References analysis of the Wikipedia article "Microscopio de sonda de barrido" in the Spanish version

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Binnig, G.; C. F. Quate; Ch. Gerber (3 de marzo de 1986). «Atomic Force Microscope». Physical Review Letters 56 (9): 930-933. Bibcode:1986PhRvL..56..930B. PMID 10033323. doi:10.1103/PhysRevLett.56.930.

Kaiser, W. J.; L. D. Bell (1988). «Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy». Physical Review Letters 60 (14): 1406-1409. Bibcode:1988PhRvL..60.1406K. PMID 10038030. doi:10.1103/PhysRevLett.60.1406.

Zhang, L.; T. Sakai, N. Sakuma, T. Ono, K. Nakayama (1999). «Nanostructural conductivity and surface-potential study of low-field-emission carbon films with conductive scanning probe microscopy». Applied Physics Letters 75 (22): 3527-3529. Bibcode:1999ApPhL..75.3527Z. doi:10.1063/1.125377.

Higgins, S. R.; R. J. Hamers (March 1996). «Morphology and dissolution processes of metal sulfide minerals observed with the electrochemical scanning tunneling microscope». Journal of Vacuum Science and Technology B 14 (AVS): 1360-1364. doi:10.1116/1.589098. Archivado desde el original el 5 de marzo de 2016. Consultado el 5 de octubre de 2009.

Weaver, J. M. R.; David W. Abraham (1991). «High resolution atomic force microscopy potentiometry». Journal of Vacuum Science and Technology B 9 (3): 1559-1561. Bibcode:1991JVSTB...9.1559W. doi:10.1116/1.585423.

Meister, André; Gabi, Michael; Behr, Pascal; Studer, Philipp; Vörös, János; Niedermann, Philippe; Bitterli, Joanna; Polesel-Maris, Jérôme; Liley, Martha; Heinzelmann, Harry; Zambelli, Tomaso (2009). «FluidFM: Combining Atomic Force Microscopy and Nanofluidics in a Universal Liquid Delivery System for Single Cell Applications and Beyond». Nano Letters 9 (6): 2501-2507. Bibcode:2009NanoL...9.2501M. ISSN 1530-6984. doi:10.1021/nl901384x.

Fritz, M.; M. Radmacher, N. Petersen, H. E. Gaub (May 1994). «Visualization and identification of intracellular structures by force modulation microscopy and drug induced degradation». The 1993 international conference on scanning tunneling microscopy. The 1993 international conference on scanning tunneling microscopy 12. Beijing, China: AVS. pp. 1526-1529. doi:10.1116/1.587278. Archivado desde el original|urlarchivo= requiere |url= (ayuda) el 5 de marzo de 2016. Consultado el 5 de octubre de 2009.

Nonnenmacher, M.; M. P. O'Boyle; H. K. Wickramasinghe (1991). «Kelvin probe force microscopy». Applied Physics Letters 58 (25): 2921-2923. Bibcode:1991ApPhL..58.2921N. doi:10.1063/1.105227.

Hartmann, U. (1988). «Magnetic force microscopy: Some remarks from the micromagnetic point of view». Journal of Applied Physics 64 (3): 1561-1564. Bibcode:1988JAP....64.1561H. doi:10.1063/1.341836.

Sidles, J. A.; J. L. Garbini, K. J. Bruland, D. Rugar, O. Züger, S. Hoen, C. S. Yannoni (1995). «Magnetic resonance force microscopy». Reviews of Modern Physics 67 (1): 249. Bibcode:1995RvMP...67..249S. doi:10.1103/RevModPhys.67.249. |fechaacceso= requiere |url= (ayuda)

BETZIG, E.; J. K. TRAUTMAN, T. D. HARRIS, J. S. WEINER, R. L. KOSTELAK (22 de marzo de 1991). «Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale». Science 251 (5000): 1468-1470. Bibcode:1991Sci...251.1468B. PMID 17779440. doi:10.1126/science.251.5000.1468. Consultado el 5 de octubre de 2009.

Roelofs, A.; U. Bottger, R. Waser, F. Schlaphof, S. Trogisch, L. M. Eng (2000). «Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy». Applied Physics Letters 77 (21): 3444-3446. Bibcode:2000ApPhL..77.3444R. doi:10.1063/1.1328049.

Reddick, R. C.; R. J. Warmack; T. L. Ferrell (1 de enero de 1989). «New form of scanning optical microscopy». Physical Review B 39 (1): 767. Bibcode:1989PhRvB..39..767R. doi:10.1103/PhysRevB.39.767. Consultado el 5 de octubre de 2009.

