Y. Martin and K. Wickramasinghe. Magnetic Imaging by Force Microscopy with 1000A Resolution. Appl. Phys. Lett. 1987, 50 (20): 1455–1457. Bibcode:1987ApPhL..50.1455M. doi:10.1063/1.97800.
L. Gao, L.P. Yue, T. Yokota; et al. Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images. IEEE Transactions on Magnetics. 2004, 40 (4): 2194–2196. Bibcode:2004ITM....40.2194G. doi:10.1109/TMAG.2004.829173. 引文格式1维护:显式使用等标签 (link)
A. Winkler, T. Mühl, S. Menzel; et al. Magnetic Force Microscopy Sensors using Iron-filled Carbon Nanotubes. J. Appl. Phys. 2006, 99 (10): 104905. Bibcode:2006JAP....99j4905W. doi:10.1063/1.2195879. 引文格式1维护:显式使用等标签 (link)
K. Tanaka, M. Yoshimura, and K. Ueda. High-Resolution Magnetic Force Microscopy Using Carbon Nanotube Probes Fabricated Directly by Microwave Plasma-Enhanced Chemical Vapor Deposition. J. NanoMaterials. 2009, 2009: 147204. doi:10.1155/2009/147204.
Y. Martin and K. Wickramasinghe. Magnetic Imaging by Force Microscopy with 1000A Resolution. Appl. Phys. Lett. 1987, 50 (20): 1455–1457. Bibcode:1987ApPhL..50.1455M. doi:10.1063/1.97800.
L. Gao, L.P. Yue, T. Yokota; et al. Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images. IEEE Transactions on Magnetics. 2004, 40 (4): 2194–2196. Bibcode:2004ITM....40.2194G. doi:10.1109/TMAG.2004.829173. 引文格式1维护:显式使用等标签 (link)
A. Winkler, T. Mühl, S. Menzel; et al. Magnetic Force Microscopy Sensors using Iron-filled Carbon Nanotubes. J. Appl. Phys. 2006, 99 (10): 104905. Bibcode:2006JAP....99j4905W. doi:10.1063/1.2195879. 引文格式1维护:显式使用等标签 (link)