反射高速電子線回折 (Japanese Wikipedia)

Analysis of information sources in references of the Wikipedia article "反射高速電子線回折" in Japanese language version.

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7doi.org

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6harvard.edu

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2books.google.com

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1nih.gov

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1jst.go.jp

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books.google.com

Ichimiya A & Cohen P I (2004). Reflection High Energy Electron Diffraction. Cambridge University Press: Cambridge, UK. pp. 1,13,16,98,130,161. ISBN 0-521-45373-9
Bozovic I; Eckstein J N & Bozovic N (2001). Auceillo O & Krauss A R. eds. In Situ Real-Time Characterization of Thin Films. John Wiley and Sons: New York. pp. 29–56. ISBN 0-471-24141-5

doi.org

Horio Y; Hashimoto Y & Ichimaya A (1996). “A new type of RHEED apparatus equipped with an energy filter”. Appl. Surf. Sci. 100: 292–6. Bibcode: 1996ApSS..100..292H. doi:10.1016/0169-4332(96)00229-2.
Mitura Z & Maksym P A (1993). “Analysis of reflection high energy electron diffraction azimuthal plots”. Phys. Rev. Lett. 70 (19): 2904–2907. Bibcode: 1993PhRvL..70.2904M. doi:10.1103/PhysRevLett.70.2904. PMID 10053683.
一宮彪彦 (2013). “その場観察技術への期待”. 応用物理 82 (2): 103–104. doi:10.11470/oubutsu.82.2_103.
Brewer R T; Hartman J W; Groves J R; Arendt P N; Yashar P C & Atwater H A (2001). “Rheed in-plane rocking curve analysis of biaxially-textured polycrystalline MgO films on amorphous substrates grown by ion beam-assisted deposition”. Appl. Surf. Sci. 175 (1–2): 691–696. Bibcode: 2001ApSS..175..691B. doi:10.1016/S0169-4332(01)00106-4.
Atwater H A; Ahn C C; Wong S S; He G; Yoshino H & Nikzad S (1997). “Energy-Filtered Rheed And Reels For In Situ Real Time Analysis During Film Growth”. Surf. Rev. Lett. 4 (3): 525. Bibcode: 1997SRL.....4..525A. doi:10.1142/S0218625X9700050X.
Hasegawa, Shuji; Ino, Shozo; Yamamoto, Youiti; Daimon, Hiroshi (1985). “Chemical Analysis of Surfaces by Total-Reflection-Angle X-Ray Spectroscopy in RHEED Experiments (RHEED-TRAXS)”. Japanese Journal of Applied Physics 24 (6): L387–L390. Bibcode: 1985JaJAP..24L.387H. doi:10.1143/JJAP.24.L387.
Saiki K; Kono T; Ueno K & Koma A (2000). “Highly sensitive reflection high-energy electron diffraction measurement by use of micro-channel imaging plate”. Rev. Sci. Instrum. 71 (9): 3478. Bibcode: 2000RScI...71.3478S. doi:10.1063/1.1287625.

harvard.edu

ui.adsabs.harvard.edu

Horio Y; Hashimoto Y & Ichimaya A (1996). “A new type of RHEED apparatus equipped with an energy filter”. Appl. Surf. Sci. 100: 292–6. Bibcode: 1996ApSS..100..292H. doi:10.1016/0169-4332(96)00229-2.
Mitura Z & Maksym P A (1993). “Analysis of reflection high energy electron diffraction azimuthal plots”. Phys. Rev. Lett. 70 (19): 2904–2907. Bibcode: 1993PhRvL..70.2904M. doi:10.1103/PhysRevLett.70.2904. PMID 10053683.
Brewer R T; Hartman J W; Groves J R; Arendt P N; Yashar P C & Atwater H A (2001). “Rheed in-plane rocking curve analysis of biaxially-textured polycrystalline MgO films on amorphous substrates grown by ion beam-assisted deposition”. Appl. Surf. Sci. 175 (1–2): 691–696. Bibcode: 2001ApSS..175..691B. doi:10.1016/S0169-4332(01)00106-4.
Atwater H A; Ahn C C; Wong S S; He G; Yoshino H & Nikzad S (1997). “Energy-Filtered Rheed And Reels For In Situ Real Time Analysis During Film Growth”. Surf. Rev. Lett. 4 (3): 525. Bibcode: 1997SRL.....4..525A. doi:10.1142/S0218625X9700050X.
Hasegawa, Shuji; Ino, Shozo; Yamamoto, Youiti; Daimon, Hiroshi (1985). “Chemical Analysis of Surfaces by Total-Reflection-Angle X-Ray Spectroscopy in RHEED Experiments (RHEED-TRAXS)”. Japanese Journal of Applied Physics 24 (6): L387–L390. Bibcode: 1985JaJAP..24L.387H. doi:10.1143/JJAP.24.L387.
Saiki K; Kono T; Ueno K & Koma A (2000). “Highly sensitive reflection high-energy electron diffraction measurement by use of micro-channel imaging plate”. Rev. Sci. Instrum. 71 (9): 3478. Bibcode: 2000RScI...71.3478S. doi:10.1063/1.1287625.

jst.go.jp

jstage.jst.go.jp

一宮彪彦 (2013). “その場観察技術への期待”. 応用物理 82 (2): 103–104. doi:10.11470/oubutsu.82.2_103.

nih.gov

pubmed.ncbi.nlm.nih.gov

Mitura Z & Maksym P A (1993). “Analysis of reflection high energy electron diffraction azimuthal plots”. Phys. Rev. Lett. 70 (19): 2904–2907. Bibcode: 1993PhRvL..70.2904M. doi:10.1103/PhysRevLett.70.2904. PMID 10053683.