Tensiune reziduală (Romanian Wikipedia)

Analysis of information sources in references of the Wikipedia article "Tensiune reziduală" in Romanian language version.

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aws.org

doi.org

  • en Schiavone, G.; Murray, J.; Smith, S.; Desmulliez, M. P. Y.; Mount, A. R.; Walton, A. J. (). „A wafer mapping technique for residual stress in surface micromachined films”. Journal of Micromechanics and Microengineering (în engleză). 26 (9): 095013. Bibcode:2016JMiMi..26i5013S. doi:10.1088/0960-1317/26/9/095013Accesibil gratuit. hdl:20.500.11820/33be8ce1-205b-4483-91d5-69724556d943Accesibil gratuit. ISSN 0960-1317. 

handle.net

hdl.handle.net

  • en Schiavone, G.; Murray, J.; Smith, S.; Desmulliez, M. P. Y.; Mount, A. R.; Walton, A. J. (). „A wafer mapping technique for residual stress in surface micromachined films”. Journal of Micromechanics and Microengineering (în engleză). 26 (9): 095013. Bibcode:2016JMiMi..26i5013S. doi:10.1088/0960-1317/26/9/095013Accesibil gratuit. hdl:20.500.11820/33be8ce1-205b-4483-91d5-69724556d943Accesibil gratuit. ISSN 0960-1317. 

harvard.edu

adsabs.harvard.edu

  • en Schiavone, G.; Murray, J.; Smith, S.; Desmulliez, M. P. Y.; Mount, A. R.; Walton, A. J. (). „A wafer mapping technique for residual stress in surface micromachined films”. Journal of Micromechanics and Microengineering (în engleză). 26 (9): 095013. Bibcode:2016JMiMi..26i5013S. doi:10.1088/0960-1317/26/9/095013Accesibil gratuit. hdl:20.500.11820/33be8ce1-205b-4483-91d5-69724556d943Accesibil gratuit. ISSN 0960-1317. 

iop.org

stacks.iop.org

  • en Schiavone, G.; Murray, J.; Smith, S.; Desmulliez, M. P. Y.; Mount, A. R.; Walton, A. J. (). „A wafer mapping technique for residual stress in surface micromachined films”. Journal of Micromechanics and Microengineering (în engleză). 26 (9): 095013. Bibcode:2016JMiMi..26i5013S. doi:10.1088/0960-1317/26/9/095013Accesibil gratuit. hdl:20.500.11820/33be8ce1-205b-4483-91d5-69724556d943Accesibil gratuit. ISSN 0960-1317. 

plating.com

upt.ro

mec.upt.ro

utcluj.ro

desen.utcluj.ro

web.archive.org

worldcat.org

  • en Schiavone, G.; Murray, J.; Smith, S.; Desmulliez, M. P. Y.; Mount, A. R.; Walton, A. J. (). „A wafer mapping technique for residual stress in surface micromachined films”. Journal of Micromechanics and Microengineering (în engleză). 26 (9): 095013. Bibcode:2016JMiMi..26i5013S. doi:10.1088/0960-1317/26/9/095013Accesibil gratuit. hdl:20.500.11820/33be8ce1-205b-4483-91d5-69724556d943Accesibil gratuit. ISSN 0960-1317.