Wafer testing (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Wafer testing" in English language version.

refsWebsite

Global rank English rank

low place

low place

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3,635^th place

1books.google.com

3^rd place

3^rd place

books.google.com

Design for Manufacturability And Statistical Design: A Constructive Approach, by Michael Orshansky, Sani Nassif, Duane Boning 2007. ISBN 0-387-30928-4 ISBN 978-0-387-30928-6 [1] p. 84

computer.org

www2.computer.org

"Testing LCD Source Driver IC with Built-on-Scribe-Line Test Circuitry" (abstract)

eetasia.com

"Startup enables IC variability characterization" by Richard Goering 2006