میکروسکوپ نیروی اتمی (Persian Wikipedia)

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Binnig, G.; Quate, C. F.; Gerber, Ch. (1986-03-03). "Atomic Force Microscope". Physical Review Letters (به انگلیسی). 56 (9): 930–933. doi:10.1103/PhysRevLett.56.930. ISSN 0031-9007.
Binnig, G.; Quate, C. F.; Gerber, Ch. (1986-03-03). "Atomic Force Microscope". Physical Review Letters (به انگلیسی). 56 (9): 930–933. doi:10.1103/PhysRevLett.56.930. ISSN 0031-9007.

Ohnesorge, F.; Binnig, G. (1993-06-04). "True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive Forces". Science (به انگلیسی). 260 (5113): 1451–1456. doi:10.1126/science.260.5113.1451. ISSN 0036-8075.
Giessibl, Franz J. (1995-01-06). "Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy". Science (به انگلیسی). 267 (5194): 68–71. doi:10.1126/science.267.5194.68. ISSN 0036-8075. PMID 17840059.
Binnig, G.; Quate, C. F.; Gerber, Ch. (1986-03-03). "Atomic Force Microscope". Physical Review Letters (به انگلیسی). 56 (9): 930–933. doi:10.1103/PhysRevLett.56.930. ISSN 0031-9007.
Binnig, G.; Quate, C. F.; Gerber, Ch. (1986-03-03). "Atomic Force Microscope". Physical Review Letters (به انگلیسی). 56 (9): 930–933. doi:10.1103/PhysRevLett.56.930. ISSN 0031-9007.
Lang, K. M.; Hite, D. A.; Simmonds, R. W.; McDermott, R.; Pappas, D. P.; Martinis, John M. (2004-08). "Conducting atomic force microscopy for nanoscale tunnel barrier characterization". Review of Scientific Instruments (به انگلیسی). 75 (8): 2726–2731. doi:10.1063/1.1777388. ISSN 0034-6748. {{cite journal}}: Check date values in: |date= (help)
Cappella, B.; Dietler, G. (1999-01-01). "Force-distance curves by atomic force microscopy". Surface Science Reports (به انگلیسی). 34 (1): 1–104. doi:10.1016/S0167-5729(99)00003-5. ISSN 0167-5729.

Cappella, B.; Dietler, G. (1999-01-01). "Force-distance curves by atomic force microscopy". Surface Science Reports (به انگلیسی). 34 (1): 1–104. doi:10.1016/S0167-5729(99)00003-5. ISSN 0167-5729.

Lang, K. M.; Hite, D. A.; Simmonds, R. W.; McDermott, R.; Pappas, D. P.; Martinis, John M. (2004-08). "Conducting atomic force microscopy for nanoscale tunnel barrier characterization". Review of Scientific Instruments (به انگلیسی). 75 (8): 2726–2731. doi:10.1063/1.1777388. ISSN 0034-6748. {{cite journal}}: Check date values in: |date= (help)

Ohnesorge, F.; Binnig, G. (1993-06-04). "True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive Forces". Science (به انگلیسی). 260 (5113): 1451–1456. doi:10.1126/science.260.5113.1451. ISSN 0036-8075.
Giessibl, Franz J. (1995-01-06). "Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy". Science (به انگلیسی). 267 (5194): 68–71. doi:10.1126/science.267.5194.68. ISSN 0036-8075. PMID 17840059.
Binnig, G.; Quate, C. F.; Gerber, Ch. (1986-03-03). "Atomic Force Microscope". Physical Review Letters (به انگلیسی). 56 (9): 930–933. doi:10.1103/PhysRevLett.56.930. ISSN 0031-9007.
Binnig, G.; Quate, C. F.; Gerber, Ch. (1986-03-03). "Atomic Force Microscope". Physical Review Letters (به انگلیسی). 56 (9): 930–933. doi:10.1103/PhysRevLett.56.930. ISSN 0031-9007.
Lang, K. M.; Hite, D. A.; Simmonds, R. W.; McDermott, R.; Pappas, D. P.; Martinis, John M. (2004-08). "Conducting atomic force microscopy for nanoscale tunnel barrier characterization". Review of Scientific Instruments (به انگلیسی). 75 (8): 2726–2731. doi:10.1063/1.1777388. ISSN 0034-6748. {{cite journal}}: Check date values in: |date= (help)
Cappella, B.; Dietler, G. (1999-01-01). "Force-distance curves by atomic force microscopy". Surface Science Reports (به انگلیسی). 34 (1): 1–104. doi:10.1016/S0167-5729(99)00003-5. ISSN 0167-5729.