recent Advances in cryoEM. Methods in Enzymology. Vol. 579. pp. 1–17. doi:10.1016/bs.mie.2016.05.056. ISBN 978-0-12-805382-9. PMID 27572721.
McMullan, G.; Faruqi, A.R.; Henderson, R.; Guerrini, N.; Turchetta, R.; Jacobs, A.; van Hoften, G. (18 May 2009). "Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector". Ultramicroscopy. 109 (9): 1144–1147. doi:10.1016/j.ultramic.2009.05.005. PMC 2937214. PMID 19541421.
Ruskin, Rachel S.; Yu, Zhiheng; Grigorieff, Nikolaus (1 November 2013). "Quantitative characterization of electron detectors for transmission electron microscopy". Journal of Structural Biology. 184 (3): 385–393. doi:10.1016/j.jsb.2013.10.016. PMC 3876735. PMID 24189638.
Pulokas, James; Green, Carmen; Kisseberth, Nick; Potter, Clinton S.; Carragher, Bridget (1999). "Improving the Positional Accuracy of the Goniometer on the Philips CM Series TEM". Journal of Structural Biology. 128 (3): 250–256. doi:10.1006/jsbi.1999.4181. PMID 10633064.
Mast, Jan; Demeestere, Lien (2009). "Electron tomography of negatively stained complex viruses: application in their diagnosis". Diagnostic Pathology. 4: 5. doi:10.1186/1746-1596-4-5. PMC 2649040. PMID 19208223.
Levin, B. D. A.; et al. (2016). "Nanomaterial datasets to advance tomography in scanning transmission electron microscopy". Scientific Data. 3 160041. arXiv:1606.02938. Bibcode:2016NatSD...360041L. doi:10.1038/sdata.2016.41. PMC 4896123. PMID 27272459.
Kawase, Noboru; Kato, Mitsuro; Jinnai, Hiroshi; Jinnai, H (2007). "Transmission electron microtomography without the 'missing wedge' for quantitative structural analysis". Ultramicroscopy. 107 (1): 8–15. doi:10.1016/j.ultramic.2006.04.007. PMID 16730409.
Heidari, Hamed; Van den Broek, Wouter; Bals, Sara (2013). "Quantitative electron tomography: The effect of the three-dimensional point spread function". Ultramicroscopy. 135: 1–5. doi:10.1016/j.ultramic.2013.06.005. hdl:10067/1113970151162165141. PMID 23872036.
Cheville, NF; Stasko J (2014). "Techniques in Electron Microscopy of Animal Tissue". Veterinary Pathology. 51 (1): 28–41. doi:10.1177/0300985813505114. PMID 24114311.
Amzallag, Arnaud; Vaillant, Cédric; Jacob, Mathews; Unser, Michael; Bednar, Jan; Kahn, Jason D.; Dubochet, Jacques; Stasiak, Andrzej; Maddocks, John H. (2006). "3D reconstruction and comparison of shapes of DNA minicircles observed by cryo-electron microscopy". Nucleic Acids Research. 34 (18): e125. doi:10.1093/nar/gkl675. PMC 1635295. PMID 17012274.
Winey, M.; Meehl, J. B.; O'Toole, E. T. & Giddings, T. H. (2014). "Conventional transmission electron microscopy". Molecular Biology of the Cell. 25 (3): 319–323. doi:10.1091/mbc.e12-12-0863. PMC 3907272. PMID 24482357. S2CID 37311577.
Porter, K & Blum, J (1953). "A study in Microtomy for Electron Microscopy". The Anatomical Record. 117 (4): 685–710. doi:10.1002/ar.1091170403. PMID 13124776. S2CID 37311577.
Thompson, Rebecca F.; Walker, Matt; Siebert, C. Alistair; Muench, Stephen P.; Ranson, Neil A. (2016-05-01). "An introduction to sample preparation and imaging by cryo-electron microscopy for structural biology". Methods. Single Particle Cryo-EM, from sample to reconstruction. 100: 3–15. doi:10.1016/j.ymeth.2016.02.017. ISSN 1046-2023. PMC 4854231. PMID 26931652.
Bean, J. J.; Saito, M.; Fukami, S.; Sato, H.; Ikeda, S.; Ohno, H.; Ikuhara, Y.; Mckenna, K. P. (2017). "Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices". Scientific Reports. 7 45594. Bibcode:2017NatSR...745594B. doi:10.1038/srep45594. ISSN 2045-2322. PMC 5379487. PMID 28374755.
Baram, M. & Kaplan W. D. (2008). "Quantitative HRTEM analysis of FIB prepared specimens". Journal of Microscopy. 232 (3): 395–405. doi:10.1111/j.1365-2818.2008.02134.x. PMID 19094016. S2CID 6487344.
Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.
Drummy, Lawrence F.; Yang, Junyan; Martin, David C. (2004). "Low-voltage electron microscopy of polymer and organic molecular thin films". Ultramicroscopy. 99 (4): 247–256. doi:10.1016/j.ultramic.2004.01.011. PMID 15149719.
Rennich, Emily; Sung, Suk Hyun; Hovden, Robert; El Baggari, Ismail (9 September 2025). "Ultracold cryogenic TEM with liquid helium and high stability". Proceedings of the National Academy of Sciences of the United States of America. 122 (36) e2509736122. arXiv:2402.00636. Bibcode:2025PNAS..12209736R. doi:10.1073/pnas.2509736122. PMC 12435197. PMID 40911601.
Li, Z; Baker, ML; Jiang, W; Estes, MK; Prasad, BV (2009). "Rotavirus Architecture at Subnanometer Resolution". Journal of Virology. 83 (4): 1754–1766. doi:10.1128/JVI.01855-08. PMC 2643745. PMID 19036817.
M.J. Zachman; et al. (2016). "Site-Specific Preparation of Intact Solid–Liquid Interfaces by Label-Free In Situ Localization and Cryo-Focused Ion Beam Lift-Out". Microscopy and Microanalysis. 22 (6): 1338–1349. Bibcode:2016MiMic..22.1338Z. doi:10.1017/S1431927616011892. PMID 27869059.
Levin, B. D. A.; et al. (2017). "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts". Microscopy and Microanalysis. 23 (1): 155–162. Bibcode:2017MiMic..23..155L. doi:10.1017/S1431927617000058. PMID 28228169. S2CID 6801783.
Rennich E, Sung SH, Agarwal N, Gates M, Kerns R, Hovden R, El Baggari I (September 2025). "Ultracold cryogenic TEM with liquid helium and high stability". Proceedings of the National Academy of Sciences. 122 (36) e2509736122: 122. Bibcode:2025PNAS..12209736R. doi:10.1073/pnas.2509736122. PMC 12435197. PMID 40911601.
Shimizu, Toshiki; Lungerich, Dominik; Harano, Koji; Nakamura, Eiichi (2022). "Time-Resolved Imaging of Stochastic Cascade Reactions over a Submillisecond to Second Time Range at the Angstrom Level". Journal of the American Chemical Society. 144 (22): 9797–9805. arXiv:2202.13332. Bibcode:2022JAChS.144.9797S. doi:10.1021/jacs.2c02297. PMID 35609254. S2CID 247158917.
de Jonge, N.; Ross, F.M. (2011). "Electron microscopy of specimens in liquid". Nature Nanotechnology. 6 (8): 695–704. Bibcode:2003NatMa...2..532W. doi:10.1038/nmat944. PMID 12872162. S2CID 21379512.
F. M. Ross (2015). "Opportunities and challenges in liquid cell electron microscopy". Science. 350 (6267) aaa9886: 1490–1501. Bibcode:2015Sci...350a9886R. doi:10.1126/science.aaa9886. PMID 26680204.
Yaguchi, T.; Suzuki, M.; Watabe, A.; Nagakubo, Y.; Ueda, K.; Kamino, T. (2011-03-22). "Development of a high temperature-atmospheric pressure environmental cell for high-resolution TEM". Journal of Electron Microscopy. 60 (3): 217–225. doi:10.1093/jmicro/dfr011. ISSN 0022-0744. PMID 21427119.
Taheri, Mitra L.; Stach, Eric A.; Arslan, Ilke; Crozier, P.A.; Kabius, Bernd C.; LaGrange, Thomas; Minor, Andrew M.; Takeda, Seiji; Tanase, Mihaela; Wagner, Jakob B.; Sharma, Renu (November 2016). "Current status and future directions for in situ transmission electron microscopy". Ultramicroscopy. 170: 86–95. Bibcode:2016Ultmi.170...86T. doi:10.1016/j.ultramic.2016.08.007. PMC 5100813. PMID 27566048.
van Omme, J. Tijn; Zakhozheva, Marina; Spruit, Ronald G.; Sholkina, Mariya; Pérez Garza, H. Hugo (September 2018). "Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability". Ultramicroscopy. 192: 14–20. doi:10.1016/j.ultramic.2018.05.005. PMID 29802911. S2CID 44069323.
