Lau, W. S.; Zhong, L.; Lee, Allen; See, C. H.; Han, Taejoon; Sandler, N. P.; Chong, T. C. (1997). “Detection of defect states responsible for leakage current in ultrathin tantalum pentoxide (Ta[sub 2]O[sub 5]) films by zero-bias thermally stimulated current spectroscopy”. Applied Physics Letters71 (4): 500. Bibcode: 1997ApPhL..71..500L. doi:10.1063/1.119590.
Lau, W. S.; Wong, K. F.; Han, Taejoon; Sandler, Nathan P. (2006). “Application of zero-temperature-gradient zero-bias thermally stimulated current spectroscopy to ultrathin high-dielectric-constant insulator film characterization”. Applied Physics Letters88 (17): 172906. Bibcode: 2006ApPhL..88q2906L. doi:10.1063/1.2199590.
harvard.edu
ui.adsabs.harvard.edu
Lau, W. S.; Zhong, L.; Lee, Allen; See, C. H.; Han, Taejoon; Sandler, N. P.; Chong, T. C. (1997). “Detection of defect states responsible for leakage current in ultrathin tantalum pentoxide (Ta[sub 2]O[sub 5]) films by zero-bias thermally stimulated current spectroscopy”. Applied Physics Letters71 (4): 500. Bibcode: 1997ApPhL..71..500L. doi:10.1063/1.119590.
Lau, W. S.; Wong, K. F.; Han, Taejoon; Sandler, Nathan P. (2006). “Application of zero-temperature-gradient zero-bias thermally stimulated current spectroscopy to ultrathin high-dielectric-constant insulator film characterization”. Applied Physics Letters88 (17): 172906. Bibcode: 2006ApPhL..88q2906L. doi:10.1063/1.2199590.
