Tecnología CAD (Spanish Wikipedia)

Analysis of information sources in references of the Wikipedia article "Tecnología CAD" in Spanish language version.

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cambridge.org

Lui, Basil; Tam, S. W. B.; Migliorato, P. (1998). «A Polysilicon Tft Parameter Extractor». MRS Online Proceedings Library (OPL) (en inglés) 507: 365. ISSN 0272-9172. doi:10.1557/PROC-507-365.

devsim.org

DEVSIM TCAD Software

doi.org

dx.doi.org

Lui, Basil; Migliorato, P (1 de abril de 1997). «A new generation-recombination model for device simulation including the Poole-Frenkel effect and phonon-assisted tunnelling». Solid-State Electronics (en inglés) 41 (4): 575-583. ISSN 0038-1101. doi:10.1016/S0038-1101(96)00148-7.
Lui, Basil; Tam, S. W. B.; Migliorato, P. (1998). «A Polysilicon Tft Parameter Extractor». MRS Online Proceedings Library (OPL) (en inglés) 507: 365. ISSN 0272-9172. doi:10.1557/PROC-507-365.
R.W. Dutton and A.J. Strojwas, Perspectives on technology and technology-driven CAD , IEEE Trans. CAD-ICAS, vol. 19, no. 12, pp. 1544-1560, December, 2000.

globaltcad.com

Global TCAD Solutions

gnu.org

ieee.org

ieeexplore.ieee.org

H.J. DeMan and R. Mertens, SITCAP — A simulator of bipolar transistors for computer-aided circuit analysis programs, International Solid-State Circuits Conference (ISSCC), Technical Digest, pp. 104-5, February, 1973
R.W. Dutton and D.A. Antoniadis, Process simulation for device design and control, International Solid-State Circuits Conference (ISSCC), Technical Digest, pp. 244-245, February, 1979
R.H. Dennard, F.H. Gaensslen, H.N. Yu, V.L. Rodeout, E. Bassous and A.R. LeBlanc, Design of ion-implanted MOSFETs with very small physical dimensions, IEEE Jour. Solid-State Circuits, vol. SC-9, pp.256-268, October, 1974.
R.W. Dutton and S.E. Hansen, Process modeling of integrated circuit device technology, Proceeding IEEE, vol. 69, no. 10, pp. 1305-1320, October, 1981.
C.S. Rafferty, M.R. Pinto, and R.W. Dutton, Iterative methods in semiconductor device simulation, IEEE Trans. Elec. Dev., vol. ED-32, no.10, pp.2018-2027, October, 1985.
M.R. Pinto and R.W. Dutton, Accurate trigger condition analysis for CMOS latchup, IEEE Electron Device Letters, vol. EDL-6, no. 2, February, 1985.
R.W. Dutton, Modeling and simulation for VLSI, International Electron Devices Meeting (IEDM), Technical Digest, pp. 2-7, December, 1986.

issn.org

portal.issn.org

Lui, Basil; Migliorato, P (1 de abril de 1997). «A new generation-recombination model for device simulation including the Poole-Frenkel effect and phonon-assisted tunnelling». Solid-State Electronics (en inglés) 41 (4): 575-583. ISSN 0038-1101. doi:10.1016/S0038-1101(96)00148-7.
Lui, Basil; Tam, S. W. B.; Migliorato, P. (1998). «A Polysilicon Tft Parameter Extractor». MRS Online Proceedings Library (OPL) (en inglés) 507: 365. ISSN 0272-9172. doi:10.1557/PROC-507-365.

sciencedirect.com

Lui, Basil; Migliorato, P (1 de abril de 1997). «A new generation-recombination model for device simulation including the Poole-Frenkel effect and phonon-assisted tunnelling». Solid-State Electronics (en inglés) 41 (4): 575-583. ISSN 0038-1101. doi:10.1016/S0038-1101(96)00148-7.

sourceforge.net

gss-tcad.sourceforge.net

GSS:General-purpose Semiconductor Simulator

tiberlab.com

tiberCAD multiscale simulation tool

worldcat.org

Electronic design automation for IC implementation, circuit design, and process technology (en inglés). Luciano Lavagno, Igor L. Markov, Grant Martin, Lou Scheffer (2 edición). Boca Raton. 2016. ISBN 978-1-4822-5461-7. OCLC 948286295.