Snap-In HU na aic-europe.com [Erro: arquivo url desconhecido] (arquivado em 2014-12-14)
avx.com
I.Horacek, T.Zednicek, S.Zednicek, T.Karnik, J.Petrzilek, P.Jacisko, P.Gregorova, AVX, High CV Tantalum Capacitors - Challenges and Limitations [3]Arquivado em 9 de março de 2014, no Wayback Machine.
T. Zednicek, S. Sita, C. McCracken, W. A. Millman, J. Gill, AVX, Niobium Oxide Technology Roadmap, CARTS 2002 [9]Arquivado em 24 de fevereiro de 2014, no Wayback Machine.
Ch. Reynolds, AVX, Technical Information, Reliability Management of Tantalum Capacitors, PDFArquivado em 6 de agosto de 2013, no Wayback Machine.
I. Bishop, J. Gill, AVX Ltd., Reverse Voltage Behavior of Solid Tantalum Capacitors PDF
P. Vasina, T. Zednicek, Z. Sita, J. Sikula, J. Pavelka, AVX, Thermal and Electrical Breakdown Versus Reliability of Ta2O5 Under Both – Bipolar Biasing Conditions PDFArquivado em 6 de agosto de 2013, no Wayback Machine.
I. Salisbury, AVX, Thermal Management of Surface Mounted Tantalum Capacitors
[12]Arquivado em 6 de agosto de 2013, no Wayback Machine.
Charles Pollack: D.R.P. 92564, filed 14. Januar 1896, granted 19. Mai 1897 D.R.P. 92564
ecadigitallibrary.com
J.L. Stevens, A.C. Geiculescu, T.F. Strange, Dielectric Aluminum Oxides: Nano-Structural Features and Composites PDFArquivado em 29 de dezembro de 2014, no Wayback Machine.
Y. K. ZHANG, J. LIN，Y. CHEN, Polymer Aluminum Electrolytic Capacitors with Chemically-Polymerized Polypyrrole (PPy) as Cathode Materials Part I. Effect of Monomer Concentration and Oxidant on Electrical Properties of the Capacitors, PDFArquivado em 14 de dezembro de 2014, no Wayback Machine.
U. Merker, K. Wussow, W. Lövenich, H. C. Starck GmbH, New Conducting Polymer Dispersions for Solid Electrolyte Capacitors, ecadigitallibrary.comArquivado em 4 de março de 2016, no Wayback Machine.
J.L. Stevens, T. R. Marshall, A.C. Geiculescu m, C.R. Feger, T.F. Strange, Carts USA 2006, The Effects of Electrolyte Composition on the Deformation Characteristics of Wet Aluminum ICD Capacitors, [11]Arquivado em 26 de novembro de 2014, no Wayback Machine.
A. Teverovsky, Perot Systems Code 562, NASA GSFCE, Effect of Surge Current Testing on Reliability of Solid Tantalum Capacitors ecadigitallibrary.comArquivado em 14 de dezembro de 2014, no Wayback Machine.
edn.com
Gregory Mirsky, Determining end-of-life, ESR, and lifetime calculations for electrolytic capacitors at higher temperatures, EDN, August 20, 2008, edn.com
Imam, A.M., Condition Monitoring of Electrolytic Capacitors for Power Electronics Applications, Dissertation, Georgia Institute of Technology (2007) smartech.gatech.edu
google.com.gt
Th. F. Strange, T. R. Marshall, Very high volt oxide formation of aluminum for electrolytic capacitors, US Patent 6299752 B1, 9. Okt. 2001, [2]
Electronic Capacitors, SIC 3675, NAICS 334414: Electronic Capacitor Manufacturing, Industry report: [22]Arquivado em 12 de fevereiro de 2010, no Wayback Machine.
hitachiaic.com
Hitachi, Precautions in using Tantalum Capacitors, 4.2 Failure Rate Calculation Formula [17]Arquivado em 14 de dezembro de 2014, no Wayback Machine.
