அணுவிசை நுண்ணோக்கி (Tamil Wikipedia)

Analysis of information sources in references of the Wikipedia article "அணுவிசை நுண்ணோக்கி" in Tamil language version.

refsWebsite

Global rank Tamil rank

2^nd place

4^th place

4^th place

5^th place

1afmworkshop.com

low place

low place

18^th place

39^th place

1uni-regensburg.de

low place

9,034^th place

afmworkshop.com (Global: low place; Tamil: low place)

"Measuring and Analyzing Force-Distance Curves with Atomic Force Microscopy". afmworkshop.com. https://www.afmworkshop.com/images/news2019/01/Measuring-and-understanding-force-distance-curves-v2.pdf.

doi.org (Global: 2^nd place; Tamil: 4^th place)

dx.doi.org

Ohnesorge, Frank (1 January 1993). "True atomic resolution by atomic force microscopy through repulsive and attractive forces". Science 260 (5113): 1451–6. doi:10.1126/science.260.5113.1451. பப்மெட்:17739801. Bibcode: 1993Sci...260.1451O.
Giessibl, Franz (1 January 1996). "Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy". Science 267 (5194): 68–71. doi:10.1126/science.267.5194.68. பப்மெட்:17840059. https://epub.uni-regensburg.de/33828/1/Atomic%20Resolution%20of%20the%20Silicon%20%28111%29-%287x7%29%20Surface%20by.pdf.

harvard.edu (Global: 18^th place; Tamil: 39^th place)

adsabs.harvard.edu

Ohnesorge, Frank (1 January 1993). "True atomic resolution by atomic force microscopy through repulsive and attractive forces". Science 260 (5113): 1451–6. doi:10.1126/science.260.5113.1451. பப்மெட்:17739801. Bibcode: 1993Sci...260.1451O.

nih.gov (Global: 4^th place; Tamil: 5^th place)

ncbi.nlm.nih.gov

Ohnesorge, Frank (1 January 1993). "True atomic resolution by atomic force microscopy through repulsive and attractive forces". Science 260 (5113): 1451–6. doi:10.1126/science.260.5113.1451. பப்மெட்:17739801. Bibcode: 1993Sci...260.1451O.
Giessibl, Franz (1 January 1996). "Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy". Science 267 (5194): 68–71. doi:10.1126/science.267.5194.68. பப்மெட்:17840059. https://epub.uni-regensburg.de/33828/1/Atomic%20Resolution%20of%20the%20Silicon%20%28111%29-%287x7%29%20Surface%20by.pdf.

uni-regensburg.de (Global: low place; Tamil: 9,034^th place)

epub.uni-regensburg.de

Giessibl, Franz (1 January 1996). "Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy". Science 267 (5194): 68–71. doi:10.1126/science.267.5194.68. பப்மெட்:17840059. https://epub.uni-regensburg.de/33828/1/Atomic%20Resolution%20of%20the%20Silicon%20%28111%29-%287x7%29%20Surface%20by.pdf.