Elipsometrija (Slovenian Wikipedia)

Analysis of information sources in references of the Wikipedia article "Elipsometrija" in Slovenian language version.

refsWebsite

Global rank Slovenian rank

2sciencedirect.com

149^th place

140^th place

2^nd place

5^th place

5^th place

10^th place

222^nd place

163^rd place

doi.org

Michaelis idr. (1998). Michaelis, A.; Irene, E. A.; Auciello, O.; Krauss, A. R.; Veal, B. (13. februar 1998), »A spectroscopic anisotropy ellipsometry study of YBa2Cu3O7−x superconductors«, Thin Solid Films, 313–314: 362–367, doi:10.1016/S0040-6090(97)00847-X, ISSN 0040-6090
Jellison (1993) Jellison, G. E. (25. oktober 1993), »Data analysis for spectroscopic ellipsometry«, Thin Solid Films, 234 (1–2): 416–422, doi:10.1016/0040-6090(93)90298-4, ISSN 0040-6090

sciencedirect.com

Michaelis idr. (1998). Michaelis, A.; Irene, E. A.; Auciello, O.; Krauss, A. R.; Veal, B. (13. februar 1998), »A spectroscopic anisotropy ellipsometry study of YBa2Cu3O7−x superconductors«, Thin Solid Films, 313–314: 362–367, doi:10.1016/S0040-6090(97)00847-X, ISSN 0040-6090
Jellison (1993) Jellison, G. E. (25. oktober 1993), »Data analysis for spectroscopic ellipsometry«, Thin Solid Films, 234 (1–2): 416–422, doi:10.1016/0040-6090(93)90298-4, ISSN 0040-6090

wiley.com

onlinelibrary.wiley.com

Fujiwara (2007) Fujiwara, Hiroyuki (2007), Spectroscopic ellipsometry: principles and applications, John Wiley & Sons, ISBN 9780470060193

worldcat.org

Michaelis idr. (1998). Michaelis, A.; Irene, E. A.; Auciello, O.; Krauss, A. R.; Veal, B. (13. februar 1998), »A spectroscopic anisotropy ellipsometry study of YBa2Cu3O7−x superconductors«, Thin Solid Films, 313–314: 362–367, doi:10.1016/S0040-6090(97)00847-X, ISSN 0040-6090
Jellison (1993) Jellison, G. E. (25. oktober 1993), »Data analysis for spectroscopic ellipsometry«, Thin Solid Films, 234 (1–2): 416–422, doi:10.1016/0040-6090(93)90298-4, ISSN 0040-6090