Björkman, S Kurasch, O Lehtinen, J Kotakoski, O. V. Yazyev, A Srivastava, V Skakalova, J. H. Smet, U Kaiser et A. V. Krasheninnikov, « Defects in bilayer silica and graphene: common trends in diverse hexagonal two-dimensional systems », Scientific Reports, vol. 3, , p. 3482 (PMID24336488, PMCID3863822, DOI10.1038/srep03482, Bibcode2013NatSR...3E3482B)
Björkman, S Kurasch, O Lehtinen, J Kotakoski, O. V. Yazyev, A Srivastava, V Skakalova, J. H. Smet, U Kaiser et A. V. Krasheninnikov, « Defects in bilayer silica and graphene: common trends in diverse hexagonal two-dimensional systems », Scientific Reports, vol. 3, , p. 3482 (PMID24336488, PMCID3863822, DOI10.1038/srep03482, Bibcode2013NatSR...3E3482B)
Björkman, S Kurasch, O Lehtinen, J Kotakoski, O. V. Yazyev, A Srivastava, V Skakalova, J. H. Smet, U Kaiser et A. V. Krasheninnikov, « Defects in bilayer silica and graphene: common trends in diverse hexagonal two-dimensional systems », Scientific Reports, vol. 3, , p. 3482 (PMID24336488, PMCID3863822, DOI10.1038/srep03482, Bibcode2013NatSR...3E3482B)