多层单元 (Chinese Wikipedia)

Analysis of information sources in references of the Wikipedia article "多层单元" in Chinese language version.

refsWebsite

Global rank Chinese rank

9web.archive.org

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1^st place

3,722^nd place

2,427^th place

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6,671^st place

2,554^th place

1,743^rd place

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1,383^rd place

902^nd place

5,990^th place

4,780^th place

anandtech.com

Samsung SSD 840: Testing the Endurance of TLC NAND. AnandTech. 2012-11-16 [2014-04-05]. （原始内容存档于2014-04-03）.

edn.com

"Automotive EEPROMs use two cells per bit for ruggedness, reliability" （页面存档备份，存于互联网档案馆） by Graham Prophet 2008-10-02

eetimes.com

A Tour of the Basics of Embedded NAND Flash Options （页面存档备份，存于互联网档案馆） EE Times 2013-08-27
NAND Flash - The New Era of 4 bit per cell and Beyond （页面存档备份，存于互联网档案馆） EE Times 2009-05-05

lsi.com

SandForce SF-2600/SF-2500 Product Info （页面存档备份，存于互联网档案馆） 2013-10-22

micron.com

Micron's MLC NAND Flash Webinar. [2017-01-25]. （原始内容存档于2007-07-22）.

samsung.com

Samsung SSD 840 Series - 3BIT/MLC NAND Flash. [2017-01-25]. （原始内容存档于2013-04-10）.

sandisk.com

SanDisk Ships World’s First Flash Memory Cards with 64 Gigabit X4 (4-Bits-Per-Cell) NAND Flash Technology. [2017-01-25]. （原始内容存档于2015-02-27）.

usenix.org

Bianca Schroeder and Arif Merchant. Flash Reliability in Production: The Expected and the Unexpected. Usenix. February 22, 2016 [November 3, 2016]. （原始内容存档于2017-01-08）.

web.archive.org

Micron's MLC NAND Flash Webinar. [2017-01-25]. （原始内容存档于2007-07-22）.
SandForce SF-2600/SF-2500 Product Info （页面存档备份，存于互联网档案馆） 2013-10-22
A Tour of the Basics of Embedded NAND Flash Options （页面存档备份，存于互联网档案馆） EE Times 2013-08-27
"Automotive EEPROMs use two cells per bit for ruggedness, reliability" （页面存档备份，存于互联网档案馆） by Graham Prophet 2008-10-02
Samsung SSD 840 Series - 3BIT/MLC NAND Flash. [2017-01-25]. （原始内容存档于2013-04-10）.
SanDisk Ships World’s First Flash Memory Cards with 64 Gigabit X4 (4-Bits-Per-Cell) NAND Flash Technology. [2017-01-25]. （原始内容存档于2015-02-27）.
NAND Flash - The New Era of 4 bit per cell and Beyond （页面存档备份，存于互联网档案馆） EE Times 2009-05-05
Samsung SSD 840: Testing the Endurance of TLC NAND. AnandTech. 2012-11-16 [2014-04-05]. （原始内容存档于2014-04-03）.
Bianca Schroeder and Arif Merchant. Flash Reliability in Production: The Expected and the Unexpected. Usenix. February 22, 2016 [November 3, 2016]. （原始内容存档于2017-01-08）.