5ナノメートル (Japanese Wikipedia)

Analysis of information sources in references of the Wikipedia article "5ナノメートル" in Japanese language version.

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abc.net.au

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archive.today

  • Samsung 4 Nanometer” [Samsung Reveals 4nm Process Generation, Full Foundry Roadmap] (English). Toms Hardware (2017年5月30日). 2017年6月5日時点のオリジナルよりアーカイブ。2018年12月26日閲覧。

arstechnica.com

cadence.com

cnet.com

news.cnet.com

computerworld.com

dailytech.com

digitaltrends.com

doi.org

  • Lee, Hyunjin (2006). “Sub-5nm All-Around Gate FinFET for Ultimate Scaling”. Symposium on VLSI Technology, 2006: 58–59. doi:10.1109/VLSIT.2006.1705215. 
  • Fuechsle, Martin (2010). “Spectroscopy of few-electron single-crystal silicon quantum dots”. Nature Nanotechnology 5 (7): 502–505. doi:10.1038/nnano.2010.95. 
  • Fuechsle, M.; Miwa, J. A.; Mahapatra, S.; Ryu, H.; Lee, S.; Warschkow, O.; Hollenberg, L. C. L.; Klimeck, G. et al. (2012). “A single-atom transistor”. Nature Nanotechnology 7 (4): 242. doi:10.1038/nnano.2012.21. PMID 22343383. 
  • Desai, S. B.; Madhvapathy, S. R.; Sachid, A. B.; Llinas, J. P.; Wang, Q.; Ahn, G. H.; Pitner, G.; Kim, M. J. et al. (2016). “MoS”. Science 354 (6308): 99–102. doi:10.1126/science.aah4698. 

eetimes.com

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impress.co.jp

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kit.edu

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newscenter.lbl.gov

newscientist.com

nih.gov

pubmed.ncbi.nlm.nih.gov

  • Fuechsle, M.; Miwa, J. A.; Mahapatra, S.; Ryu, H.; Lee, S.; Warschkow, O.; Hollenberg, L. C. L.; Klimeck, G. et al. (2012). “A single-atom transistor”. Nature Nanotechnology 7 (4): 242. doi:10.1038/nnano.2012.21. PMID 22343383. 

pcmag.com

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physorg.com

semi.org

semiconductors.org

semiengineering.com

  • “Quantum Effects At 7/5nm And Beyond” (英語). Semiconductor Engineering. https://semiengineering.com/quantum-effects-at-7-5nm/ 2018年7月15日閲覧。 
  • Mark LaPedus (2016年1月20日). “5nm Fab Challenges”. 2016年1月27日時点のオリジナルよりアーカイブ。2018年12月26日閲覧。 “Intel presented a paper that generated sparks and fueled speculation regarding the future direction of the leading-edge IC industry. The company described a next-generation transistor called the nanowire FET, which is a finFET turned on its side with a gate wrapped around it. Intel's nanowire FET, sometimes called a gate-all-around FET, is said to meet the device requirements for 5nm, as defined by the International Technology Roadmap for Semiconductors (ITRS).”
  • Can Nano-Patterning Save Moore’s Law?”. Semiengineering.com. 7 December 2017閲覧。

semiwiki.com

siliconrepublic.com

techrepublic.com

thefreelibrary.com

theinquirer.net

theregister.co.uk

theverge.com

tomshardware.com

  • Samsung 4 Nanometer” [Samsung Reveals 4nm Process Generation, Full Foundry Roadmap] (English). Toms Hardware (2017年5月30日). 2017年6月5日時点のオリジナルよりアーカイブ。2018年12月26日閲覧。

tsmc.com

web.archive.org

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