Фотодиода (Serbian Wikipedia)

Analysis of information sources in references of the Wikipedia article "Фотодиода" in Serbian language version.

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5doi.org

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2books.google.com

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2harvard.edu

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2semanticscholar.org

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1mheducation.com

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1pacer.co.uk

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1jqrmag.com

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1sciencedirect.com

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1smecc.org

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1uab.cat

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1elektroniknet.de

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archive.org

Zeller, H.R. (1995). „Cosmic ray induced failures in high power semiconductor devices”. Solid-State Electronics. 38 (12): 2041—2046. Bibcode:1995SSEle..38.2041Z. doi:10.1016/0038-1101(95)00082-5.

arxiv.org

Yin, Zongyou; Li, Hai; Li, Hong; Jiang, Lin; Shi, Yumeng; Sun, Yinghui; Lu, Gang; Zhang, Qing; Chen, Xiaodong; Zhang, Hua (21. 12. 2011). „Single-Layer MoS Phototransistors”. ACS Nano. 6 (1): 74—80. PMID 22165908. S2CID 27038582. arXiv:1310.8066 . doi:10.1021/nn2024557.

books.google.com

Cox, James F. (2001). Fundamentals of linear electronics: integrated and discrete. Cengage Learning. стр. 91—. ISBN 978-0-7668-3018-9.
Häberlin, Heinrich (2012). Photovoltaics: System Design and Practice. John Wiley & Sons. стр. SA3—PA11—14. ISBN 9781119978381. Приступљено 19. 4. 2019.

doi.org

Pearsall, Thomas; Pollack, Martin (1985). Compound Semiconductor Photodiodes, Semiconductors and Semimetals, Vol 22D. Elsevier. стр. 173—245. doi:10.1016/S0080-8784(08)62953-1.
Pérez-Tomás, Amador; Lima, Anderson; Billon, Quentin; Shirley, Ian; Catalan, Gustau; Lira-Cantú, Mónica (2018). „A Solar Transistor and Photoferroelectric Memory”. Advanced Functional Materials (на језику: енглески). 28 (17): 1707099. ISSN 1616-3028. doi:10.1002/adfm.201707099. hdl:10261/199048 .
Zeller, H.R. (1995). „Cosmic ray induced failures in high power semiconductor devices”. Solid-State Electronics. 38 (12): 2041—2046. Bibcode:1995SSEle..38.2041Z. doi:10.1016/0038-1101(95)00082-5.
May, T.C.; Woods, M.H. (1979). „Alpha-particle-induced soft errors in dynamic memories”. IEEE Transactions on Electron Devices. 26 (1): 2—9. Bibcode:1979ITED...26....2M. S2CID 43748644. doi:10.1109/T-ED.1979.19370. Cited in Baumann, R. C. (2004). „Soft errors in commercial integrated circuits”. International Journal of High Speed Electronics and Systems. 14 (2): 299—309. doi:10.1142/S0129156404002363. „alpha particles emitted from the natural radioactive decay of uranium, thorium, and daughter isotopes present as impurities in packaging materials were found to be the dominant cause of [soft error rate] in [dynamic random-access memories].”
Yin, Zongyou; Li, Hai; Li, Hong; Jiang, Lin; Shi, Yumeng; Sun, Yinghui; Lu, Gang; Zhang, Qing; Chen, Xiaodong; Zhang, Hua (21. 12. 2011). „Single-Layer MoS Phototransistors”. ACS Nano. 6 (1): 74—80. PMID 22165908. S2CID 27038582. arXiv:1310.8066 . doi:10.1021/nn2024557.

elektroniknet.de

Erzberger, Arno (2016-06-21). „Halbleitertechnik Der LED fehlt der Doppelpfeil”. Elektronik (на језику: немачки). Архивирано из оригинала 2017-02-14. г. Приступљено 2017-02-14.

handle.net

hdl.handle.net

Pérez-Tomás, Amador; Lima, Anderson; Billon, Quentin; Shirley, Ian; Catalan, Gustau; Lira-Cantú, Mónica (2018). „A Solar Transistor and Photoferroelectric Memory”. Advanced Functional Materials (на језику: енглески). 28 (17): 1707099. ISSN 1616-3028. doi:10.1002/adfm.201707099. hdl:10261/199048 .

harvard.edu

adsabs.harvard.edu

Zeller, H.R. (1995). „Cosmic ray induced failures in high power semiconductor devices”. Solid-State Electronics. 38 (12): 2041—2046. Bibcode:1995SSEle..38.2041Z. doi:10.1016/0038-1101(95)00082-5.
May, T.C.; Woods, M.H. (1979). „Alpha-particle-induced soft errors in dynamic memories”. IEEE Transactions on Electron Devices. 26 (1): 2—9. Bibcode:1979ITED...26....2M. S2CID 43748644. doi:10.1109/T-ED.1979.19370. Cited in Baumann, R. C. (2004). „Soft errors in commercial integrated circuits”. International Journal of High Speed Electronics and Systems. 14 (2): 299—309. doi:10.1142/S0129156404002363. „alpha particles emitted from the natural radioactive decay of uranium, thorium, and daughter isotopes present as impurities in packaging materials were found to be the dominant cause of [soft error rate] in [dynamic random-access memories].”

