Kobayashi, K.; Yamauchi, J. (1995). "Electronic structure and scanning-tunneling-microscopy image of molybdenum dichalcogenide surfaces". Physical Review B. 51 (23): 17085–17095. Bibcode:1995PhRvB..5117085K. doi:10.1103/PhysRevB.51.17085.
Yun, Won Seok; Han, S. W.; Hong, Soon Cheol; Kim, In Gee; Lee, J. D. (2012). "Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2 semiconductors (M = Mo, W; X = S, Se, Te)". Physical Review B. 85 (3): 033305. Bibcode:2012PhRvB..85c3305Y. doi:10.1103/PhysRevB.85.033305.
harvard.edu
ui.adsabs.harvard.edu
Kobayashi, K.; Yamauchi, J. (1995). "Electronic structure and scanning-tunneling-microscopy image of molybdenum dichalcogenide surfaces". Physical Review B. 51 (23): 17085–17095. Bibcode:1995PhRvB..5117085K. doi:10.1103/PhysRevB.51.17085.
Yun, Won Seok; Han, S. W.; Hong, Soon Cheol; Kim, In Gee; Lee, J. D. (2012). "Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2 semiconductors (M = Mo, W; X = S, Se, Te)". Physical Review B. 85 (3): 033305. Bibcode:2012PhRvB..85c3305Y. doi:10.1103/PhysRevB.85.033305.