Ionepistol (Norwegian Wikipedia)

Analysis of information sources in references of the Wikipedia article "Ionepistol" in Norwegian language version.

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doi.org

doi.org

Benninghoven, A. (1. mars 1973). «Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)». Surface Science (på engelsk). 35: 427–457. ISSN 0039-6028. doi:10.1016/0039-6028(73)90232-X. Besøkt 11. mars 2021.
«Handbook of Physical Vapor Deposition (PVD) Processing». 2010. doi:10.1016/c2009-0-18800-1. Besøkt 11. mars 2021.

dx.doi.org

«Handbook of Physical Vapor Deposition (PVD) Processing». 2010. doi:10.1016/c2009-0-18800-1. Besøkt 11. mars 2021.

sciencedirect.com

Benninghoven, A. (1. mars 1973). «Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)». Surface Science (på engelsk). 35: 427–457. ISSN 0039-6028. doi:10.1016/0039-6028(73)90232-X. Besøkt 11. mars 2021.

worldcat.org

Benninghoven, A. (1. mars 1973). «Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)». Surface Science (på engelsk). 35: 427–457. ISSN 0039-6028. doi:10.1016/0039-6028(73)90232-X. Besøkt 11. mars 2021.
Handbook of surface and interface analysis : methods for problem-solving (2nd ed utg.). Boca Raton: CRC Press. 2009. ISBN 978-1-4200-0780-0. OCLC 437993485. CS1-vedlikehold: Ekstra tekst (link)
Introduction to focused ion beams : instrumentation, theory, techniques, and practice. New York: Springer. 2005. ISBN 0-387-23313-X. OCLC 58561723.