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Hornyak, G. L.; Peschel, St.; Sawitowski, Th.; Schmid, G. (1998-04-01). ”TEM, STM and AFM as tools to study clusters and colloids”. Micron 29 (2): sid. 183–190. doi:10.1016/S0968-4328(97)00058-9. ISSN0968-4328.
Zhang, Hang; Huang, Junxiang; Wang, Yongwei; Liu, Rui; Huai, Xiulan; Jiang, Jingjing; Anfuso, Chantelle (2018-01-01). ”Atomic force microscopy for two-dimensional materials: A tutorial review”. Optics Communications. Optoelectronics and Photonics Based on Two-dimensional Materials 406: sid. 3–17. doi:10.1016/j.optcom.2017.05.015. ISSN0030-4018.
Detavernier, Christophe; Dendooven, Jolien; Sree, Sreeprasanth Pulinthanathu; Ludwig, Karl F.; Martens, Johan A. (2011-10-17). ”Tailoring nanoporous materials by atomic layer deposition”. Chemical Society Reviews 40 (11): sid. 5242–5253. doi:10.1039/C1CS15091J. ISSN1460-4744. PMID 21695333.
Xie, Qi; Deng, Shaoren; Schaekers, Marc; Lin, Dennis; Caymax, Matty; Delabie, Annelies; Qu, Xin-Ping; Jiang, Yu-Long; et al. (2012-06-22). ”Germanium surface passivation and atomic layer deposition of high-kdielectrics—a tutorial review on Ge-based MOS capacitors”. Semiconductor Science and Technology 27 (7): sid. 074012. doi:10.1088/0268-1242/27/7/074012. ISSN0268-1242.