Lattice constant (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Lattice constant" in English language version.

refsWebsite

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6doi.org

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4harvard.edu

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2worldcat.org

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1web.archive.org

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1cam.ac.uk

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1fast-page.org

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1arxiv.org

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1semanticscholar.org

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1csic.es

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1anl.gov

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1rssi.ru

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1nist.gov

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12spi.com

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1ias.ac.in

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1springermaterials.com

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2spi.com

"Substrates". Spi Supplies. Retrieved 17 May 2017.

anl.gov

7id.xray.aps.anl.gov

"Lattice Constants". Argon National Labs (Advanced Photon Source). Retrieved 19 October 2014.

arxiv.org

R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode". Applied Surface Science. 470. Netherlands: Elsevier B. V.: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119191299.

cam.ac.uk

ccdc.cam.ac.uk

"Unit cell definition using parallelepiped with lengths a, b, c and angles between the sides given by α, β, γ". Archived from the original on 4 October 2008.

csic.es

xtal.iqfr.csic.es

Dept. of Crystallography & Struc. Biol. CSIC (4 June 2015). "4. Direct and reciprocal lattices". Retrieved 9 June 2015.

doi.org

Francisco Colmenero (2019): "Negative area compressibility in oxalic acid dihydrate". Materials Letters, volume 245, pages 25-28. doi:10.1016/j.matlet.2019.02.077
Roland Tellgren and Ivar Olovsson (1971): "Hydrogen Bond Studies. XXXXVI. The Crystal Structures of Normal and Deuterated Sodium Hydrogen Oxalate Monohydrate NaHC2O4·H2O and NaDC2O4·D2O". Journal of Chemical Physics, volume 54, issue 1. doi:10.1063/1.1674582
R. V. Lapshin (1998). "Automatic lateral calibration of tunneling microscope scanners" (PDF). Review of Scientific Instruments. 69 (9). USA: AIP: 3268–3276. Bibcode:1998RScI...69.3268L. doi:10.1063/1.1149091. ISSN 0034-6748.
R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode". Applied Surface Science. 470. Netherlands: Elsevier B. V.: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119191299.
Davey, Wheeler (1925). "Precision Measurements of the Lattice Constants of Twelve Common Metals". Physical Review. 25 (6): 753–761. Bibcode:1925PhRv...25..753D. doi:10.1103/PhysRev.25.753.
Saha, B. (2010). "Electronic structure, phonons, and thermal properties of ScN, ZrN, and HfN: A first-principles study" (PDF). Journal of Applied Physics. 107 (3): 033715–033715–8. Bibcode:2010JAP...107c3715S. doi:10.1063/1.3291117.

fast-page.org

lapshin.fast-page.org

R. V. Lapshin (1998). "Automatic lateral calibration of tunneling microscope scanners" (PDF). Review of Scientific Instruments. 69 (9). USA: AIP: 3268–3276. Bibcode:1998RScI...69.3268L. doi:10.1063/1.1149091. ISSN 0034-6748.

harvard.edu

ui.adsabs.harvard.edu

R. V. Lapshin (1998). "Automatic lateral calibration of tunneling microscope scanners" (PDF). Review of Scientific Instruments. 69 (9). USA: AIP: 3268–3276. Bibcode:1998RScI...69.3268L. doi:10.1063/1.1149091. ISSN 0034-6748.
R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode". Applied Surface Science. 470. Netherlands: Elsevier B. V.: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119191299.
Davey, Wheeler (1925). "Precision Measurements of the Lattice Constants of Twelve Common Metals". Physical Review. 25 (6): 753–761. Bibcode:1925PhRv...25..753D. doi:10.1103/PhysRev.25.753.
Saha, B. (2010). "Electronic structure, phonons, and thermal properties of ScN, ZrN, and HfN: A first-principles study" (PDF). Journal of Applied Physics. 107 (3): 033715–033715–8. Bibcode:2010JAP...107c3715S. doi:10.1063/1.3291117.

ias.ac.in

repository.ias.ac.in

Saha, B. (2010). "Electronic structure, phonons, and thermal properties of ScN, ZrN, and HfN: A first-principles study" (PDF). Journal of Applied Physics. 107 (3): 033715–033715–8. Bibcode:2010JAP...107c3715S. doi:10.1063/1.3291117.

nist.gov

physics.nist.gov

"Fundamental physical constants". physics.nist.gov. NIST. Retrieved 17 January 2020.

rssi.ru

ioffe.rssi.ru

"Semiconductor NSM". Retrieved 19 October 2014.

semanticscholar.org

api.semanticscholar.org

R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode". Applied Surface Science. 470. Netherlands: Elsevier B. V.: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119191299.

springermaterials.com

Goodenough, J. B.; Longo, M. "3.1.7 Data: Crystallographic properties of compounds with perovskite or perovskite-related structure, Table 2 Part 1". SpringerMaterials - The Landolt-Börnstein Database.

web.archive.org

"Unit cell definition using parallelepiped with lengths a, b, c and angles between the sides given by α, β, γ". Archived from the original on 4 October 2008.

worldcat.org

R. V. Lapshin (1998). "Automatic lateral calibration of tunneling microscope scanners" (PDF). Review of Scientific Instruments. 69 (9). USA: AIP: 3268–3276. Bibcode:1998RScI...69.3268L. doi:10.1063/1.1149091. ISSN 0034-6748.
R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode". Applied Surface Science. 470. Netherlands: Elsevier B. V.: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119191299.