キャリア生成と再結合 (Japanese Wikipedia)

Analysis of information sources in references of the Wikipedia article "キャリア生成と再結合" in Japanese language version.

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cern.ch

Elhami Khorasani, Arash; Schroder, Dieter K.; Alford, T. L. (2014). “Optically Excited MOS-Capacitor for Recombination Lifetime Measurement”. IEEE Electron Device Letters 35 (10): 986–988. Bibcode: 2014IEDL...35..986K. doi:10.1109/LED.2014.2345058.
Shockley, W.; Read, W. T. (1 September 1952). “Statistics of the Recombinations of Holes and Electrons”. Physical Review 87 (5): 835–842. Bibcode: 1952PhRv...87..835S. doi:10.1103/PhysRev.87.835.
Li, Sheng S., ed (2006) (英語) (Submitted manuscript). Semiconductor Physical Electronics. pp. 140. doi:10.1007/0-387-37766-2. ISBN 978-0-387-28893-2. http://cds.cern.ch/record/1066014
Li, Sheng S., ed (2006) (英語) (Submitted manuscript). Semiconductor Physical Electronics. pp. 143. doi:10.1007/0-387-37766-2. ISBN 978-0-387-28893-2. http://cds.cern.ch/record/1066014
Li, Sheng S., ed (2006) (英語) (Submitted manuscript). Semiconductor Physical Electronics. pp. 144. doi:10.1007/0-387-37766-2. ISBN 978-0-387-28893-2. http://cds.cern.ch/record/1066014

Elhami Khorasani, Arash; Schroder, Dieter K.; Alford, T. L. (2014). “Optically Excited MOS-Capacitor for Recombination Lifetime Measurement”. IEEE Electron Device Letters 35 (10): 986–988. Bibcode: 2014IEDL...35..986K. doi:10.1109/LED.2014.2345058.
Shockley, W.; Read, W. T. (1 September 1952). “Statistics of the Recombinations of Holes and Electrons”. Physical Review 87 (5): 835–842. Bibcode: 1952PhRv...87..835S. doi:10.1103/PhysRev.87.835.