Electrical resistivity and conductivity (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Electrical resistivity and conductivity" in English language version.

refsWebsite
Global rank English rank
2nd place
2nd place
3rd place
3rd place
1st place
1st place
18th place
17th place
6th place
6th place
5th place
5th place
low place
low place
4th place
4th place
5,064th place
5,340th place
670th place
480th place
low place
low place
7,864th place
5,684th place
low place
low place
low place
low place
305th place
264th place
887th place
714th place
75th place
83rd place
11th place
8th place
low place
low place
low place
low place
low place
low place
low place
low place
low place
low place
low place
low place
1,911th place
1,817th place
8,830th place
8,644th place
1,983rd place
1,330th place
low place
low place
low place
7,132nd place
222nd place
297th place
low place
low place
446th place
308th place

archive.org

archives.gov

founders.archives.gov

  • Franklin, Benjamin (1978) [1774]. "From Benjamin Franklin to Jan Ingenhousz, 18 March 1774". In Willcox, William B. (ed.). The Papers of Benjamin Franklin. Vol. 21, January 1, 1774, through March 22, 1775. Yale University Press. pp. 147–149 – via Founders Online, National Archives.

bldrdoc.gov

library.bldrdoc.gov

books.google.com

  • Lowrie, William (2007). Fundamentals of Geophysics. Cambridge University Press. pp. 254–55. ISBN 978-05-2185-902-8. Retrieved March 24, 2019.
  • Kumar, Narinder (2003). Comprehensive Physics for Class XII. New Delhi: Laxmi Publications. pp. 280–84. ISBN 978-81-7008-592-8. Retrieved March 24, 2019.
  • Bogatin, Eric (2004). Signal Integrity: Simplified. Prentice Hall Professional. p. 114. ISBN 978-0-13-066946-9. Retrieved March 24, 2019.
  • John C. Gallop (1990). SQUIDS, the Josephson Effects and Superconducting Electronics. CRC Press. pp. 3, 20. ISBN 978-0-7503-0051-3.
  • Bittencourt, J.A. (2004). Fundamentals of Plasma Physics. Springer. p. 1. ISBN 9780387209753.
  • Eranna, Golla (2014). Crystal Growth and Evaluation of Silicon for VLSI and ULSI. CRC Press. p. 7. ISBN 978-1-4822-3281-3.

caltech.edu

feynmanlectures.caltech.edu

cam.ac.uk

damtp.cam.ac.uk

cambridge.org

copper.org

  • [1]. (Calculated as "56% conductivity of pure copper" (5.96E-7)). Retrieved on 2023-1-12.
  • [2]. (Calculated as "28% conductivity of pure copper" (5.96E-7)). Retrieved on 2023-1-12.
  • [3]. (Calculated as "15% conductivity of pure copper" (5.96E-7)). Retrieved on 2023-1-12.

doi.org

dummies.com

electronics-notes.com

gsu.edu

hyperphysics.phy-astr.gsu.edu

harvard.edu

ui.adsabs.harvard.edu

hypertextbook.com

jfe-steel.co.jp

jlab.org

education.jlab.org

lenntech.com

matweb.com

metu.edu.tr

csl.mete.metu.edu.tr

  • "Electromigration : What is electromigration?". Middle East Technical University. Retrieved 31 July 2017. When electrons are conducted through a metal, they interact with imperfections in the lattice and scatter. […] Thermal energy produces scattering by causing atoms to vibrate. This is the source of resistance of metals.

mipt.ru

physics.mipt.ru

nasa.gov

nih.gov

pubmed.ncbi.nlm.nih.gov

ncbi.nlm.nih.gov

npl.co.uk

kayelaby.npl.co.uk

physicsclassroom.com

plansee.com

semanticscholar.org

api.semanticscholar.org

semiwiki.com

stackexchange.com

chemistry.stackexchange.com

  • [4]. chemistry.stackexchange.com

transmission-line.net

web.archive.org

wiley.com

onlinelibrary.wiley.com

worldcat.org