Matey, J. R.; J. Blanc (1985). «Scanning capacitance microscopy». Journal of Applied Physics 57 (5): 1437-1444. Bibcode:1985JAP....57.1437M. doi:10.1063/1.334506.

Eriksson, M. A.; R. G. Beck, M. Topinka, J. A. Katine, R. M. Westervelt, K. L. Campman, A. C. Gossard (29 de julio de 1996). «Cryogenic scanning probe characterization of semiconductor nanostructures». Applied Physics Letters 69 (5): 671-673. Bibcode:1996ApPhL..69..671E. doi:10.1063/1.117801. Archivado desde el original el 5 de marzo de 2016. Consultado el 5 de octubre de 2009.

Chang, A. M.; H. D. Hallen, L. Harriott, H. F. Hess, H. L. Kao, J. Kwo, R. E. Miller, R. Wolfe, J. van der Ziel, T. Y. Chang (1992). «Scanning Hall probe microscopy». Applied Physics Letters 61 (16): 1974-1976. Bibcode:1992ApPhL..61.1974C. doi:10.1063/1.108334.

Hansma, PK; B Drake, O Marti, SA Gould, CB Prater (3 de febrero de 1989). «The scanning ion-conductance microscope». Science 243 (4891): 641-643. Bibcode:1989Sci...243..641H. PMID 2464851. doi:10.1126/science.2464851. Consultado el 5 de octubre de 2009.

Wiesendanger, R.; M. Bode (25 de julio de 2001). «Nano- and atomic-scale magnetism studied by spin-polarized scanning tunneling microscopy and spectroscopy». Solid State Communications 119 (4-5): 341-355. Bibcode:2001SSCom.119..341W. ISSN 0038-1098. doi:10.1016/S0038-1098(01)00103-X. Consultado el 5 de octubre de 2009.

De Wolf, P.; J. Snauwaert, T. Clarysse, W. Vandervorst, L. Hellemans (1995). «Characterization of a point-contact on silicon using force microscopy-supported resistance measurements». Applied Physics Letters 66 (12): 1530-1532. Bibcode:1995ApPhL..66.1530D. doi:10.1063/1.113636.

Xu, J. B.; K. Lauger, K. Dransfeld, I. H. Wilson (1994). «Thermal sensors for investigation of heat transfer in scanning probe microscopy». Review of Scientific Instruments 65 (7): 2262-2266. Bibcode:1994RScI...65.2262X. doi:10.1063/1.1145225.

Binnig, G.; H. Rohrer, Ch. Gerber, E. Weibel (1982). «Tunneling through a controllable vacuum gap». Applied Physics Letters 40 (2): 178-180. Bibcode:1982ApPhL..40..178B. doi:10.1063/1.92999.

Trenkler, T.; P. De Wolf, W. Vandervorst, L. Hellemans (1998). «Nanopotentiometry: Local potential measurements in complementary metal--oxide--semiconductor transistors using atomic force microscopy». Journal of Vacuum Science and Technology B 16: 367-372. Bibcode:1998JVSTB..16..367T. doi:10.1116/1.589812.

Kalinin, Sergei V.; Gruverman, Alexei (Eds.), ed. (2011). «New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy». Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy (1st edición). Nueva York: Springer. pp. 405-431. ISBN 978-1-4419-6567-7. doi:10.1007/978-1-4419-7167-8_14. Archivado desde el original el 10 de mayo de 2020. Consultado el 28 de abril de 2014.

Yoo, M. J.; Fulton, T. A. and Hess, H. F. and Willett, R. L. and Dunkleberger, L. N. and Chichester, R. J. and Pfeiffer, L. N. and West, K. W. (25 de abril de 1997). «Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges.». Science 276 (5312): 579-582. doi:10.1126/science.276.5312.579.

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Nonnenmacher, M.; M. P. O'Boyle; H. K. Wickramasinghe (1991). «Kelvin probe force microscopy». Applied Physics Letters 58 (25): 2921-2923. Bibcode:1991ApPhL..58.2921N. doi:10.1063/1.105227.

Matey, J. R.; J. Blanc (1985). «Scanning capacitance microscopy». Journal of Applied Physics 57 (5): 1437-1444. Bibcode:1985JAP....57.1437M. doi:10.1063/1.334506.

Binnig, G.; H. Rohrer, Ch. Gerber, E. Weibel (1982). «Tunneling through a controllable vacuum gap». Applied Physics Letters 40 (2): 178-180. Bibcode:1982ApPhL..40..178B. doi:10.1063/1.92999.

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Microscopio de sonda de barrido (Spanish Wikipedia)

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