Sheu, Tong-Ji: Deep Traps and Mechanism of Brightness Degradation in Mn-doped ZnS Thin-Film Electroluminescent Devices Grown by Metal-Organic Chemical Vapor Deposition. Japanese Journal of Applied Physics, 1997. doi:10.1143/JJAP.36.2728. Bibcode:1997JaJAP..36.2728W.
Sheu, Tong-Ji: Deep Traps and Mechanism of Brightness Degradation in Mn-doped ZnS Thin-Film Electroluminescent Devices Grown by Metal-Organic Chemical Vapor Deposition. Japanese Journal of Applied Physics, 1997. doi:10.1143/JJAP.36.2728. Bibcode:1997JaJAP..36.2728W.