Elétrons secundários (Portuguese Wikipedia)

Analysis of information sources in references of the Wikipedia article "Elétrons secundários" in Portuguese language version.

refsWebsite
Global rank Portuguese rank
5th place
5th place
2nd place
4th place
6th place
23rd place

archive.org

doi.org

dx.doi.org

  • Seiler, H (1983). «Secondary electron emission in the scanning electron microscope». AIP Publishing. Journal of Applied Physics. 54: R1–R18. ISSN 0021-8979. doi:10.1063/1.332840 
  • Cazaux, Jacques (15 de janeiro de 1999). «Some considerations on the secondary electron emission, δ, from e− irradiated insulators». AIP Publishing. Journal of Applied Physics. 85: 1137–1147. ISSN 0021-8979. doi:10.1063/1.369239 
  • Schreiber, E.; Fitting, H.-J. (2002). «Monte Carlo simulation of secondary electron emission from the insulator SiO2». Elsevier BV. Journal of Electron Spectroscopy and Related Phenomena. 124: 25–37. ISSN 0368-2048. doi:10.1016/s0368-2048(01)00368-1 
  • Fitting, H.-J.; Boyde, J.; Reinhardt, J. (16 de janeiro de 1984). «Monte-Carlo Approach of Electron Emission from SiO2». Wiley. Physica Status Solidi A. 81: 323–332. ISSN 0031-8965. doi:10.1002/pssa.2210810136 

worldcat.org

  • Zangwill, Andrew (1988). Physics at surfaces. Cambridge Cambridgeshire New York: Cambridge University Press. ISBN 978-0-521-34752-5. OCLC 15855885 
  • Seiler, H (1983). «Secondary electron emission in the scanning electron microscope». AIP Publishing. Journal of Applied Physics. 54: R1–R18. ISSN 0021-8979. doi:10.1063/1.332840 
  • Cazaux, Jacques (15 de janeiro de 1999). «Some considerations on the secondary electron emission, δ, from e− irradiated insulators». AIP Publishing. Journal of Applied Physics. 85: 1137–1147. ISSN 0021-8979. doi:10.1063/1.369239 
  • Schreiber, E.; Fitting, H.-J. (2002). «Monte Carlo simulation of secondary electron emission from the insulator SiO2». Elsevier BV. Journal of Electron Spectroscopy and Related Phenomena. 124: 25–37. ISSN 0368-2048. doi:10.1016/s0368-2048(01)00368-1 
  • Fitting, H.-J.; Boyde, J.; Reinhardt, J. (16 de janeiro de 1984). «Monte-Carlo Approach of Electron Emission from SiO2». Wiley. Physica Status Solidi A. 81: 323–332. ISSN 0031-8965. doi:10.1002/pssa.2210810136