J. Both, Electrolytic capacitors, 1890 to 1925: early history and basic principle, Electrical Insulation Magazine, IEEE, Volume:31, Issue: 1, January–February 2015, [4]
J. Both, The modern era of aluminum electrolytic capacitors, Electrical Insulation Magazine, IEEE, Volume:31, Issue: 4, July–August 2015, ieeexplore.ieee.org
Alfonso Berduque, Zongli Dou, Rong Xu, KEMET, Electrochemical Studies for Aluminium Electrolytic Capacitor Applications: Corrosion Analysis of Aluminium in Ethylene Glycol-Based Electrolytes PDF
A. Berduque, Kemet, Low ESR Aluminium Electrolytic Capacitors for Medium to High Voltage Applications, kemet.com[ligação inativa]
"Understand Capacitor Soakage to Optimize Analog Systems" by Bob Pease 1982 [15]Arquivado em 23 de janeiro de 2010, no Wayback Machine.
ncku.edu.tw
ir.lib.ncku.edu.tw
Jeng-Kuei Chang, Chia-Mei Lin, Chi-Min Liao, Chih-Hsiung Chen, Wen-Ta Tsai, Journal of The Electrochemical Society, 2004. Effect of Heat-Treatment on Characteristics of Anodized Aluminum Oxide Formed in Ammonium Adipate Solution [1] DOI: 10.1149/1.1646140
W. Serjak, H. Seyeda, Ch. Cymorek, Tantalum Availability: 2000 and Beyond, PCI,March/April 2002, [6]Arquivado em 8 de agosto de 2014, no Wayback Machine.
Y. Pozdeev-Freeman, P. Maden, Vishay, Solid-Electrolyte Niobium Capacitors Exhibit Similar Performance to Tantalum, Feb 1, 2002, [10]Arquivado em 5 de agosto de 2020, no Wayback Machine.
Rubycon, LIFE OF ALUMINUM ELECTROLYTIC CAPACITORS, S. 9 (PDF)
sciencedirect.com
Shinichi Niwa, Yutaka Taketani, Development of new series of aluminium solid capacitors with organic Semiconductive electrolyte (OS-CON), Journal of Power Sources, Volume 60, Issue 2, June 1996, Pages 165–171, sciencedirect.com
E. Vitoratos, S. Sakkopoulos, E. Dalas, N. Paliatsas, D. Karageorgopoulos, F. Petraki, S. Kennou, S.A. Choulis, Thermal degradation mechanisms of PEDOT:PSS, Organic Electronics Volume 10, Issue 1, February 2009, Pages 61–66, Organic ElectronicsVolume 10, Issue 1, February 2009, Pages 61–66, [14]
E. Vitoratos, S. Sakkopoulos, E. Dalas, N. Paliatsas, D. Karageorgopoulos, F. Petraki, S. Kennou, S.A. Choulis, Thermal degradation mechanisms of PEDOT:PSS, Organic Electronics, Volume 10, Issue 1, February 2009, Pages 61–66, [19]
sciencelinks.jp
Shigeru Uzawa, Akihiko Komat-u, Tetsushi Ogawara, Rubycon Corporation, Ultra Low Impedance Aluminum Electrolytic Capacitor with Water based Electrolyte or «Archived copy». Consultado em 5 de fevereiro de 2016. Arquivado do original em 24 de maio de 2012
spiegel.de
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Vishay, Aluminium capacitors, Introduction, Revision: 10-Sep-13 1 Document Number: 28356, Chapter Storage, page 7 vishay.comArquivado em 26 de janeiro de 2016, no Wayback Machine.
Vishay BCcomponents, Introduction Aluminum Capacitors, Revision: 10-Sep-13 1 Document Number: 28356, PDFArquivado em 26 de janeiro de 2016, no Wayback Machine.
web.archive.org
J.L. Stevens, A.C. Geiculescu, T.F. Strange, Dielectric Aluminum Oxides: Nano-Structural Features and Composites PDFArquivado em 29 de dezembro de 2014, no Wayback Machine.
