电子能量损失谱 (Chinese Wikipedia)

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Hillier, J.; Baker, R.F. Microanalysis by means of electrons. J. Appl. Phys. 1944, 15 (9): 663–675. Bibcode:1944JAP....15..663H. doi:10.1063/1.1707491.
Ahn C C (ed.) (2004) Transmission electron energy loss spectrometry in material science and the EELS Atlas, Wiley, Weinheim, Germany, doi:10.1002/3527605495, ISBN 3527405658
Riedl, T.; T. Gemming; W. Gruner; J. Acker; K. Wetzig. Determination of manganese valency in La1−xSrxMnO3 using ELNES in the (S)TEM. Micron. April 2007, 38 (3): 224–230. doi:10.1016/j.micron.2006.06.017.
Iakoubovskii, K.; Mitsuishi, K.; Nakayama, Y.; Furuya, K. Thickness measurements with electron energy loss spectroscopy (PDF). Microscopy Research and Technique. 2008, 71 (8): 626–31 [2017-03-15]. PMID 18454473. doi:10.1002/jemt.20597. （原始内容存档 (PDF)于2017-09-22）.
Iakoubovskii, Konstantin; Mitsuishi, Kazutaka; Nakayama, Yoshiko; Furuya, Kazuo. Mean free path of inelastic electron scattering in elemental solids and oxides using transmission electron microscopy: Atomic number dependent oscillatory behavior (PDF). Physical Review B. 2008, 77 (10) [2017-03-15]. Bibcode:2008PhRvB..77j4102I. doi:10.1103/PhysRevB.77.104102. （原始内容存档 (PDF)于2016-03-03）.

Iakoubovskii, K.; Mitsuishi, K.; Nakayama, Y.; Furuya, K. Thickness measurements with electron energy loss spectroscopy (PDF). Microscopy Research and Technique. 2008, 71 (8): 626–31 [2017-03-15]. PMID 18454473. doi:10.1002/jemt.20597. （原始内容存档 (PDF)于2017-09-22）.

Iakoubovskii, K.; Mitsuishi, K.; Nakayama, Y.; Furuya, K. Thickness measurements with electron energy loss spectroscopy (PDF). Microscopy Research and Technique. 2008, 71 (8): 626–31 [2017-03-15]. PMID 18454473. doi:10.1002/jemt.20597. （原始内容存档 (PDF)于2017-09-22）.
Iakoubovskii, Konstantin; Mitsuishi, Kazutaka; Nakayama, Yoshiko; Furuya, Kazuo. Mean free path of inelastic electron scattering in elemental solids and oxides using transmission electron microscopy: Atomic number dependent oscillatory behavior (PDF). Physical Review B. 2008, 77 (10) [2017-03-15]. Bibcode:2008PhRvB..77j4102I. doi:10.1103/PhysRevB.77.104102. （原始内容存档 (PDF)于2016-03-03）.

What is EELS? | EELS.info. [2017-05-25]. （原始内容存档于2017-05-16）（英语）.
Iakoubovskii, K.; Mitsuishi, K.; Nakayama, Y.; Furuya, K. Thickness measurements with electron energy loss spectroscopy (PDF). Microscopy Research and Technique. 2008, 71 (8): 626–31 [2017-03-15]. PMID 18454473. doi:10.1002/jemt.20597. （原始内容存档 (PDF)于2017-09-22）.
Iakoubovskii, Konstantin; Mitsuishi, Kazutaka; Nakayama, Yoshiko; Furuya, Kazuo. Mean free path of inelastic electron scattering in elemental solids and oxides using transmission electron microscopy: Atomic number dependent oscillatory behavior (PDF). Physical Review B. 2008, 77 (10) [2017-03-15]. Bibcode:2008PhRvB..77j4102I. doi:10.1103/PhysRevB.77.104102. （原始内容存档 (PDF)于2016-03-03）.