کاوشگر اتمی (Persian Wikipedia)

Analysis of information sources in references of the Wikipedia article "کاوشگر اتمی" in Persian language version.

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5harvard.edu

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3worldcat.org

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1geoscienceworld.org

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1sciencedirect.com

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archive.org

Miller, M; Smith, G. (1989). Atom Probe Microanalysis: Principles and Applications to Materials Problems. Materials Research Society. ISBN 978-0-931837-99-9.
Gomer, R (1961). Field emission and field ionization. Harvard University Press. ISBN 978-1-56396-124-3.
Tsong, T (1990). Atom probe field Ion Microscopy: Field Ion emission and Surfaces and interfaces at atomic resolution. Cambridge University Press. ISBN 978-0-521-36379-2.

doi.org

Müller, Erwin W.; Panitz, John A.; McLane, S. Brooks (1968). "The Atom-Probe Field Ion Microscope". Review of Scientific Instruments. 39 (1): 83–86. Bibcode:1968RScI...39...83M. doi:10.1063/1.1683116. ISSN 0034-6748.
Valley, John W.; Reinhard, David A.; Cavosie, Aaron J.; Ushikubo, Takayuki; Lawrence, Daniel F.; Larson, David J.; Kelly, Thomas F.; Snoeyenbos, David R.; Strickland, Ariel (2015-07-01). "Nano- and micro-geochronology in Hadean and Archean zircons by atom-probe tomography and SIMS: New tools for old minerals" (PDF). American Mineralogist. 100 (7): 1355–1377. Bibcode:2015AmMin.100.1355V. doi:10.2138/am-2015-5134. ISSN 0003-004X. S2CID 51933115. Archived (PDF) from the original on 2022-10-09.
Müller, Erwin W.; Bahadur, Kanwar (1956). "Field Ionization of gases at a metal surface and the resolution of the field ion microscope". Phys. Rev. 102 (1): 624–631. Bibcode:1956PhRv..102..624M. doi:10.1103/PhysRev.102.624.
Panitz, John A. (1973). "The 10 cm Atom Probe". Review of Scientific Instruments. 44 (8): 1034–1038. Bibcode:1973RScI...44.1034P. doi:10.1063/1.1686295.
Bunton, J.; Lenz, D; Olson, J; Thompson, K; Ulfig, R; Larson, D; Kelly, T (2006). "Instrumentation Developments in Atom Probe Tomography: Applications in Semiconductor Research". Microscopy and Microanalysis. 12 (2): 1730–1731. Bibcode:2006MiMic..12.1730B. doi:10.1017/S1431927606065809. ISSN 1431-9276.

geoscienceworld.org

ammin.geoscienceworld.org

Valley, John W.; Reinhard, David A.; Cavosie, Aaron J.; Ushikubo, Takayuki; Lawrence, Daniel F.; Larson, David J.; Kelly, Thomas F.; Snoeyenbos, David R.; Strickland, Ariel (2015-07-01). "Nano- and micro-geochronology in Hadean and Archean zircons by atom-probe tomography and SIMS: New tools for old minerals" (PDF). American Mineralogist. 100 (7): 1355–1377. Bibcode:2015AmMin.100.1355V. doi:10.2138/am-2015-5134. ISSN 0003-004X. S2CID 51933115. Archived (PDF) from the original on 2022-10-09.

ghostarchive.org

Valley, John W.; Reinhard, David A.; Cavosie, Aaron J.; Ushikubo, Takayuki; Lawrence, Daniel F.; Larson, David J.; Kelly, Thomas F.; Snoeyenbos, David R.; Strickland, Ariel (2015-07-01). "Nano- and micro-geochronology in Hadean and Archean zircons by atom-probe tomography and SIMS: New tools for old minerals" (PDF). American Mineralogist. 100 (7): 1355–1377. Bibcode:2015AmMin.100.1355V. doi:10.2138/am-2015-5134. ISSN 0003-004X. S2CID 51933115. Archived (PDF) from the original on 2022-10-09.

