Length measurement (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Length measurement" in English language version.

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10books.google.com

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amazon.com

W Whyte; R Paul (1997). "§7.3 Electromagnetic distance measurement". Basic Surveying (4th ed.). Laxton's. pp. 136 ff. ISBN 978-0-7506-1771-0.

arxiv.org

Peter J. Mohr; Barry N. Taylor; David B. Newell (2008). "CODATA recommended values of the fundamental physical constants: 2006". Rev Mod Phys. 80 (2): 633–730. arXiv:0801.0028. Bibcode:2008RvMP...80..633M. doi:10.1103/revmodphys.80.633. See section 8: Measurements involving silicon crystals, p. 46.

bipm.org

See "Metrological traceability". BIPM. Retrieved 2011-04-10.

books.google.com

Robert B Fisher; Kurt Konolige (2008). "§22.1.4: Time-of-flight range sensors". In Bruno Siciliano; Oussama Khatib (eds.). Springer handbook of robotics. Springer. pp. 528 ff. ISBN 978-3540239574.
For an overview, see for example, Walt Boyes (2008). "Interferometry and transit-time methods". Instrumentation reference book. Butterworth-Heinemann. p. 89. ISBN 978-0-7506-8308-1.
René Schödel (2009). "Chapter 15: Length and size". In Tōru Yoshizawa (ed.). Handbook of optical metrology: principles and applications. Vol. 10. CRC Press. p. 366. Bibcode:2009homp.book.....Y. ISBN 978-0-8493-3760-4.
The corner cube reflects the incident light in a parallel path that is displaced from the beam incident upon the corner cube. That separation of incident and reflected beams reduces some technical difficulties introduced when the incident and reflected beams are on top of each other. For a discussion of this version of the Michelson interferometer and other types of interferometer, see Joseph Shamir (1999). "§8.7 Using corner cubes". Optical systems and processes. SPIE Press. pp. 176 ff. ISBN 978-0-8194-3226-1.
Jesse Zheng (2005). Optical Frequency-Modulated Continuous-Wave (FMCW) Interferometry. Springer. Bibcode:2005ofmc.book.....Z. ISBN 978-0-387-23009-2.
SK Roy (2010). "§4.4 Basic principles of electronic distance measurement". Fundamentals of Surveying (2nd ed.). PHI Learning Pvt. Ltd. pp. 62 ff. ISBN 978-81-203-4198-2.
A discussion of interferometer errors is found in the article cited above: Miao Zhu; John L Hall (1997). "Chapter 11: Precise wavelength measurements of tunable lasers". In Thomas Lucatorto; et al. (eds.). Experimental method in the physical sciences. Academic Press. pp. 311 ff. ISBN 978-0-12-475977-0.
A discussion of various types of gratings is found in Abdul Al-Azzawi (2006). "§3.2 Diffraction gratings". Physical optics: principles and practices. CRC Press. pp. 46 ff. ISBN 978-0-8493-8297-0.
Mark H. Jones; Robert J. Lambourne; David John Adams (2004). An introduction to galaxies and cosmology. Cambridge University Press. pp. 88 ff. ISBN 978-0-521-54623-2. Relating one step on the distance ladder to another involves a process of calibration, that is, the use of an established method of measurement to give absolute meaning to the relative measurements provided by some other method.
Michael T. Postek (2005). "Photomask critical dimension metrology in the scanning electron microscope". In Syed Rizvi (ed.). Handbook of photomask manufacturing technology. CRC Press. pp. 457 ff. ISBN 978-0-8247-5374-0. and Harry J. Levinson (2005). "Chapter 9: Metrology". Principles of lithography (2nd ed.). SPIE Press. pp. 313 ff. ISBN 978-0-8194-5660-1.

colorado.edu

jila.colorado.edu

An example of a system combining the pulse and interferometer methods is described by Jun Ye (2004). "Absolute measurement of a long, arbitrary distance to less than an optical fringe" (PDF). Optics Letters. 29 (10): 1153–1155. Bibcode:2004OptL...29.1153Y. doi:10.1364/ol.29.001153. PMID 15182016. Archived from the original (PDF) on 2012-05-04. Retrieved 2011-11-30.