jqrmag.com

„Jun-ichi Nishizawa - Engineer, Sophia University Special Professor - JAPAN QUALITY REVIEW”. Архивирано из оригинала 2018-07-21. г. Приступљено 2017-05-15.

mheducation.com

Pearsall, Thomas (2010). Photonics Essentials, 2nd edition. McGraw-Hill. ISBN 978-0-07-162935-5. Архивирано из оригинала 2021-08-17. г. Приступљено 2021-02-25.

nih.gov

ncbi.nlm.nih.gov

Yin, Zongyou; Li, Hai; Li, Hong; Jiang, Lin; Shi, Yumeng; Sun, Yinghui; Lu, Gang; Zhang, Qing; Chen, Xiaodong; Zhang, Hua (21. 12. 2011). „Single-Layer MoS Phototransistors”. ACS Nano. 6 (1): 74—80. PMID 22165908. S2CID 27038582. arXiv:1310.8066 . doi:10.1021/nn2024557.

pacer.co.uk

„Photodiode Application Notes – Excelitas – see note 4” (PDF). Архивирано из оригинала (PDF) 2014-11-13. г. Приступљено 2014-11-13.

sciencedirect.com

Pearsall, Thomas; Pollack, Martin (1985). Compound Semiconductor Photodiodes, Semiconductors and Semimetals, Vol 22D. Elsevier. стр. 173—245. doi:10.1016/S0080-8784(08)62953-1.

semanticscholar.org

api.semanticscholar.org

May, T.C.; Woods, M.H. (1979). „Alpha-particle-induced soft errors in dynamic memories”. IEEE Transactions on Electron Devices. 26 (1): 2—9. Bibcode:1979ITED...26....2M. S2CID 43748644. doi:10.1109/T-ED.1979.19370. Cited in Baumann, R. C. (2004). „Soft errors in commercial integrated circuits”. International Journal of High Speed Electronics and Systems. 14 (2): 299—309. doi:10.1142/S0129156404002363. „alpha particles emitted from the natural radioactive decay of uranium, thorium, and daughter isotopes present as impurities in packaging materials were found to be the dominant cause of [soft error rate] in [dynamic random-access memories].”
Yin, Zongyou; Li, Hai; Li, Hong; Jiang, Lin; Shi, Yumeng; Sun, Yinghui; Lu, Gang; Zhang, Qing; Chen, Xiaodong; Zhang, Hua (21. 12. 2011). „Single-Layer MoS Phototransistors”. ACS Nano. 6 (1): 74—80. PMID 22165908. S2CID 27038582. arXiv:1310.8066 . doi:10.1021/nn2024557.

smecc.org

„The phototransistor”. Bell Laboratories Record. мај 1950.

uab.cat

ddd.uab.cat

Pérez-Tomás, Amador; Lima, Anderson; Billon, Quentin; Shirley, Ian; Catalan, Gustau; Lira-Cantú, Mónica (2018). „A Solar Transistor and Photoferroelectric Memory”. Advanced Functional Materials (на језику: енглески). 28 (17): 1707099. ISSN 1616-3028. doi:10.1002/adfm.201707099. hdl:10261/199048 .

web.archive.org

Pearsall, Thomas (2010). Photonics Essentials, 2nd edition. McGraw-Hill. ISBN 978-0-07-162935-5. Архивирано из оригинала 2021-08-17. г. Приступљено 2021-02-25.
„Photodiode Application Notes – Excelitas – see note 4” (PDF). Архивирано из оригинала (PDF) 2014-11-13. г. Приступљено 2014-11-13.
„Jun-ichi Nishizawa - Engineer, Sophia University Special Professor - JAPAN QUALITY REVIEW”. Архивирано из оригинала 2018-07-21. г. Приступљено 2017-05-15.
Erzberger, Arno (2016-06-21). „Halbleitertechnik Der LED fehlt der Doppelpfeil”. Elektronik (на језику: немачки). Архивирано из оригинала 2017-02-14. г. Приступљено 2017-02-14.

wikipedia.org

en.wikipedia.org

Pérez-Tomás, Amador; Lima, Anderson; Billon, Quentin; Shirley, Ian; Catalan, Gustau; Lira-Cantú, Mónica (2018). „A Solar Transistor and Photoferroelectric Memory”. Advanced Functional Materials (на језику: енглески). 28 (17): 1707099. ISSN 1616-3028. doi:10.1002/adfm.201707099. hdl:10261/199048 .

worldcat.org

Pérez-Tomás, Amador; Lima, Anderson; Billon, Quentin; Shirley, Ian; Catalan, Gustau; Lira-Cantú, Mónica (2018). „A Solar Transistor and Photoferroelectric Memory”. Advanced Functional Materials (на језику: енглески). 28 (17): 1707099. ISSN 1616-3028. doi:10.1002/adfm.201707099. hdl:10261/199048 .