May, T.C.; Woods, M.H. (1979). „Alpha-particle-induced soft errors in dynamic memories”. IEEE Transactions on Electron Devices. 26 (1): 2—9. Bibcode:1979ITED...26....2M. S2CID43748644. doi:10.1109/T-ED.1979.19370. Cited in Baumann, R. C. (2004). „Soft errors in commercial integrated circuits”. International Journal of High Speed Electronics and Systems. 14 (2): 299—309. doi:10.1142/S0129156404002363. „alpha particles emitted from the natural radioactive decay of uranium, thorium, and daughter isotopes present as impurities in packaging materials were found to be the dominant cause of [soft error rate] in [dynamic random-access memories].”
May, T.C.; Woods, M.H. (1979). „Alpha-particle-induced soft errors in dynamic memories”. IEEE Transactions on Electron Devices. 26 (1): 2—9. Bibcode:1979ITED...26....2M. S2CID43748644. doi:10.1109/T-ED.1979.19370. Cited in Baumann, R. C. (2004). „Soft errors in commercial integrated circuits”. International Journal of High Speed Electronics and Systems. 14 (2): 299—309. doi:10.1142/S0129156404002363. „alpha particles emitted from the natural radioactive decay of uranium, thorium, and daughter isotopes present as impurities in packaging materials were found to be the dominant cause of [soft error rate] in [dynamic random-access memories].”
May, T.C.; Woods, M.H. (1979). „Alpha-particle-induced soft errors in dynamic memories”. IEEE Transactions on Electron Devices. 26 (1): 2—9. Bibcode:1979ITED...26....2M. S2CID43748644. doi:10.1109/T-ED.1979.19370. Cited in Baumann, R. C. (2004). „Soft errors in commercial integrated circuits”. International Journal of High Speed Electronics and Systems. 14 (2): 299—309. doi:10.1142/S0129156404002363. „alpha particles emitted from the natural radioactive decay of uranium, thorium, and daughter isotopes present as impurities in packaging materials were found to be the dominant cause of [soft error rate] in [dynamic random-access memories].”