Zhang, Chao; Firestein, Konstantin L.; Fernando, Joseph F. S.; Siriwardena, Dumindu; Treifeldt, Joel E.; Golberg, Dmitri (2019-09-30). "Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials" (PDF). Advanced Materials. 32 (18) 1904094. doi:10.1002/adma.201904094. ISSN 0935-9648. PMID 31566272. S2CID 203607267.
Picher, Matthieu; Mazzucco, Stefano; Blankenship, Steve; Sharma, Renu (March 2015). "Vibrational and optical spectroscopies integrated with environmental transmission electron microscopy". Ultramicroscopy. 150: 10–15. doi:10.1016/j.ultramic.2014.11.023. PMID 25490533.
Niekiel, Florian; Kraschewski, Simon M.; Müller, Julian; Butz, Benjamin; Spiecker, Erdmann (2017-05-01). "Local temperature measurement in TEM by parallel beam electron diffraction". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 161–169. doi:10.1016/j.ultramic.2016.11.028. ISSN 0304-3991. PMID 28049586.
Vendelbo, S.B.; Kooyman, P.J.; Creemer, J.F.; Morana, B.; Mele, L.; Dona, P.; Nelissen, B.J.; Helveg, S. (October 2013). "Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy". Ultramicroscopy. 133: 72–79. Bibcode:2013IJMSI.133...72V. doi:10.1016/j.ultramic.2013.04.004. PMID 23831940.
Legros, Marc; Cabié, Martiane; Gianola, Daniel S. (March 2009). "In situ deformation of thin films on substrates". Microscopy Research and Technique. 72 (3): 270–283. doi:10.1002/jemt.20680. PMID 19189313. S2CID 10431993.
Zhu, Yong; Espinosa, Horacio D. (11 October 2005). "An electromechanical material testing system for in situ electron microscopy and applications". Proceedings of the National Academy of Sciences. 102 (41): 14503–14508. Bibcode:2005PNAS..10214503Z. doi:10.1073/pnas.0506544102. PMC 1253576. PMID 16195381.
Feist, Armin; Bach, Nora; Rubiano da Silva, Nara; Danz, Thomas; Möller, Marcel; Priebe, Katharina E.; Domröse, Till; Gatzmann, J. Gregor; Rost, Stefan; Schauss, Jakob; Strauch, Stefanie; Bormann, Reiner; Sivis, Murat; Schäfer, Sascha; Ropers, Claus (2017-05-01). "Ultrafast Transmission Electron Microscopy Using a Laser-Driven Field Emitter: Femtosecond Resolution with a High Coherence Electron Beam". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 63–73. arXiv:1611.05022. doi:10.1016/j.ultramic.2016.12.005. PMID 28139341. S2CID 31779409.
Hassan, Mohammed T.; Liu, Haihua; Baskin, John Spencer; Zewail, Ahmed H. (2015-10-20). "Photon gating in four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 112 (42): 12944–12949. Bibcode:2015PNAS..11212944H. doi:10.1073/pnas.1517942112. ISSN 0027-8424. PMC 4620897. PMID 26438835.
Zewail, Ahmed H. (9 April 2010). "Four-Dimensional Electron Microscopy". Science. 328 (5975): 187–193. Bibcode:2010Sci...328..187Z. doi:10.1126/science.1166135. PMID 20378810. S2CID 5449372.
Lobatsov, Vladimir A.; Ramesh Srinivasan; Ahmed H. Zewail (2005-05-09). "Four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 102 (20): 7069–7073. Bibcode:2005PNAS..102.7069L. doi:10.1073/pnas.0502607102. PMC 1129142. PMID 15883380.
B. Barwick; D. J. Flannigan; A. H. Zewail (December 2009). "Photon-induced near-field electron microscopy". Nature. 462 (7275): 902–906. Bibcode:2009Natur.462..902B. doi:10.1038/nature08662. PMID 20016598. S2CID 4423704.
Furuya, Kazuo (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Science and Technology of Advanced Materials. 9 (1). 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
Erni R, Rossell MD, Kisielowski C, Dahmen U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9) 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. OSTI 960283. PMID 19392535.
Tanaka, Nobuo (2008). "Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials". Sci. Technol. Adv. Mater. 9 (1) 014111. Bibcode:2008STAdM...9a4111T. doi:10.1088/1468-6996/9/1/014111. PMC 5099806. PMID 27877937.