doi.org

An example of a system combining the pulse and interferometer methods is described by Jun Ye (2004). "Absolute measurement of a long, arbitrary distance to less than an optical fringe" (PDF). Optics Letters. 29 (10): 1153–1155. Bibcode:2004OptL...29.1153Y. doi:10.1364/ol.29.001153. PMID 15182016. Archived from the original (PDF) on 2012-05-04. Retrieved 2011-11-30.
Peter J. Mohr; Barry N. Taylor; David B. Newell (2008). "CODATA recommended values of the fundamental physical constants: 2006". Rev Mod Phys. 80 (2): 633–730. arXiv:0801.0028. Bibcode:2008RvMP...80..633M. doi:10.1103/revmodphys.80.633. See section 8: Measurements involving silicon crystals, p. 46.
NG Orji; Garcia-Gutierrez; Bunday; Bishop; Cresswell; Allen; Allgair; et al. (2007). Archie, Chas N (ed.). "TEM calibration methods for critical dimension standards" (PDF). Proceedings of SPIE (FTP). Metrology, Inspection, and Process Control for Microlithography XXI. p. 651810. Bibcode:2007SPIE.6518E..10O. doi:10.1117/12.713368. S2CID 54698571.^{[dead ftp link]} (To view documents see Help:FTP)

harvard.edu

ui.adsabs.harvard.edu

An example of a system combining the pulse and interferometer methods is described by Jun Ye (2004). "Absolute measurement of a long, arbitrary distance to less than an optical fringe" (PDF). Optics Letters. 29 (10): 1153–1155. Bibcode:2004OptL...29.1153Y. doi:10.1364/ol.29.001153. PMID 15182016. Archived from the original (PDF) on 2012-05-04. Retrieved 2011-11-30.
René Schödel (2009). "Chapter 15: Length and size". In Tōru Yoshizawa (ed.). Handbook of optical metrology: principles and applications. Vol. 10. CRC Press. p. 366. Bibcode:2009homp.book.....Y. ISBN 978-0-8493-3760-4.
Jesse Zheng (2005). Optical Frequency-Modulated Continuous-Wave (FMCW) Interferometry. Springer. Bibcode:2005ofmc.book.....Z. ISBN 978-0-387-23009-2.
Peter J. Mohr; Barry N. Taylor; David B. Newell (2008). "CODATA recommended values of the fundamental physical constants: 2006". Rev Mod Phys. 80 (2): 633–730. arXiv:0801.0028. Bibcode:2008RvMP...80..633M. doi:10.1103/revmodphys.80.633. See section 8: Measurements involving silicon crystals, p. 46.
NG Orji; Garcia-Gutierrez; Bunday; Bishop; Cresswell; Allen; Allgair; et al. (2007). Archie, Chas N (ed.). "TEM calibration methods for critical dimension standards" (PDF). Proceedings of SPIE (FTP). Metrology, Inspection, and Process Control for Microlithography XXI. p. 651810. Bibcode:2007SPIE.6518E..10O. doi:10.1117/12.713368. S2CID 54698571.^{[dead ftp link]} (To view documents see Help:FTP)

nih.gov

pubmed.ncbi.nlm.nih.gov

An example of a system combining the pulse and interferometer methods is described by Jun Ye (2004). "Absolute measurement of a long, arbitrary distance to less than an optical fringe" (PDF). Optics Letters. 29 (10): 1153–1155. Bibcode:2004OptL...29.1153Y. doi:10.1364/ol.29.001153. PMID 15182016. Archived from the original (PDF) on 2012-05-04. Retrieved 2011-11-30.

nist.gov

emtoolbox.nist.gov

For example, the index of refraction of air can be found based upon entering a wavelength in vacuum into the calculator provided by NIST: "Refractive index of air calculator". Engineering metrology toolbox. NIST. September 23, 2010. Retrieved 2011-12-08.

physics.nist.gov

"Lattice parameter of silicon". The NIST reference on constants, units and uncertainty. National Institute of Standards and Technology. Retrieved 2011-04-04.

semanticscholar.org

api.semanticscholar.org

NG Orji; Garcia-Gutierrez; Bunday; Bishop; Cresswell; Allen; Allgair; et al. (2007). Archie, Chas N (ed.). "TEM calibration methods for critical dimension standards" (PDF). Proceedings of SPIE (FTP). Metrology, Inspection, and Process Control for Microlithography XXI. p. 651810. Bibcode:2007SPIE.6518E..10O. doi:10.1117/12.713368. S2CID 54698571.^{[dead ftp link]} (To view documents see Help:FTP)

web.archive.org

An example of a system combining the pulse and interferometer methods is described by Jun Ye (2004). "Absolute measurement of a long, arbitrary distance to less than an optical fringe" (PDF). Optics Letters. 29 (10): 1153–1155. Bibcode:2004OptL...29.1153Y. doi:10.1364/ol.29.001153. PMID 15182016. Archived from the original (PDF) on 2012-05-04. Retrieved 2011-11-30.