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Henderson, R.; Cattermole, D.; McMullan, G.; Scotcher, S.; Fordham, M.; Amos, W.B.; Faruqi, A.R. (febreiro de 2007). "Digitisation of electron microscope films: Six useful tests applied to three film scanners". Ultramicroscopy107 (2–3): 73–80. PMID16872749. doi:10.1016/j.ultramic.2006.05.003.
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M.J. Zachman; et al. (2016). "Site-Specific Preparation of Intact Solid–Liquid Interfaces by Label-Free In Situ Localization and Cryo-Focused Ion Beam Lift-Out". Microscopy and Microanalysis22 (6): 1338–1349. Bibcode:2016MiMic..22.1338Z. PMID27869059. doi:10.1017/S1431927616011892.
Shimizu, Toshiki; Lungerich, Dominik; Harano, Koji; Nakamura, Eiichi (2022). "Time-Resolved Imaging of Stochastic Cascade Reactions over a Submillisecond to Second Time Range at the Angstrom Level". Journal of the American Chemical Society144 (22): 9797–9805. PMID35609254. arXiv:2202.13332. doi:10.1021/jacs.2c02297.
Yaguchi, T.; Suzuki, M.; Watabe, A.; Nagakubo, Y.; Ueda, K.; Kamino, T. (2011-03-22). "Development of a high temperature-atmospheric pressure environmental cell for high-resolution TEM". Journal of Electron Microscopy60 (3): 217–225. ISSN0022-0744. PMID21427119. doi:10.1093/jmicro/dfr011.
Picher, Matthieu; Mazzucco, Stefano; Blankenship, Steve; Sharma, Renu (marzo de 2015). "Vibrational and optical spectroscopies integrated with environmental transmission electron microscopy". Ultramicroscopy150: 10–15. PMID25490533. doi:10.1016/j.ultramic.2014.11.023.
Niekiel, Florian; Kraschewski, Simon M.; Müller, Julian; Butz, Benjamin; Spiecker, Erdmann (2017-05-01). "Local temperature measurement in TEM by parallel beam electron diffraction". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy 176: 161–169. ISSN0304-3991. PMID28049586. doi:10.1016/j.ultramic.2016.11.028.
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Legros, Marc; Cabié, Martiane; Gianola, Daniel S. (marzo de 2009). "In situ deformation of thin films on substrates". Microscopy Research and Technique72 (3): 270–283. PMID19189313. doi:10.1002/jemt.20680.
Feist, Armin; Bach, Nora; Rubiano da Silva, Nara; Danz, Thomas; Möller, Marcel; Priebe, Katharina E.; Domröse, Till; Gatzmann, J. Gregor; Rost, Stefan; Schauss, Jakob; Strauch, Stefanie; Bormann, Reiner; Sivis, Murat; Schäfer, Sascha; Ropers, Claus (2017-05-01). "Ultrafast Transmission Electron Microscopy Using a Laser-Driven Field Emitter: Femtosecond Resolution with a High Coherence Electron Beam". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy 176: 63–73. PMID28139341. arXiv:1611.05022. doi:10.1016/j.ultramic.2016.12.005.
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Roberts, P. T. E.; Chapman, J. N.; MacLeod, A. M. (1982-01-01). "A CCD-based image recording system for the CTEM". Ultramicroscopy8 (4): 385–396. ISSN0304-3991. doi:10.1016/0304-3991(82)90061-4.
Faruqi, A.R.; Henderson, R.; Pryddetch, M.; Allport, P.; Evans, A. (outubo de 2006). "Erratum to: "Direct single electron detection with a CMOS detector for electron microscopy"". Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment566 (2): 770. ISSN0168-9002. doi:10.1016/j.nima.2006.07.013.
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Yaguchi, T.; Suzuki, M.; Watabe, A.; Nagakubo, Y.; Ueda, K.; Kamino, T. (2011-03-22). "Development of a high temperature-atmospheric pressure environmental cell for high-resolution TEM". Journal of Electron Microscopy60 (3): 217–225. ISSN0022-0744. PMID21427119. doi:10.1093/jmicro/dfr011.
Niekiel, Florian; Kraschewski, Simon M.; Müller, Julian; Butz, Benjamin; Spiecker, Erdmann (2017-05-01). "Local temperature measurement in TEM by parallel beam electron diffraction". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy 176: 161–169. ISSN0304-3991. PMID28049586. doi:10.1016/j.ultramic.2016.11.028.