ncbi.nlm.nih.gov

Rose, H H (2008). "Optics of high-performance electron Microscopes". Science and Technology of Advanced Materials. 9 (1) 014107. Bibcode:2008STAdM...9a4107R. doi:10.1088/0031-8949/9/1/014107. PMC 5099802. PMID 27877933.
McMullan, G.; Faruqi, A.R.; Henderson, R.; Guerrini, N.; Turchetta, R.; Jacobs, A.; van Hoften, G. (18 May 2009). "Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector". Ultramicroscopy. 109 (9): 1144–1147. doi:10.1016/j.ultramic.2009.05.005. PMC 2937214. PMID 19541421.
Ruskin, Rachel S.; Yu, Zhiheng; Grigorieff, Nikolaus (1 November 2013). "Quantitative characterization of electron detectors for transmission electron microscopy". Journal of Structural Biology. 184 (3): 385–393. doi:10.1016/j.jsb.2013.10.016. PMC 3876735. PMID 24189638.
Mast, Jan; Demeestere, Lien (2009). "Electron tomography of negatively stained complex viruses: application in their diagnosis". Diagnostic Pathology. 4: 5. doi:10.1186/1746-1596-4-5. PMC 2649040. PMID 19208223.
Levin, B. D. A.; et al. (2016). "Nanomaterial datasets to advance tomography in scanning transmission electron microscopy". Scientific Data. 3 160041. arXiv:1606.02938. Bibcode:2016NatSD...360041L. doi:10.1038/sdata.2016.41. PMC 4896123. PMID 27272459.
Amzallag, Arnaud; Vaillant, Cédric; Jacob, Mathews; Unser, Michael; Bednar, Jan; Kahn, Jason D.; Dubochet, Jacques; Stasiak, Andrzej; Maddocks, John H. (2006). "3D reconstruction and comparison of shapes of DNA minicircles observed by cryo-electron microscopy". Nucleic Acids Research. 34 (18): e125. doi:10.1093/nar/gkl675. PMC 1635295. PMID 17012274.
Winey, M.; Meehl, J. B.; O'Toole, E. T. & Giddings, T. H. (2014). "Conventional transmission electron microscopy". Molecular Biology of the Cell. 25 (3): 319–323. doi:10.1091/mbc.e12-12-0863. PMC 3907272. PMID 24482357. S2CID 37311577.
Thompson, Rebecca F.; Walker, Matt; Siebert, C. Alistair; Muench, Stephen P.; Ranson, Neil A. (2016-05-01). "An introduction to sample preparation and imaging by cryo-electron microscopy for structural biology". Methods. Single Particle Cryo-EM, from sample to reconstruction. 100: 3–15. doi:10.1016/j.ymeth.2016.02.017. ISSN 1046-2023. PMC 4854231. PMID 26931652.
Bean, J. J.; Saito, M.; Fukami, S.; Sato, H.; Ikeda, S.; Ohno, H.; Ikuhara, Y.; Mckenna, K. P. (2017). "Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices". Scientific Reports. 7 45594. Bibcode:2017NatSR...745594B. doi:10.1038/srep45594. ISSN 2045-2322. PMC 5379487. PMID 28374755.
Rennich, Emily; Sung, Suk Hyun; Hovden, Robert; El Baggari, Ismail (9 September 2025). "Ultracold cryogenic TEM with liquid helium and high stability". Proceedings of the National Academy of Sciences of the United States of America. 122 (36) e2509736122. arXiv:2402.00636. Bibcode:2025PNAS..12209736R. doi:10.1073/pnas.2509736122. PMC 12435197. PMID 40911601.
Li, Z; Baker, ML; Jiang, W; Estes, MK; Prasad, BV (2009). "Rotavirus Architecture at Subnanometer Resolution". Journal of Virology. 83 (4): 1754–1766. doi:10.1128/JVI.01855-08. PMC 2643745. PMID 19036817.
Rennich E, Sung SH, Agarwal N, Gates M, Kerns R, Hovden R, El Baggari I (September 2025). "Ultracold cryogenic TEM with liquid helium and high stability". Proceedings of the National Academy of Sciences. 122 (36) e2509736122: 122. Bibcode:2025PNAS..12209736R. doi:10.1073/pnas.2509736122. PMC 12435197. PMID 40911601.
Taheri, Mitra L.; Stach, Eric A.; Arslan, Ilke; Crozier, P.A.; Kabius, Bernd C.; LaGrange, Thomas; Minor, Andrew M.; Takeda, Seiji; Tanase, Mihaela; Wagner, Jakob B.; Sharma, Renu (November 2016). "Current status and future directions for in situ transmission electron microscopy". Ultramicroscopy. 170: 86–95. Bibcode:2016Ultmi.170...86T. doi:10.1016/j.ultramic.2016.08.007. PMC 5100813. PMID 27566048.
Zhu, Yong; Espinosa, Horacio D. (11 October 2005). "An electromechanical material testing system for in situ electron microscopy and applications". Proceedings of the National Academy of Sciences. 102 (41): 14503–14508. Bibcode:2005PNAS..10214503Z. doi:10.1073/pnas.0506544102. PMC 1253576. PMID 16195381.
Hassan, Mohammed T.; Liu, Haihua; Baskin, John Spencer; Zewail, Ahmed H. (2015-10-20). "Photon gating in four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 112 (42): 12944–12949. Bibcode:2015PNAS..11212944H. doi:10.1073/pnas.1517942112. ISSN 0027-8424. PMC 4620897. PMID 26438835.
Lobatsov, Vladimir A.; Ramesh Srinivasan; Ahmed H. Zewail (2005-05-09). "Four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 102 (20): 7069–7073. Bibcode:2005PNAS..102.7069L. doi:10.1073/pnas.0502607102. PMC 1129142. PMID 15883380.
Furuya, Kazuo (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Science and Technology of Advanced Materials. 9 (1). 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
Tanaka, Nobuo (2008). "Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials". Sci. Technol. Adv. Mater. 9 (1) 014111. Bibcode:2008STAdM...9a4111T. doi:10.1088/1468-6996/9/1/014111. PMC 5099806. PMID 27877937.

