Magnetjõumikroskoopia (Estonian Wikipedia)

Analysis of information sources in references of the Wikipedia article "Magnetjõumikroskoopia" in Estonian language version.

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8doi.org

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7harvard.edu

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1nanoscan.ch

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1caltech.edu

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L. Abelmann, S. Porthun; et al. (1998). "Comparing the resolution of magnetic force microscopes using the CAMST reference samples". J. Magn. Magn. Mater. 190: 135–147. Bibcode:1998JMMM..190..135A. DOI:10.1016/S0304-8853(98)00281-9. {{cite journal}}: et al.-i üleliigne kasutus kohas: |author= (juhend)

azom.com

History of Probing Methods

books.google.com

D. Jiles (1998). "15". Introduction to Magnetism and Magnetic Materials (2 ed.). Springer. ISBN 3-540-40186-5.

caltech.edu

mechmat.caltech.edu

"Magnetic Force Microscopy". Originaali arhiivikoopia seisuga 19. juuli 2011. Vaadatud 21. jaanuaril 2015.

doi.org

L. Abelmann, S. Porthun; et al. (1998). "Comparing the resolution of magnetic force microscopes using the CAMST reference samples". J. Magn. Magn. Mater. 190: 135–147. Bibcode:1998JMMM..190..135A. DOI:10.1016/S0304-8853(98)00281-9. {{cite journal}}: et al.-i üleliigne kasutus kohas: |author= (juhend)
Y. Martin and K. Wickramasinghe (1987). "Magnetic Imaging by Force Microscopy with 1000A Resolution". Appl. Phys. Lett. 50 (20): 1455–1457. Bibcode:1987ApPhL..50.1455M. DOI:10.1063/1.97800.
U. Hartmann (1999). "Magnetic Force Microscopy". Annu. Rev. Mater. Sci. 29: 53–87. Bibcode:1999AnRMS..29...53H. DOI:10.1146/annurev.matsci.29.1.53.
L. Gao, L.P. Yue, T. Yokota; et al. (2004). "Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images". IEEE Transactions on Magnetics. 40 (4): 2194–2196. Bibcode:2004ITM....40.2194G. DOI:10.1109/TMAG.2004.829173. {{cite journal}}: et al.-i üleliigne kasutus kohas: |author= (juhend)CS1 hooldus: mitu nime: autorite loend (link)
A. Winkler, T. Mühl, S. Menzel; et al. (2006). "Magnetic Force Microscopy Sensors using Iron-filled Carbon Nanotubes". J. Appl. Phys. 99 (10): 104905. Bibcode:2006JAP....99j4905W. DOI:10.1063/1.2195879. {{cite journal}}: et al.-i üleliigne kasutus kohas: |author= (juhend)CS1 hooldus: mitu nime: autorite loend (link)
K. Tanaka, M. Yoshimura, and K. Ueda (2009). "High-Resolution Magnetic Force Microscopy Using Carbon Nanotube Probes Fabricated Directly by Microwave Plasma-Enhanced Chemical Vapor Deposition". J. NanoMaterials. 2009: 147204. DOI:10.1155/2009/147204.{{cite journal}}: CS1 hooldus: mitu nime: autorite loend (link)
R. Gomez, E.R. Burke, and I.D. Mayergoyz (1996). "Magnetic Imaging in the Presence of External Fields: Technique and Applications". J. Appl. Phys. 79 (8): 6441–6446. Bibcode:1996JAP....79.6441G. DOI:10.1063/1.361966.{{cite journal}}: CS1 hooldus: mitu nime: autorite loend (link)
D. Rugar, H.J. Mamin, P. Guenther; et al. (1990). "Magnetic Force Microscopy: General Principles and Application to Longitudinal Recording Media". J. Appl. Phys. 68 (3): 1169–1183. Bibcode:1990JAP....68.1169R. DOI:10.1063/1.346713. {{cite journal}}: et al.-i üleliigne kasutus kohas: |author= (juhend)CS1 hooldus: mitu nime: autorite loend (link)

harvard.edu

ui.adsabs.harvard.edu

L. Abelmann, S. Porthun; et al. (1998). "Comparing the resolution of magnetic force microscopes using the CAMST reference samples". J. Magn. Magn. Mater. 190: 135–147. Bibcode:1998JMMM..190..135A. DOI:10.1016/S0304-8853(98)00281-9. {{cite journal}}: et al.-i üleliigne kasutus kohas: |author= (juhend)
Y. Martin and K. Wickramasinghe (1987). "Magnetic Imaging by Force Microscopy with 1000A Resolution". Appl. Phys. Lett. 50 (20): 1455–1457. Bibcode:1987ApPhL..50.1455M. DOI:10.1063/1.97800.
U. Hartmann (1999). "Magnetic Force Microscopy". Annu. Rev. Mater. Sci. 29: 53–87. Bibcode:1999AnRMS..29...53H. DOI:10.1146/annurev.matsci.29.1.53.
L. Gao, L.P. Yue, T. Yokota; et al. (2004). "Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images". IEEE Transactions on Magnetics. 40 (4): 2194–2196. Bibcode:2004ITM....40.2194G. DOI:10.1109/TMAG.2004.829173. {{cite journal}}: et al.-i üleliigne kasutus kohas: |author= (juhend)CS1 hooldus: mitu nime: autorite loend (link)
A. Winkler, T. Mühl, S. Menzel; et al. (2006). "Magnetic Force Microscopy Sensors using Iron-filled Carbon Nanotubes". J. Appl. Phys. 99 (10): 104905. Bibcode:2006JAP....99j4905W. DOI:10.1063/1.2195879. {{cite journal}}: et al.-i üleliigne kasutus kohas: |author= (juhend)CS1 hooldus: mitu nime: autorite loend (link)
R. Gomez, E.R. Burke, and I.D. Mayergoyz (1996). "Magnetic Imaging in the Presence of External Fields: Technique and Applications". J. Appl. Phys. 79 (8): 6441–6446. Bibcode:1996JAP....79.6441G. DOI:10.1063/1.361966.{{cite journal}}: CS1 hooldus: mitu nime: autorite loend (link)
D. Rugar, H.J. Mamin, P. Guenther; et al. (1990). "Magnetic Force Microscopy: General Principles and Application to Longitudinal Recording Media". J. Appl. Phys. 68 (3): 1169–1183. Bibcode:1990JAP....68.1169R. DOI:10.1063/1.346713. {{cite journal}}: et al.-i üleliigne kasutus kohas: |author= (juhend)CS1 hooldus: mitu nime: autorite loend (link)

nanoscan.ch

"Nanoscan AG, Quantum Leap in Hard Disk Technology". Originaali arhiivikoopia seisuga 7. oktoober 2011. Vaadatud 21. jaanuaril 2015.

parkafm.com

"Magnetic Force Microscopy (MFM)". Originaali arhiivikoopia seisuga 22. jaanuar 2015. Vaadatud 21. jaanuaril 2015.

web.archive.org

"Nanoscan AG, Quantum Leap in Hard Disk Technology". Originaali arhiivikoopia seisuga 7. oktoober 2011. Vaadatud 21. jaanuaril 2015.
"Magnetic Force Microscopy". Originaali arhiivikoopia seisuga 19. juuli 2011. Vaadatud 21. jaanuaril 2015.
"Magnetic Force Microscopy (MFM)". Originaali arhiivikoopia seisuga 22. jaanuar 2015. Vaadatud 21. jaanuaril 2015.