TSOM (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "TSOM" in English language version.

refsWebsite

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17^th place

355^th place

454^th place

1web.archive.org

1^st place

1^st place

low place

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1spiedigitallibrary.org

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doi.org (Global: 2^nd place; English: 2^nd place)

Ravikiran Attota; Ronald G. Dixson; Andras E. Vladár (2011-06-01). "Through-focus scanning optical microscopy". www.spiedigitallibrary.org. doi:10.1117/12.884706.
Attota, R.; Bunday, B.; Vartanian, V. (2013). "Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node". Appl. Phys. Lett. 102 (22): 222107. Bibcode:2013ApPhL.102v2107A. doi:10.1063/1.4809512.
Attota, R.; Dixson, R.G. (2014). "Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes". Appl. Phys. Lett. 105 (4): 043101. Bibcode:2014ApPhL.105d3101A. doi:10.1063/1.4891676.
Attota, R.; Kavuri, P.P.; Kang, H.; Kasica, R.; Chen, L. (2014). "Nanoparticle size determination using optical microscopes". Appl. Phys. Lett. 105 (16): 163105. Bibcode:2014ApPhL.105p3105A. doi:10.1063/1.4900484.
Kang, H.; Attota, R.; Tondare, V.; Vladar, A.E.; Kavuri, P. (2015). "A method to determine the number of nanoparticles in a cluster using conventional optical microscopes". Appl. Phys. Lett. 107 (10): 103106. Bibcode:2015ApPhL.107j3106K. doi:10.1063/1.4930994.

harvard.edu (Global: 18^th place; English: 17^th place)

ui.adsabs.harvard.edu

Attota, R.; Bunday, B.; Vartanian, V. (2013). "Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node". Appl. Phys. Lett. 102 (22): 222107. Bibcode:2013ApPhL.102v2107A. doi:10.1063/1.4809512.
Attota, R.; Dixson, R.G. (2014). "Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes". Appl. Phys. Lett. 105 (4): 043101. Bibcode:2014ApPhL.105d3101A. doi:10.1063/1.4891676.
Attota, R.; Kavuri, P.P.; Kang, H.; Kasica, R.; Chen, L. (2014). "Nanoparticle size determination using optical microscopes". Appl. Phys. Lett. 105 (16): 163105. Bibcode:2014ApPhL.105p3105A. doi:10.1063/1.4900484.
Kang, H.; Attota, R.; Tondare, V.; Vladar, A.E.; Kavuri, P. (2015). "A method to determine the number of nanoparticles in a cluster using conventional optical microscopes". Appl. Phys. Lett. 107 (10): 103106. Bibcode:2015ApPhL.107j3106K. doi:10.1063/1.4930994.

nist.gov (Global: 355^th place; English: 454^th place)

"Dr. Ravikiran Attota". Archived from the original on 2016-06-16. Retrieved 2017-07-13.
Attota, Ravikiran. "Nanoscale Measurements With TSOM* Optical Method" (PDF). www.nist.gov.

rdmag.com (Global: low place; English: low place)

"Research & Development World".

spiedigitallibrary.org (Global: low place; English: low place)

proceedings.spiedigitallibrary.org

Ravikiran Attota; Ronald G. Dixson; Andras E. Vladár (2011-06-01). "Through-focus scanning optical microscopy". www.spiedigitallibrary.org. doi:10.1117/12.884706.

web.archive.org (Global: 1^st place; English: 1^st place)

"Dr. Ravikiran Attota". Archived from the original on 2016-06-16. Retrieved 2017-07-13.