nobelprize.org (Global: 301^st place; English: 478^th place)

"The Nobel Prize in Physics 1986, Perspectives – Life through a Lens". nobelprize.org.
"Ferdinand Braun, The Nobel Prize in Physics 1909, Biography". nobelprize.org.
"Ernst Ruska, Nobel Prize Lecture". nobelprize.org.

osti.gov (Global: 2,036^th place; English: 1,254^th place)

Minor, A. M.; Morris, J. W.; Stach, E. A. (2001). "Quantitativein situnanoindentation in an electron microscope". Applied Physics Letters. 79 (11): 1625–1627. Bibcode:2001ApPhL..79.1625M. doi:10.1063/1.1400768. OSTI 860719. Retrieved 2023-05-08.
Campbell, Geoffrey H.; McKeown, Joseph T.; Santala, Melissa K. (2014-11-03). "Time resolved electron microscopy for in situ experiments". Applied Physics Reviews. 1 (4): 041101. Bibcode:2014ApPRv...1d1101C. doi:10.1063/1.4900509. OSTI 1186765.
Erni R, Rossell MD, Kisielowski C, Dahmen U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9) 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. OSTI 960283. PMID 19392535.
O'Keefe, Michael A.; Allard, Lawrence F. (18 January 2004). "Sub-Angstrom electron microscopy for sub-Angstrom nano-metrology". OSTI 821768. {{cite journal}}: Cite journal requires |journal= (help)

pdx.edu (Global: 8,132^nd place; English: 5,327^th place)

web.pdx.edu

Pennycook, S.J.; Varela, M.; Hetherington, C.J.D.; Kirkland, A.I. (2011). "Materials Advances through Aberration-Corrected Electron Microscopy" (PDF). MRS Bulletin. 31 (1): 36–43. Bibcode:2011MRSBu..31...36P. doi:10.1557/mrs2006.4. S2CID 41889433.

proquest.com (Global: 206^th place; English: 124^th place)

Bataineh, Khaled (2005). Development of precision TEM holder assemblies for use in extreme environments (Thesis). ProQuest 305444239.

qut.edu.au (Global: 8,570^th place; English: 5,097^th place)

eprints.qut.edu.au

Zhang, Chao; Firestein, Konstantin L.; Fernando, Joseph F. S.; Siriwardena, Dumindu; Treifeldt, Joel E.; Golberg, Dmitri (2019-09-30). "Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials" (PDF). Advanced Materials. 32 (18) 1904094. doi:10.1002/adma.201904094. ISSN 0935-9648. PMID 31566272. S2CID 203607267.

rcn.com (Global: low place; English: low place)

users.rcn.com

"Viruses". users.rcn.com.

researchgate.net (Global: 120^th place; English: 125^th place)

Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.

rodenburg.org (Global: low place; English: low place)

"The objective lens of a TEM, the heart of the electron microscope". rodenburg.org.
Rodenburg, J M. "The Vacuum System". rodenburg.org.

semanticscholar.org (Global: 11^th place; English: 8^th place)