harvard.edu

ui.adsabs.harvard.edu

Müller, Erwin W.; Panitz, John A.; McLane, S. Brooks (1968). "The Atom-Probe Field Ion Microscope". Review of Scientific Instruments. 39 (1): 83–86. Bibcode:1968RScI...39...83M. doi:10.1063/1.1683116. ISSN 0034-6748.
Valley, John W.; Reinhard, David A.; Cavosie, Aaron J.; Ushikubo, Takayuki; Lawrence, Daniel F.; Larson, David J.; Kelly, Thomas F.; Snoeyenbos, David R.; Strickland, Ariel (2015-07-01). "Nano- and micro-geochronology in Hadean and Archean zircons by atom-probe tomography and SIMS: New tools for old minerals" (PDF). American Mineralogist. 100 (7): 1355–1377. Bibcode:2015AmMin.100.1355V. doi:10.2138/am-2015-5134. ISSN 0003-004X. S2CID 51933115. Archived (PDF) from the original on 2022-10-09.
Müller, Erwin W.; Bahadur, Kanwar (1956). "Field Ionization of gases at a metal surface and the resolution of the field ion microscope". Phys. Rev. 102 (1): 624–631. Bibcode:1956PhRv..102..624M. doi:10.1103/PhysRev.102.624.
Panitz, John A. (1973). "The 10 cm Atom Probe". Review of Scientific Instruments. 44 (8): 1034–1038. Bibcode:1973RScI...44.1034P. doi:10.1063/1.1686295.
Bunton, J.; Lenz, D; Olson, J; Thompson, K; Ulfig, R; Larson, D; Kelly, T (2006). "Instrumentation Developments in Atom Probe Tomography: Applications in Semiconductor Research". Microscopy and Microanalysis. 12 (2): 1730–1731. Bibcode:2006MiMic..12.1730B. doi:10.1017/S1431927606065809. ISSN 1431-9276.

nasa.gov

descanso.jpl.nasa.gov

"Fundamentals of Electric Propulsion: Ion and Hall Thrusters" (PDF). Jet Propulsion Laboratory California Institute of Technology.

sciencedirect.com

"Field Ion Microscopy - an overview | ScienceDirect Topics". www.sciencedirect.com. Retrieved 2022-10-13.

semanticscholar.org

api.semanticscholar.org

Valley, John W.; Reinhard, David A.; Cavosie, Aaron J.; Ushikubo, Takayuki; Lawrence, Daniel F.; Larson, David J.; Kelly, Thomas F.; Snoeyenbos, David R.; Strickland, Ariel (2015-07-01). "Nano- and micro-geochronology in Hadean and Archean zircons by atom-probe tomography and SIMS: New tools for old minerals" (PDF). American Mineralogist. 100 (7): 1355–1377. Bibcode:2015AmMin.100.1355V. doi:10.2138/am-2015-5134. ISSN 0003-004X. S2CID 51933115. Archived (PDF) from the original on 2022-10-09.

worldcat.org

Müller, Erwin W.; Panitz, John A.; McLane, S. Brooks (1968). "The Atom-Probe Field Ion Microscope". Review of Scientific Instruments. 39 (1): 83–86. Bibcode:1968RScI...39...83M. doi:10.1063/1.1683116. ISSN 0034-6748.
Valley, John W.; Reinhard, David A.; Cavosie, Aaron J.; Ushikubo, Takayuki; Lawrence, Daniel F.; Larson, David J.; Kelly, Thomas F.; Snoeyenbos, David R.; Strickland, Ariel (2015-07-01). "Nano- and micro-geochronology in Hadean and Archean zircons by atom-probe tomography and SIMS: New tools for old minerals" (PDF). American Mineralogist. 100 (7): 1355–1377. Bibcode:2015AmMin.100.1355V. doi:10.2138/am-2015-5134. ISSN 0003-004X. S2CID 51933115. Archived (PDF) from the original on 2022-10-09.
Bunton, J.; Lenz, D; Olson, J; Thompson, K; Ulfig, R; Larson, D; Kelly, T (2006). "Instrumentation Developments in Atom Probe Tomography: Applications in Semiconductor Research". Microscopy and Microanalysis. 12 (2): 1730–1731. Bibcode:2006MiMic..12.1730B. doi:10.1017/S1431927606065809. ISSN 1431-9276.