I.Horacek, T.Zednicek, S.Zednicek, T.Karnik, J.Petrzilek, P.Jacisko, P.Gregorova, AVX, High CV Tantalum Capacitors - Challenges and Limitations [3]Arquivado em 9 de março de 2014, no Wayback Machine.
W. Serjak, H. Seyeda, Ch. Cymorek, Tantalum Availability: 2000 and Beyond, PCI,March/April 2002, [6]Arquivado em 8 de agosto de 2014, no Wayback Machine.
Y. K. ZHANG, J. LIN，Y. CHEN, Polymer Aluminum Electrolytic Capacitors with Chemically-Polymerized Polypyrrole (PPy) as Cathode Materials Part I. Effect of Monomer Concentration and Oxidant on Electrical Properties of the Capacitors, PDFArquivado em 14 de dezembro de 2014, no Wayback Machine.
U. Merker, K. Wussow, W. Lövenich, H. C. Starck GmbH, New Conducting Polymer Dispersions for Solid Electrolyte Capacitors, ecadigitallibrary.comArquivado em 4 de março de 2016, no Wayback Machine.
T. Zednicek, S. Sita, C. McCracken, W. A. Millman, J. Gill, AVX, Niobium Oxide Technology Roadmap, CARTS 2002 [9]Arquivado em 24 de fevereiro de 2014, no Wayback Machine.
Y. Pozdeev-Freeman, P. Maden, Vishay, Solid-Electrolyte Niobium Capacitors Exhibit Similar Performance to Tantalum, Feb 1, 2002, [10]Arquivado em 5 de agosto de 2020, no Wayback Machine.
Shigeru Uzawa, Akihiko Komat-u, Tetsushi Ogawara, Rubycon Corporation, Ultra Low Impedance Aluminum Electrolytic Capacitor with Water based Electrolyte or «Archived copy». Consultado em 5 de fevereiro de 2016. Arquivado do original em 24 de maio de 2012
J.L. Stevens, T. R. Marshall, A.C. Geiculescu m, C.R. Feger, T.F. Strange, Carts USA 2006, The Effects of Electrolyte Composition on the Deformation Characteristics of Wet Aluminum ICD Capacitors, [11]Arquivado em 26 de novembro de 2014, no Wayback Machine.
Ch. Reynolds, AVX, Technical Information, Reliability Management of Tantalum Capacitors, PDFArquivado em 6 de agosto de 2013, no Wayback Machine.
A. Teverovsky, Perot Systems Code 562, NASA GSFCE, Effect of Surge Current Testing on Reliability of Solid Tantalum Capacitors ecadigitallibrary.comArquivado em 14 de dezembro de 2014, no Wayback Machine.
P. Vasina, T. Zednicek, Z. Sita, J. Sikula, J. Pavelka, AVX, Thermal and Electrical Breakdown Versus Reliability of Ta2O5 Under Both – Bipolar Biasing Conditions PDFArquivado em 6 de agosto de 2013, no Wayback Machine.
Vishay, Aluminium capacitors, Introduction, Revision: 10-Sep-13 1 Document Number: 28356, Chapter Storage, page 7 vishay.comArquivado em 26 de janeiro de 2016, no Wayback Machine.
J.Gill, T. Zednicek, AVX, VOLTAGE DERATING RULES FOR SOLID TANTALUM AND NIOBIUM CAPACITORS, [20]Arquivado em 6 de agosto de 2013, no Wayback Machine.
Vishay BCcomponents, Introduction Aluminum Capacitors, Revision: 10-Sep-13 1 Document Number: 28356, PDFArquivado em 26 de janeiro de 2016, no Wayback Machine.
Electronic Capacitors, SIC 3675, NAICS 334414: Electronic Capacitor Manufacturing, Industry report: [22]Arquivado em 12 de fevereiro de 2010, no Wayback Machine.
