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Linn, E.; Siemon, A.; Waser, R.; Menzel, S. (2014년 3월 23일). “Applicability of Well-Established Memristive Models for Simulations of Resistive Switching Devices”. 《Circuits and Systems I: Regular Papers, IEEE Transactions on》 61 (8): 2402–2410. arXiv:1403.5801. doi:10.1109/TCSI.2014.2332261.
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Meuffels, P.; Schroeder, H. (2011), “Comment on "Exponential ionic drift: fast switching and low volatility of thin-film memristors" by D.B. Strukov and R.S. Williams in Appl. Phys. A (2009) 94: 515-519”, 《Applied Physics A》 105: 65, Bibcode:2011ApPhA.105...65M, doi:10.1007/s00339-011-6578-7