Accelerated life testing (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Accelerated life testing" in English language version.

refsWebsite

Global rank English rank

8doi.org

2^nd place

6semanticscholar.org

11^th place

8^th place

3worldcat.org

5^th place

2dfrsolutions.com

low place

2nist.gov

355^th place

454^th place

1sandia.gov

low place

dfrsolutions.com (Global: low place; English: low place)

Test Plan Development: How To Do It, G. Sharon, November 19, 2015, https://www.dfrsolutions.com/resources/test-plan-development-how-to-do-it
Temperature and Humidity Acceleration Factors on MLV Lifetime, G. Caswell, https://www.dfrsolutions.com/hubfs/Resources/services/Temperature-and-Humidity-Acceleration-Factors-on-MLV-Lifetime.pdf?t=1514473946162

doi.org (Global: 2^nd place; English: 2^nd place)

Nelson, W. (1980). "Accelerated Life Testing - Step-Stress Models and Data Analyses". IEEE Transactions on Reliability (2): 103. doi:10.1109/TR.1980.5220742. S2CID 35734439.
Spencer, F. W. (1991). "Statistical Methods in Accelerated Life Testing". Technometrics. 33 (3): 360–362. doi:10.1080/00401706.1991.10484846.
Donahoe, D.; Zhao, K.; Murray, S.; Ray, R. M. (2008). "Accelerated Life Testing". Encyclopedia of Quantitative Risk Analysis and Assessment. doi:10.1002/9780470061596.risk0452. ISBN 9780470035498. S2CID 86534403.
Elsayed, E. A. (2003). "Accelerated Life Testing". Handbook of Reliability Engineering. pp. 415–428. doi:10.1007/1-85233-841-5_22. ISBN 978-1-85233-453-6.
Herrmann, W.; Bogdanski, N. (2011-06-01). "Outdoor weathering of PV modules — Effects of various climates and comparison with accelerated laboratory testing". 2011 37th IEEE Photovoltaic Specialists Conference. pp. 002305–002311. doi:10.1109/PVSC.2011.6186415. ISBN 978-1-4244-9965-6. S2CID 20511202.
Srivastava, P.W.; Shukla, R. (2008-09-01). "A Log-Logistic Step-Stress Model". IEEE Transactions on Reliability. 57 (3): 431–434. doi:10.1109/TR.2008.928182. ISSN 0018-9529. S2CID 20244594.^{[dead link]}
Wang, Ronghua; Sha, Naijun; Gu, Beiqing; Xu, Xiaoling (2012-06-01). "Comparison Analysis of Efficiency for Step-Down and Step-Up Stress Accelerated Life Testing". IEEE Transactions on Reliability. 61 (2): 590–603. doi:10.1109/TR.2012.2182816. ISSN 0018-9529. S2CID 5903153.
Nelson, Wayne (1980-06-01). "Accelerated Life Testing - Step-Stress Models and Data Analyses". IEEE Transactions on Reliability. R-29 (2): 103–108. doi:10.1109/TR.1980.5220742. ISSN 0018-9529. S2CID 35734439.^{[dead link]}

nist.gov (Global: 355^th place; English: 454^th place)

itl.nist.gov

"8.3.1.4. Accelerated life tests". www.itl.nist.gov. Retrieved 2015-10-20.
"8.1.6. What are the basic lifetime distribution models used for non-repairable populations?". www.itl.nist.gov. Retrieved 2015-10-20.

sandia.gov (Global: low place; English: low place)

energy.sandia.gov

Sorensen, Rob (May 28, 2010). "Accelerated Life Testing" (PDF). Sandia National Laboratories. Retrieved October 20, 2015.

semanticscholar.org (Global: 11^th place; English: 8^th place)

api.semanticscholar.org

Nelson, W. (1980). "Accelerated Life Testing - Step-Stress Models and Data Analyses". IEEE Transactions on Reliability (2): 103. doi:10.1109/TR.1980.5220742. S2CID 35734439.
Donahoe, D.; Zhao, K.; Murray, S.; Ray, R. M. (2008). "Accelerated Life Testing". Encyclopedia of Quantitative Risk Analysis and Assessment. doi:10.1002/9780470061596.risk0452. ISBN 9780470035498. S2CID 86534403.
Herrmann, W.; Bogdanski, N. (2011-06-01). "Outdoor weathering of PV modules — Effects of various climates and comparison with accelerated laboratory testing". 2011 37th IEEE Photovoltaic Specialists Conference. pp. 002305–002311. doi:10.1109/PVSC.2011.6186415. ISBN 978-1-4244-9965-6. S2CID 20511202.
Srivastava, P.W.; Shukla, R. (2008-09-01). "A Log-Logistic Step-Stress Model". IEEE Transactions on Reliability. 57 (3): 431–434. doi:10.1109/TR.2008.928182. ISSN 0018-9529. S2CID 20244594.^{[dead link]}
Wang, Ronghua; Sha, Naijun; Gu, Beiqing; Xu, Xiaoling (2012-06-01). "Comparison Analysis of Efficiency for Step-Down and Step-Up Stress Accelerated Life Testing". IEEE Transactions on Reliability. 61 (2): 590–603. doi:10.1109/TR.2012.2182816. ISSN 0018-9529. S2CID 5903153.
Nelson, Wayne (1980-06-01). "Accelerated Life Testing - Step-Stress Models and Data Analyses". IEEE Transactions on Reliability. R-29 (2): 103–108. doi:10.1109/TR.1980.5220742. ISSN 0018-9529. S2CID 35734439.^{[dead link]}

worldcat.org (Global: 5^th place; English: 5^th place)

search.worldcat.org

Srivastava, P.W.; Shukla, R. (2008-09-01). "A Log-Logistic Step-Stress Model". IEEE Transactions on Reliability. 57 (3): 431–434. doi:10.1109/TR.2008.928182. ISSN 0018-9529. S2CID 20244594.^{[dead link]}
Wang, Ronghua; Sha, Naijun; Gu, Beiqing; Xu, Xiaoling (2012-06-01). "Comparison Analysis of Efficiency for Step-Down and Step-Up Stress Accelerated Life Testing". IEEE Transactions on Reliability. 61 (2): 590–603. doi:10.1109/TR.2012.2182816. ISSN 0018-9529. S2CID 5903153.
Nelson, Wayne (1980-06-01). "Accelerated Life Testing - Step-Stress Models and Data Analyses". IEEE Transactions on Reliability. R-29 (2): 103–108. doi:10.1109/TR.1980.5220742. ISSN 0018-9529. S2CID 35734439.^{[dead link]}