Технологія виробництва напівпровідників (Ukrainian Wikipedia)

Analysis of information sources in references of the Wikipedia article "Технологія виробництва напівпровідників" in Ukrainian language version.

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  • Purwins, Hendrik; Barak, Bernd; Nagi, Ahmed; Engel, Reiner; Höckele, Uwe; Kyek, Andreas; Cherla, Srikanth; Lenz, Benjamin; Pfeifer, Günter (2014-02). Regression Methods for Virtual Metrology of Layer Thickness in Chemical Vapor Deposition. IEEE/ASME Transactions on Mechatronics. Т. 19, № 1. с. 1—8. doi:10.1109/TMECH.2013.2273435. ISSN 1941-014X. Процитовано 25 березня 2023.
  • Fuechsle, M.; Miwa, J. A.; Mahapatra, S.; Ryu, H.; Lee, S.; Warschkow, O.; Hollenberg, L. C. L.; Klimeck, G.; Simmons, M. Y. (2012). A single-atom transistor. Nature Nanotechnology. 7 (4): 242. doi:10.1038/nnano.2012.21.
  • Jagannathan, H. та ін. (2021). Vertical-Transport Nanosheet Technology for CMOS Scaling beyond Lateral-Transport Devices. 2021 IEEE International Electron Devices Meeting (IEDM). с. 26.1.1–26.1.4. doi:10.1109/IEDM19574.2021.9720561. ISBN 978-1-6654-2572-8. S2CID 247321213.

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  • Purwins, Hendrik; Barak, Bernd; Nagi, Ahmed; Engel, Reiner; Höckele, Uwe; Kyek, Andreas; Cherla, Srikanth; Lenz, Benjamin; Pfeifer, Günter (2014-02). Regression Methods for Virtual Metrology of Layer Thickness in Chemical Vapor Deposition. IEEE/ASME Transactions on Mechatronics. Т. 19, № 1. с. 1—8. doi:10.1109/TMECH.2013.2273435. ISSN 1941-014X. Процитовано 25 березня 2023.
  • Jagannathan, H. та ін. (2021). Vertical-Transport Nanosheet Technology for CMOS Scaling beyond Lateral-Transport Devices. 2021 IEEE International Electron Devices Meeting (IEDM). с. 26.1.1–26.1.4. doi:10.1109/IEDM19574.2021.9720561. ISBN 978-1-6654-2572-8. S2CID 247321213.

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  • Purwins, Hendrik; Barak, Bernd; Nagi, Ahmed; Engel, Reiner; Höckele, Uwe; Kyek, Andreas; Cherla, Srikanth; Lenz, Benjamin; Pfeifer, Günter (2014-02). Regression Methods for Virtual Metrology of Layer Thickness in Chemical Vapor Deposition. IEEE/ASME Transactions on Mechatronics. Т. 19, № 1. с. 1—8. doi:10.1109/TMECH.2013.2273435. ISSN 1941-014X. Процитовано 25 березня 2023.