Tessitura (cristallografia) (Italian Wikipedia)

Analysis of information sources in references of the Wikipedia article "Tessitura (cristallografia)" in Italian language version.

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U. F. Kocks, C. N. Tomé, H. -R. Wenk and H. Mecking, Texture and Anisotropy: Preferred Orientations in Polycrystals and their effects on Materials Properties., Cambridge University Press., 2000, ISBN 978-0-521-79420-6, ..

doi.org

dx.doi.org

H.-R. Wenk e P. Van Houtte, Texture and anisotropy, in Rep. Progr. Phys., vol. 67, 2004, pp. 1367-1428, DOI:10.1088/0034-4885/67/8/R02. Bibcode: 2004RPPh...67.1367W .
M. Birkholz, B. Selle, F. Fenske e W. Fuhs, Structure-Function Relationship between Preferred Orientation of Crystallites and Electrical Resistivity in Thin Polycrystalline ZnO:Al Films, in Phys. Rev. B, vol. 68, 2003, pp. 205-414, DOI:10.1103/PhysRevB.68.205414. Bibcode: 2003PhRvB..68t5414B .
J. Bonarski, X-ray texture tomography of near-surface areas, in Progr. Mat. Sc., vol. 51, 2006, pp. 61-149, DOI:10.1016/j.pmatsci.2005.05.001.
M. Birkholz, Modelling of diffraction from fiber texture gradients in thin polycrystalline films, in J. Appl. Cryst., vol. 40, 2007, pp. 735–742, DOI:10.1107/S0021889807027240.

harvard.edu

ui.adsabs.harvard.edu

H.-R. Wenk e P. Van Houtte, Texture and anisotropy, in Rep. Progr. Phys., vol. 67, 2004, pp. 1367-1428, DOI:10.1088/0034-4885/67/8/R02. Bibcode: 2004RPPh...67.1367W .
M. Birkholz, B. Selle, F. Fenske e W. Fuhs, Structure-Function Relationship between Preferred Orientation of Crystallites and Electrical Resistivity in Thin Polycrystalline ZnO:Al Films, in Phys. Rev. B, vol. 68, 2003, pp. 205-414, DOI:10.1103/PhysRevB.68.205414. Bibcode: 2003PhRvB..68t5414B .

oadoi.org

H.-R. Wenk e P. Van Houtte, Texture and anisotropy, in Rep. Progr. Phys., vol. 67, 2004, pp. 1367-1428, DOI:10.1088/0034-4885/67/8/R02. Bibcode: 2004RPPh...67.1367W .
M. Birkholz, B. Selle, F. Fenske e W. Fuhs, Structure-Function Relationship between Preferred Orientation of Crystallites and Electrical Resistivity in Thin Polycrystalline ZnO:Al Films, in Phys. Rev. B, vol. 68, 2003, pp. 205-414, DOI:10.1103/PhysRevB.68.205414. Bibcode: 2003PhRvB..68t5414B .
J. Bonarski, X-ray texture tomography of near-surface areas, in Progr. Mat. Sc., vol. 51, 2006, pp. 61-149, DOI:10.1016/j.pmatsci.2005.05.001.
M. Birkholz, Modelling of diffraction from fiber texture gradients in thin polycrystalline films, in J. Appl. Cryst., vol. 40, 2007, pp. 735–742, DOI:10.1107/S0021889807027240.

webcitation.org

Peter Rudling, A. Strasser, and F. Garzarolli., Welding of Zirconium Alloys (PDF), Sweden, Advanced Nuclear Technology International, 2007, pp. 4-3(4-13). URL consultato l'11 agosto 2012 (archiviato dall'url originale il 22 gennaio 2012).