Seiler, H (1983). «Secondary electron emission in the scanning electron microscope». AIP Publishing. Journal of Applied Physics. 54: R1–R18. ISSN0021-8979. doi:10.1063/1.332840
Cazaux, Jacques (15 de janeiro de 1999). «Some considerations on the secondary electron emission, δ, from e− irradiated insulators». AIP Publishing. Journal of Applied Physics. 85: 1137–1147. ISSN0021-8979. doi:10.1063/1.369239
Schreiber, E.; Fitting, H.-J. (2002). «Monte Carlo simulation of secondary electron emission from the insulator SiO2». Elsevier BV. Journal of Electron Spectroscopy and Related Phenomena. 124: 25–37. ISSN0368-2048. doi:10.1016/s0368-2048(01)00368-1
Fitting, H.-J.; Boyde, J.; Reinhardt, J. (16 de janeiro de 1984). «Monte-Carlo Approach of Electron Emission from SiO2». Wiley. Physica Status Solidi A. 81: 323–332. ISSN0031-8965. doi:10.1002/pssa.2210810136
Seiler, H (1983). «Secondary electron emission in the scanning electron microscope». AIP Publishing. Journal of Applied Physics. 54: R1–R18. ISSN0021-8979. doi:10.1063/1.332840
Cazaux, Jacques (15 de janeiro de 1999). «Some considerations on the secondary electron emission, δ, from e− irradiated insulators». AIP Publishing. Journal of Applied Physics. 85: 1137–1147. ISSN0021-8979. doi:10.1063/1.369239
Schreiber, E.; Fitting, H.-J. (2002). «Monte Carlo simulation of secondary electron emission from the insulator SiO2». Elsevier BV. Journal of Electron Spectroscopy and Related Phenomena. 124: 25–37. ISSN0368-2048. doi:10.1016/s0368-2048(01)00368-1
Fitting, H.-J.; Boyde, J.; Reinhardt, J. (16 de janeiro de 1984). «Monte-Carlo Approach of Electron Emission from SiO2». Wiley. Physica Status Solidi A. 81: 323–332. ISSN0031-8965. doi:10.1002/pssa.2210810136