White light scanner (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "White light scanner" in English language version.

refsWebsite

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4doi.org

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3harvard.edu

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3nih.gov

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1arizona.edu

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1handle.net

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1azom.com

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1pan.pl

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1caltech.edu

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1semanticscholar.org

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1zebraoptical.com

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1novacam.com

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arizona.edu

optics.arizona.edu

Harasaki, A.; Schmit, J.; Wyant, J. C. (2000). "Improved vertical-scanning interferometry" (PDF). Applied Optics. 39 (13): 2107–2115. Bibcode:2000ApOpt..39.2107H. doi:10.1364/AO.39.002107. hdl:10150/289148. PMID 18345114. Retrieved 21 May 2012.

azom.com

"HDVSI - Introducing High Definition Vertical Scanning Interferometry for Nanotechnology Research from Veeco Instruments". Veeco. Retrieved 21 May 2012.

caltech.edu

authors.library.caltech.edu

Yang, C.-H.; Wax, A; Dasari, R.R.; Feld, M.S. (2002). "2π ambiguity-free optical distance measurement with subnanometer precision with a novel phase-crossing low-coherence interferometer" (PDF). Optics Letters. 27 (2): 77–79. Bibcode:2002OptL...27...77Y. doi:10.1364/OL.27.000077. PMID 18007717. S2CID 9524638.

doi.org

Schmit, J.; Creath, K.; Wyant, J. C. (2007). "Surface Profilers, Multiple Wavelength, and White Light Intereferometry". Optical Shop Testing. p. 667. doi:10.1002/9780470135976.ch15. ISBN 9780470135976.
Harasaki, A.; Schmit, J.; Wyant, J. C. (2000). "Improved vertical-scanning interferometry" (PDF). Applied Optics. 39 (13): 2107–2115. Bibcode:2000ApOpt..39.2107H. doi:10.1364/AO.39.002107. hdl:10150/289148. PMID 18345114. Retrieved 21 May 2012.
Yang, C.-H.; Wax, A; Dasari, R.R.; Feld, M.S. (2002). "2π ambiguity-free optical distance measurement with subnanometer precision with a novel phase-crossing low-coherence interferometer" (PDF). Optics Letters. 27 (2): 77–79. Bibcode:2002OptL...27...77Y. doi:10.1364/OL.27.000077. PMID 18007717. S2CID 9524638.
Hitzenberger, C. K.; Sticker, M.; Leitgeb, R.; Fercher, A. F. (2001). "Differential phase measurements in low-coherence interferometry without 2pi ambiguity". Optics Letters. 26 (23): 1864–1866. Bibcode:2001OptL...26.1864H. doi:10.1364/ol.26.001864. PMID 18059719.

handle.net

hdl.handle.net

Harasaki, A.; Schmit, J.; Wyant, J. C. (2000). "Improved vertical-scanning interferometry" (PDF). Applied Optics. 39 (13): 2107–2115. Bibcode:2000ApOpt..39.2107H. doi:10.1364/AO.39.002107. hdl:10150/289148. PMID 18345114. Retrieved 21 May 2012.

harvard.edu

ui.adsabs.harvard.edu

Harasaki, A.; Schmit, J.; Wyant, J. C. (2000). "Improved vertical-scanning interferometry" (PDF). Applied Optics. 39 (13): 2107–2115. Bibcode:2000ApOpt..39.2107H. doi:10.1364/AO.39.002107. hdl:10150/289148. PMID 18345114. Retrieved 21 May 2012.
Yang, C.-H.; Wax, A; Dasari, R.R.; Feld, M.S. (2002). "2π ambiguity-free optical distance measurement with subnanometer precision with a novel phase-crossing low-coherence interferometer" (PDF). Optics Letters. 27 (2): 77–79. Bibcode:2002OptL...27...77Y. doi:10.1364/OL.27.000077. PMID 18007717. S2CID 9524638.
Hitzenberger, C. K.; Sticker, M.; Leitgeb, R.; Fercher, A. F. (2001). "Differential phase measurements in low-coherence interferometry without 2pi ambiguity". Optics Letters. 26 (23): 1864–1866. Bibcode:2001OptL...26.1864H. doi:10.1364/ol.26.001864. PMID 18059719.

nih.gov

pubmed.ncbi.nlm.nih.gov

Harasaki, A.; Schmit, J.; Wyant, J. C. (2000). "Improved vertical-scanning interferometry" (PDF). Applied Optics. 39 (13): 2107–2115. Bibcode:2000ApOpt..39.2107H. doi:10.1364/AO.39.002107. hdl:10150/289148. PMID 18345114. Retrieved 21 May 2012.
Yang, C.-H.; Wax, A; Dasari, R.R.; Feld, M.S. (2002). "2π ambiguity-free optical distance measurement with subnanometer precision with a novel phase-crossing low-coherence interferometer" (PDF). Optics Letters. 27 (2): 77–79. Bibcode:2002OptL...27...77Y. doi:10.1364/OL.27.000077. PMID 18007717. S2CID 9524638.
Hitzenberger, C. K.; Sticker, M.; Leitgeb, R.; Fercher, A. F. (2001). "Differential phase measurements in low-coherence interferometry without 2pi ambiguity". Optics Letters. 26 (23): 1864–1866. Bibcode:2001OptL...26.1864H. doi:10.1364/ol.26.001864. PMID 18059719.

novacam.com

"Metrology Applications: Surface Roughness Measurement, Thickness, Volume Loss". www.novacam.com.

pan.pl

bulletin.pan.pl

Plucinski, J.; Hypszer, R.; Wierzba, P.; Strakowski, M.; Jedrzejewska-Szczerska, M.; Maciejewski, M.; Kosmowski, B.B. (2008). "Optical low-coherence interferometry for selected technical applications" (PDF). Bulletin of the Polish Academy of Sciences. 56 (2): 155–172. Retrieved 8 April 2012.

semanticscholar.org

api.semanticscholar.org

Yang, C.-H.; Wax, A; Dasari, R.R.; Feld, M.S. (2002). "2π ambiguity-free optical distance measurement with subnanometer precision with a novel phase-crossing low-coherence interferometer" (PDF). Optics Letters. 27 (2): 77–79. Bibcode:2002OptL...27...77Y. doi:10.1364/OL.27.000077. PMID 18007717. S2CID 9524638.

zebraoptical.com

"Services". www.zebraoptical.com.