api.semanticscholar.org

Crewe, Albert V.; Wall, J.; Langmore, J. (1970). "Visibility of a single atom". Science. 168 (3937): 1338–1340. Bibcode:1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. PMID 17731040. S2CID 31952480.
Fan, G. Y.; Ellisman, M. H. (24 December 2001). "Digital imaging in transmission electron microscopy". Journal of Microscopy. 200 (1): 1–13. doi:10.1046/j.1365-2818.2000.00737.x. ISSN 0022-2720. PMID 11012823. S2CID 2034467.
Ercius, P.; Caswell, T.; Tate, M.W.; Ercan, A.; Gruner, S.M.; Muller, D. (September 2005). "A Pixel Array Detector for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis. 14 (S2): 806–807. doi:10.1017/s1431927608085711. ISSN 1431-9276. S2CID 137491811.
Winey, M.; Meehl, J. B.; O'Toole, E. T. & Giddings, T. H. (2014). "Conventional transmission electron microscopy". Molecular Biology of the Cell. 25 (3): 319–323. doi:10.1091/mbc.e12-12-0863. PMC 3907272. PMID 24482357. S2CID 37311577.
Porter, K & Blum, J (1953). "A study in Microtomy for Electron Microscopy". The Anatomical Record. 117 (4): 685–710. doi:10.1002/ar.1091170403. PMID 13124776. S2CID 37311577.
Baram, M. & Kaplan W. D. (2008). "Quantitative HRTEM analysis of FIB prepared specimens". Journal of Microscopy. 232 (3): 395–405. doi:10.1111/j.1365-2818.2008.02134.x. PMID 19094016. S2CID 6487344.
Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.
Nebesářová, Jana; Vancová, Marie (2007). "How to Observe Small Biological Objects in Low-Voltage Electron Microscope". Microscopy and Microanalysis. 13 (3): 248–249. Bibcode:2007MiMic..13S.248N. doi:10.1017/S143192760708124X. S2CID 138891812.
Levin, B. D. A.; et al. (2017). "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts". Microscopy and Microanalysis. 23 (1): 155–162. Bibcode:2017MiMic..23..155L. doi:10.1017/S1431927617000058. PMID 28228169. S2CID 6801783.
P.A. Crozier; T.W. Hansen (2014). "In situ and operando transmission electron microscopy of catalytic materials". MRS Bulletin. 40: 38–45. doi:10.1557/mrs.2014.304. hdl:2286/R.I.35693. S2CID 138802942.
Shimizu, Toshiki; Lungerich, Dominik; Harano, Koji; Nakamura, Eiichi (2022). "Time-Resolved Imaging of Stochastic Cascade Reactions over a Submillisecond to Second Time Range at the Angstrom Level". Journal of the American Chemical Society. 144 (22): 9797–9805. arXiv:2202.13332. Bibcode:2022JAChS.144.9797S. doi:10.1021/jacs.2c02297. PMID 35609254. S2CID 247158917.
de Jonge, N.; Ross, F.M. (2011). "Electron microscopy of specimens in liquid". Nature Nanotechnology. 6 (8): 695–704. Bibcode:2003NatMa...2..532W. doi:10.1038/nmat944. PMID 12872162. S2CID 21379512.
Haque, M. A. & Saif, M. T. A. (2001). "In-situ tensile testing of nano-scale specimens in SEM and TEM". Experimental Mechanics. 42: 123. doi:10.1007/BF02411059. S2CID 136678366.
van Omme, J. Tijn; Zakhozheva, Marina; Spruit, Ronald G.; Sholkina, Mariya; Pérez Garza, H. Hugo (September 2018). "Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability". Ultramicroscopy. 192: 14–20. doi:10.1016/j.ultramic.2018.05.005. PMID 29802911. S2CID 44069323.
Saka, Hiroyasu; Kamino, Takeo; Ara, Shigeo; Sasaki, Katsuhiro (2008-02-01). "In Situ Heating Transmission Electron Microscopy". MRS Bulletin. 33 (2): 93–100. doi:10.1557/mrs2008.21. ISSN 1938-1425. S2CID 136475122.
Zhang, Chao; Firestein, Konstantin L.; Fernando, Joseph F. S.; Siriwardena, Dumindu; Treifeldt, Joel E.; Golberg, Dmitri (2019-09-30). "Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials" (PDF). Advanced Materials. 32 (18) 1904094. doi:10.1002/adma.201904094. ISSN 0935-9648. PMID 31566272. S2CID 203607267.
Minor, Andrew M.; Dehm, Gerhard (June 2019). "Advances in in situ nanomechanical testing". MRS Bulletin. 44 (6): 438–442. Bibcode:2019MRSBu..44..438M. doi:10.1557/mrs.2019.127. hdl:21.11116/0000-0005-884D-C. S2CID 197631706.
Legros, Marc; Cabié, Martiane; Gianola, Daniel S. (March 2009). "In situ deformation of thin films on substrates". Microscopy Research and Technique. 72 (3): 270–283. doi:10.1002/jemt.20680. PMID 19189313. S2CID 10431993.
Oliver, W. C.; Pharr, G. M. (June 1992). "An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments". Journal of Materials Research. 7 (6): 1564–1583. Bibcode:1992JMatR...7.1564O. doi:10.1557/JMR.1992.1564. S2CID 137098960.
Haque, M. A.; Espinosa, H. D.; Lee, H. J. (May 2010). "MEMS for In Situ Testing—Handling, Actuation, Loading, and Displacement Measurements". MRS Bulletin. 35 (5): 375–381. doi:10.1557/mrs2010.570. S2CID 12455370.
Ishida, T; Nakajima, Y; Kakushima, K; Mita, M; Toshiyoshi, H; Fujita, H (1 July 2010). "Design and fabrication of MEMS-controlled probes for studying the nano-interface under in situ TEM observation". Journal of Micromechanics and Microengineering. 20 (7) 075011. Bibcode:2010JMiMi..20g5011I. doi:10.1088/0960-1317/20/7/075011. S2CID 137919989.
Feist, Armin; Bach, Nora; Rubiano da Silva, Nara; Danz, Thomas; Möller, Marcel; Priebe, Katharina E.; Domröse, Till; Gatzmann, J. Gregor; Rost, Stefan; Schauss, Jakob; Strauch, Stefanie; Bormann, Reiner; Sivis, Murat; Schäfer, Sascha; Ropers, Claus (2017-05-01). "Ultrafast Transmission Electron Microscopy Using a Laser-Driven Field Emitter: Femtosecond Resolution with a High Coherence Electron Beam". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 63–73. arXiv:1611.05022. doi:10.1016/j.ultramic.2016.12.005. PMID 28139341. S2CID 31779409.
Zewail, Ahmed H. (9 April 2010). "Four-Dimensional Electron Microscopy". Science. 328 (5975): 187–193. Bibcode:2010Sci...328..187Z. doi:10.1126/science.1166135. PMID 20378810. S2CID 5449372.
B. Barwick; D. J. Flannigan; A. H. Zewail (December 2009). "Photon-induced near-field electron microscopy". Nature. 462 (7275): 902–906. Bibcode:2009Natur.462..902B. doi:10.1038/nature08662. PMID 20016598. S2CID 4423704.
Pennycook, S.J.; Varela, M.; Hetherington, C.J.D.; Kirkland, A.I. (2011). "Materials Advances through Aberration-Corrected Electron Microscopy" (PDF). MRS Bulletin. 31 (1): 36–43. Bibcode:2011MRSBu..31...36P. doi:10.1557/mrs2006.4. S2CID 41889433.

