Lohrmann, A.; Castelletto, S.; Klein, J. R.; Ohshima, T.; Bosi, M.; Negri, M.; Lau, D. W. M.; Gibson, B. C.; Prawer, S.; McCallum, J. C.; Johnson, B. C. (2016). Activation and control of visible single defects in 4H-, 6H-, and 3C-SiC by oxidation. Applied Physics Letters. 108 (2): 021107. Bibcode:2016ApPhL.108b1107L. doi:10.1063/1.4939906.
Al-Kathiri, S.; Al-Khateeb, W.; Hafizulfika, M.; Wahiddin, M. R.; Saharudin, S. (May 2008). Characterization of mean photon number for key distribution system using faint laser. 2008 International Conference on Computer and Communication Engineering: 1237—1242. doi:10.1109/ICCCE.2008.4580803. ISBN978-1-4244-1691-2. S2CID18300454.
Lohrmann, A.; Castelletto, S.; Klein, J. R.; Ohshima, T.; Bosi, M.; Negri, M.; Lau, D. W. M.; Gibson, B. C.; Prawer, S.; McCallum, J. C.; Johnson, B. C. (2016). Activation and control of visible single defects in 4H-, 6H-, and 3C-SiC by oxidation. Applied Physics Letters. 108 (2): 021107. Bibcode:2016ApPhL.108b1107L. doi:10.1063/1.4939906.
Al-Kathiri, S.; Al-Khateeb, W.; Hafizulfika, M.; Wahiddin, M. R.; Saharudin, S. (May 2008). Characterization of mean photon number for key distribution system using faint laser. 2008 International Conference on Computer and Communication Engineering: 1237—1242. doi:10.1109/ICCCE.2008.4580803. ISBN978-1-4244-1691-2. S2CID18300454.