Elektronen energieverlies spectroscopie (Dutch Wikipedia)

Analysis of information sources in references of the Wikipedia article "Elektronen energieverlies spectroscopie" in Dutch language version.

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8doi.org

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archive.org

Baker, J. (September 1944). Microanalysis by means of electrons. J. Appl. Phys. 15 (9): 663–675. DOI: 10.1063/1.1707491.

doi.org

Egerton, R. F. (2009). Electron energy-loss spectroscopy in the TEM. Reports on Progress in Physics 72 (1). DOI: 10.1088/0034-4885/72/1/016502.
Baker, J. (September 1944). Microanalysis by means of electrons. J. Appl. Phys. 15 (9): 663–675. DOI: 10.1063/1.1707491.
Rose, H. H. (1 april 2008). Optics of high-performance electron microscopes. Science and Technology of Advanced Materials 9 (1): 014107. PMID 27877933. PMC 5099802. DOI: 10.1088/0031-8949/9/1/014107.
Ramasse, Quentin M. (October 2013). Probing the Bonding and Electronic Structure of Single Atom Dopants in Graphene with Electron Energy Loss Spectroscopy. Nano Letters 13 (10): 4989–4995. ISSN: 1530-6984. PMID 23259533. DOI: 10.1021/nl304187e.
Tan, H. (September 2011). 2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy. Phys. Rev. Lett. 107 (10). PMID 21981530. DOI: 10.1103/PhysRevLett.107.107602.
Hofer, F. (2016). Fundamentals of electron energy loss spectroscopy. IOP Conference Series: Materials Science and Engineering 109: 012007. DOI: 10.1088/1757-899X/109/1/012007.
Iakoubovskii, K. (2008). Thickness measurements with electron energy loss spectroscopy. Microscopy Research and Technique 71 (8): 626–31. PMID 18454473. DOI: 10.1002/jemt.20597. Gearchiveerd van origineel op 31 juli 2020.
Iakoubovskii, Konstantin (2008). Mean free path of inelastic electron scattering in elemental solids and oxides using transmission electron microscopy: Atomic number dependent oscillatory behavior. Physical Review B 77 (10): 104102. DOI: 10.1103/PhysRevB.77.104102. Gearchiveerd van origineel op 31 juli 2020.

nih.gov

ncbi.nlm.nih.gov

Rose, H. H. (1 april 2008). Optics of high-performance electron microscopes. Science and Technology of Advanced Materials 9 (1): 014107. PMID 27877933. PMC 5099802. DOI: 10.1088/0031-8949/9/1/014107.
Ramasse, Quentin M. (October 2013). Probing the Bonding and Electronic Structure of Single Atom Dopants in Graphene with Electron Energy Loss Spectroscopy. Nano Letters 13 (10): 4989–4995. ISSN: 1530-6984. PMID 23259533. DOI: 10.1021/nl304187e.
Tan, H. (September 2011). 2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy. Phys. Rev. Lett. 107 (10). PMID 21981530. DOI: 10.1103/PhysRevLett.107.107602.
Iakoubovskii, K. (2008). Thickness measurements with electron energy loss spectroscopy. Microscopy Research and Technique 71 (8): 626–31. PMID 18454473. DOI: 10.1002/jemt.20597. Gearchiveerd van origineel op 31 juli 2020.

nims.go.jp

pubman.nims.go.jp

Iakoubovskii, K. (2008). Thickness measurements with electron energy loss spectroscopy. Microscopy Research and Technique 71 (8): 626–31. PMID 18454473. DOI: 10.1002/jemt.20597. Gearchiveerd van origineel op 31 juli 2020.
Iakoubovskii, Konstantin (2008). Mean free path of inelastic electron scattering in elemental solids and oxides using transmission electron microscopy: Atomic number dependent oscillatory behavior. Physical Review B 77 (10): 104102. DOI: 10.1103/PhysRevB.77.104102. Gearchiveerd van origineel op 31 juli 2020.

tudelft.nl

repository.tudelft.nl

Tan, H. (September 2011). 2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy. Phys. Rev. Lett. 107 (10). PMID 21981530. DOI: 10.1103/PhysRevLett.107.107602.

web.archive.org

Iakoubovskii, K. (2008). Thickness measurements with electron energy loss spectroscopy. Microscopy Research and Technique 71 (8): 626–31. PMID 18454473. DOI: 10.1002/jemt.20597. Gearchiveerd van origineel op 31 juli 2020.
Iakoubovskii, Konstantin (2008). Mean free path of inelastic electron scattering in elemental solids and oxides using transmission electron microscopy: Atomic number dependent oscillatory behavior. Physical Review B 77 (10): 104102. DOI: 10.1103/PhysRevB.77.104102. Gearchiveerd van origineel op 31 juli 2020.

worldcat.org

Ramasse, Quentin M. (October 2013). Probing the Bonding and Electronic Structure of Single Atom Dopants in Graphene with Electron Energy Loss Spectroscopy. Nano Letters 13 (10): 4989–4995. ISSN: 1530-6984. PMID 23259533. DOI: 10.1021/nl304187e.