unibas.ch (Global: low place; English: low place)

2dx.unibas.ch

Stahlberg, Henning (September 6, 2012). "Contrast Transfer Functions". 2dx.unibas.ch.

unt.edu (Global: 1,336^th place; English: 769^th place)

digital.library.unt.edu

Crewe, Albert V; Isaacson, M.; Johnson, D. (1969). "A Simple Scanning Electron Microscope". Rev. Sci. Instrum. 40 (2): 241–246. Bibcode:1969RScI...40..241C. doi:10.1063/1.1683910.
Browning, N.D.; Bonds, M.A.; Campbell, G.H.; Evans, J.E.; LaGrange, T.; Jungjohann, K.L.; Masiel, D.J.; McKeown, J.; Mehraeen, S.; Reed, B.W.; Santala, M. (February 2012). "Recent developments in dynamic transmission electron microscopy". Current Opinion in Solid State and Materials Science. 16 (1): 23–30. Bibcode:2012COSSM..16...23B. doi:10.1016/j.cossms.2011.07.001.
Erni R, Rossell MD, Kisielowski C, Dahmen U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9) 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. OSTI 960283. PMID 19392535.

web.archive.org (Global: 1^st place; English: 1^st place)

"Dr. James Hillier, Biography". comdir.bfree.on.ca. Archived from the original on 2008-06-19. Retrieved 2008-09-09.

worldcat.org (Global: 5^th place; English: 5^th place)

