Jenihhin, M.; Lai, X.; Ghasempouri, T.; Raik, J. (October 2018). "Towards Multidimensional Verification: Where Functional Meets Non-Functional". 2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC). pp. 1–7. arXiv:1908.00314. doi:10.1109/NORCHIP.2018.8573495. ISBN978-1-5386-7656-1. S2CID56170277.
Dai, Wei; Maropoulos, Paul G.; Zhao, Yu (2 January 2015). "Reliability modelling and verification of manufacturing processes based on process knowledge management". International Journal of Computer Integrated Manufacturing. 28 (1): 98–111. doi:10.1080/0951192X.2013.834462. ISSN0951-192X. S2CID32995968.
Jenihhin, M.; Lai, X.; Ghasempouri, T.; Raik, J. (October 2018). "Towards Multidimensional Verification: Where Functional Meets Non-Functional". 2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC). pp. 1–7. arXiv:1908.00314. doi:10.1109/NORCHIP.2018.8573495. ISBN978-1-5386-7656-1. S2CID56170277.
Dai, Wei; Maropoulos, Paul G.; Zhao, Yu (2 January 2015). "Reliability modelling and verification of manufacturing processes based on process knowledge management". International Journal of Computer Integrated Manufacturing. 28 (1): 98–111. doi:10.1080/0951192X.2013.834462. ISSN0951-192X. S2CID32995968.
Jenihhin, M.; Lai, X.; Ghasempouri, T.; Raik, J. (October 2018). "Towards Multidimensional Verification: Where Functional Meets Non-Functional". 2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC). pp. 1–7. arXiv:1908.00314. doi:10.1109/NORCHIP.2018.8573495. ISBN978-1-5386-7656-1. S2CID56170277.
Dai, Wei; Maropoulos, Paul G.; Zhao, Yu (2 January 2015). "Reliability modelling and verification of manufacturing processes based on process knowledge management". International Journal of Computer Integrated Manufacturing. 28 (1): 98–111. doi:10.1080/0951192X.2013.834462. ISSN0951-192X. S2CID32995968.