磁力顯微鏡 (Chinese Wikipedia)

Analysis of information sources in references of the Wikipedia article "磁力顯微鏡" in Chinese language version.

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164.67.193.121

I. Alvarado, "Procedure to Perform Magnetic Force Microscopy (MFM) with VEECO Dimension 3100 AFM" 互联网档案馆的存檔，存档日期2011-05-29., NRF, 2006

archive.org

L. Abelmann, S. Porthun; et al. Comparing the resolution of magnetic force microscopes using the CAMST reference samples. J. Magn. Magn. Mater. 1998, 190: 135–147. Bibcode:1998JMMM..190..135A. doi:10.1016/S0304-8853(98)00281-9.

azom.com

History of Probing Methods. [2011-12-01]. （原始内容存档于2008-08-06）.

books.google.com

D. Jiles. 15. Introduction to Magnetism and Magnetic Materials 2. Springer. 1998. ISBN 3540401865.

caltech.edu

mechmat.caltech.edu

Magnetic Force Microscopy 互联网档案馆的存檔，存档日期2011-07-19.

doi.org

dx.doi.org

L. Abelmann, S. Porthun; et al. Comparing the resolution of magnetic force microscopes using the CAMST reference samples. J. Magn. Magn. Mater. 1998, 190: 135–147. Bibcode:1998JMMM..190..135A. doi:10.1016/S0304-8853(98)00281-9.
Y. Martin and K. Wickramasinghe. Magnetic Imaging by Force Microscopy with 1000A Resolution. Appl. Phys. Lett. 1987, 50 (20): 1455–1457. Bibcode:1987ApPhL..50.1455M. doi:10.1063/1.97800.
U. Hartmann. Magnetic Force Microscopy. Annu. Rev. Mater. Sci. 1999, 29: 53–87. Bibcode:1999AnRMS..29...53H. doi:10.1146/annurev.matsci.29.1.53.
L. Gao, L.P. Yue, T. Yokota; et al. Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images. IEEE Transactions on Magnetics. 2004, 40 (4): 2194–2196. Bibcode:2004ITM....40.2194G. doi:10.1109/TMAG.2004.829173.
A. Winkler, T. Mühl, S. Menzel; et al. Magnetic Force Microscopy Sensors using Iron-filled Carbon Nanotubes. J. Appl. Phys. 2006, 99 (10): 104905. Bibcode:2006JAP....99j4905W. doi:10.1063/1.2195879.
K. Tanaka, M. Yoshimura, and K. Ueda. High-Resolution Magnetic Force Microscopy Using Carbon Nanotube Probes Fabricated Directly by Microwave Plasma-Enhanced Chemical Vapor Deposition. J. NanoMaterials. 2009, 2009: 147204. doi:10.1155/2009/147204.

harvard.edu

ui.adsabs.harvard.edu

L. Abelmann, S. Porthun; et al. Comparing the resolution of magnetic force microscopes using the CAMST reference samples. J. Magn. Magn. Mater. 1998, 190: 135–147. Bibcode:1998JMMM..190..135A. doi:10.1016/S0304-8853(98)00281-9.
Y. Martin and K. Wickramasinghe. Magnetic Imaging by Force Microscopy with 1000A Resolution. Appl. Phys. Lett. 1987, 50 (20): 1455–1457. Bibcode:1987ApPhL..50.1455M. doi:10.1063/1.97800.
U. Hartmann. Magnetic Force Microscopy. Annu. Rev. Mater. Sci. 1999, 29: 53–87. Bibcode:1999AnRMS..29...53H. doi:10.1146/annurev.matsci.29.1.53.
L. Gao, L.P. Yue, T. Yokota; et al. Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images. IEEE Transactions on Magnetics. 2004, 40 (4): 2194–2196. Bibcode:2004ITM....40.2194G. doi:10.1109/TMAG.2004.829173.
A. Winkler, T. Mühl, S. Menzel; et al. Magnetic Force Microscopy Sensors using Iron-filled Carbon Nanotubes. J. Appl. Phys. 2006, 99 (10): 104905. Bibcode:2006JAP....99j4905W. doi:10.1063/1.2195879.

nanoscan.ch

Nanoscan AG, Quantum Leap in Hard Disk Technology. [2011-12-01]. （原始内容存档于2011-10-07）.

northwestern.edu

nuance.northwestern.edu

Magnetic Force Microscopy (MFM) manual 互联网档案馆的存檔，存档日期2010-06-06.

web.archive.org

Nanoscan AG, Quantum Leap in Hard Disk Technology. [2011-12-01]. （原始内容存档于2011-10-07）.
Magnetic Force Microscopy 互联网档案馆的存檔，存档日期2011-07-19.
History of Probing Methods. [2011-12-01]. （原始内容存档于2008-08-06）.
Magnetic Force Microscopy (MFM) manual 互联网档案馆的存檔，存档日期2010-06-06.
I. Alvarado, "Procedure to Perform Magnetic Force Microscopy (MFM) with VEECO Dimension 3100 AFM" 互联网档案馆的存檔，存档日期2011-05-29., NRF, 2006