search.worldcat.org

Pogany, A. P.; Turner, P. S. (1968-01-23). "Reciprocity in electron diffraction and microscopy". Acta Crystallographica Section A. 24 (1): 103–109. Bibcode:1968AcCrA..24..103P. doi:10.1107/S0567739468000136. ISSN 1600-5724.
Roberts, P. T. E.; Chapman, J. N.; MacLeod, A. M. (1982-01-01). "A CCD-based image recording system for the CTEM". Ultramicroscopy. 8 (4): 385–396. doi:10.1016/0304-3991(82)90061-4. ISSN 0304-3991.
Fan, G. Y.; Ellisman, M. H. (24 December 2001). "Digital imaging in transmission electron microscopy". Journal of Microscopy. 200 (1): 1–13. doi:10.1046/j.1365-2818.2000.00737.x. ISSN 0022-2720. PMID 11012823. S2CID 2034467.
Faruqi, A.R.; Henderson, R.; Pryddetch, M.; Allport, P.; Evans, A. (October 2006). "Erratum to: "Direct single electron detection with a CMOS detector for electron microscopy"". Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 566 (2): 770. doi:10.1016/j.nima.2006.07.013. ISSN 0168-9002.
Ercius, P.; Caswell, T.; Tate, M.W.; Ercan, A.; Gruner, S.M.; Muller, D. (September 2005). "A Pixel Array Detector for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis. 14 (S2): 806–807. doi:10.1017/s1431927608085711. ISSN 1431-9276. S2CID 137491811.
Dykstra, Michael J.; Reuss, Laura E. (2003). Biological Electron Microscopy: Theory, Techniques and Troubleshooting (2nd ed.). New York: Kluwer Academic. ISBN 978-0-306-47749-2. OCLC 52239274.^{[page needed]}
Thompson, Rebecca F.; Walker, Matt; Siebert, C. Alistair; Muench, Stephen P.; Ranson, Neil A. (2016-05-01). "An introduction to sample preparation and imaging by cryo-electron microscopy for structural biology". Methods. Single Particle Cryo-EM, from sample to reconstruction. 100: 3–15. doi:10.1016/j.ymeth.2016.02.017. ISSN 1046-2023. PMC 4854231. PMID 26931652.
Bean, J. J.; Saito, M.; Fukami, S.; Sato, H.; Ikeda, S.; Ohno, H.; Ikuhara, Y.; Mckenna, K. P. (2017). "Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices". Scientific Reports. 7 45594. Bibcode:2017NatSR...745594B. doi:10.1038/srep45594. ISSN 2045-2322. PMC 5379487. PMID 28374755.
Yaguchi, T.; Suzuki, M.; Watabe, A.; Nagakubo, Y.; Ueda, K.; Kamino, T. (2011-03-22). "Development of a high temperature-atmospheric pressure environmental cell for high-resolution TEM". Journal of Electron Microscopy. 60 (3): 217–225. doi:10.1093/jmicro/dfr011. ISSN 0022-0744. PMID 21427119.
Saka, Hiroyasu; Kamino, Takeo; Ara, Shigeo; Sasaki, Katsuhiro (2008-02-01). "In Situ Heating Transmission Electron Microscopy". MRS Bulletin. 33 (2): 93–100. doi:10.1557/mrs2008.21. ISSN 1938-1425. S2CID 136475122.
Zhang, Chao; Firestein, Konstantin L.; Fernando, Joseph F. S.; Siriwardena, Dumindu; Treifeldt, Joel E.; Golberg, Dmitri (2019-09-30). "Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials" (PDF). Advanced Materials. 32 (18) 1904094. doi:10.1002/adma.201904094. ISSN 0935-9648. PMID 31566272. S2CID 203607267.
Niekiel, Florian; Kraschewski, Simon M.; Müller, Julian; Butz, Benjamin; Spiecker, Erdmann (2017-05-01). "Local temperature measurement in TEM by parallel beam electron diffraction". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy. 176: 161–169. doi:10.1016/j.ultramic.2016.11.028. ISSN 0304-3991. PMID 28049586.
Dömer, H.; Bostanjoglo, O. (2003-09-25). "High-speed transmission electron microscope". Review of Scientific Instruments. 74 (10): 4369–4372. Bibcode:2003RScI...74.4369D. doi:10.1063/1.1611612. ISSN 0034-6748.
Oldfield, L. C. (June 1976). "A rotationally symmetric electron beam chopper for picosecond pulses". Journal of Physics E: Scientific Instruments. 9 (6): 455–463. Bibcode:1976JPhE....9..455O. doi:10.1088/0022-3735/9/6/011. ISSN 0022-3735.
Hassan, Mohammed T.; Liu, Haihua; Baskin, John Spencer; Zewail, Ahmed H. (2015-10-20). "Photon gating in four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences. 112 (42): 12944–12949. Bibcode:2015PNAS..11212944H. doi:10.1073/pnas.1517942112. ISSN 0027-8424. PMC 4620897. PMID 26438835.
Hassan, M. Th.; Baskin, J. S.; Liao, B.; Zewail, A. H. (July 2017). "High-temporal-resolution electron microscopy for imaging ultrafast electron dynamics". Nature Photonics. 11 (7): 425–430. arXiv:1704.04246. Bibcode:2017NaPho..11..425H. doi:10.1038/nphoton.2017.79. ISSN 1749-4885.

zenodo.org (Global: 621^st place; English: 380^th place)

Levin, B. D. A.; et al. (2017). "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts". Microscopy and Microanalysis. 23 (1): 155–162. Bibcode:2017MiMic..23..155L. doi:10.1017/S1431927617000058. PMID 28228169. S2CID 6801783.
F. M. Ross (2015). "Opportunities and challenges in liquid cell electron microscopy". Science. 350 (6267) aaa9886: 1490–1501. Bibcode:2015Sci...350a9886R. doi:10.1126/science.aaa9886. PMID 26680204.

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