Phổ tổn hao năng lượng điện tử (Vietnamese Wikipedia)

Analysis of information sources in references of the Wikipedia article "Phổ tổn hao năng lượng điện tử" in Vietnamese language version.

refsWebsite

Global rank Vietnamese rank

2,204^th place

810^th place

1sciencedirect.com

149^th place

167^th place

aip.org

link.aip.org

J. Hillier and R. F. Baker, Microanalysis by Means of Electrons, J. Appl. Phys. 15 (1940) 663-675.^{[liên kết hỏng]}

sciencedirect.com

A.J. Craven, M. MacKenzie, D.W. McComb, F.T. Docherty, Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy, Microelec. Eng. 80 (2005) 90-97.