Microscopio de efecto túnel (Spanish Wikipedia)

Analysis of information sources in references of the Wikipedia article "Microscopio de efecto túnel" in Spanish language version.

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11doi.org

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5nanoworld.org

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archive.org

G. Binnig, H. Rohrer (1986). «Scanning tunneling microscopy». IBM Journal of Research and Development 30: 4. </rComunicado de prensa para el Premio Nobel de Física 1986
D. A. Bonnell and B. D. Huey (2001). «Basic principles of scanning probe microscopy». En D. A. Bonnell, ed. Scanning probe microscopy and spectroscopy: Theory, techniques, and applications (2 edición). Nueva York: Wiley-VCH. ISBN 047124824X.
R. Wiesendanger, I. V. Shvets, D. Bürgler, G. Tarrach, H.-J. Güntherodt, and J.M.D. Coey (1992). «Recent advances in spin-polarized scanning tunneling microscopy». Ultramicroscopy. 42-44: 338. doi:10.1016/0304-3991(92)90289-V.

arxiv.org

Pan, S. H.; Hudson, EW; Lang, KM; Eisaki, H; Uchida, S; Davis, JC (2000). «Imaging the effects of individual zinc impurity atoms on superconductivity in Bi2Sr2CaCu2O8+delta». Nature 403 (6771): 746-750. Bibcode:2000Natur.403..746P. PMID 10693798. arXiv:cond-mat/9909365. doi:10.1038/35001534.

books.google.com

C. Bai (2000). Scanning tunneling microscopy and its applications. Nueva York: Springer Verlag. ISBN 3540657150.
K. Oura, V. G. Lifshits, A. A. Saranin, A. V. Zotov, and M. Katayama (2003). Surface science: an introduction. Berlin: Springer-Verlag. ISBN 3540005455.

columbia.edu

C. Julian Chen (1993). Introduction to Scanning Tunneling Microscopy. Oxford University Press. ISBN 0195071506. Archivado desde el original el 23 de enero de 2013. Consultado el 29 de septiembre de 2011.

doi.org

dx.doi.org

Pan, S. H.; Hudson, EW; Lang, KM; Eisaki, H; Uchida, S; Davis, JC (2000). «Imaging the effects of individual zinc impurity atoms on superconductivity in Bi2Sr2CaCu2O8+delta». Nature 403 (6771): 746-750. Bibcode:2000Natur.403..746P. PMID 10693798. arXiv:cond-mat/9909365. doi:10.1038/35001534.
G. Schitter, M. J. Rost (2008). «Scanning probe microscopy at video-rate» (PDF). Materials Today (UK: Elsevier) 11 (special issue): 40-48. ISSN 1369-7021. doi:10.1016/S1369-7021(09)70006-9. Archivado desde el original el 9 de septiembre de 2009.
R. V. Lapshin, O. V. Obyedkov (1993). «Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes» (PDF). Review of Scientific Instruments 64 (10): 2883-2887. Bibcode:1993RScI...64.2883L. doi:10.1063/1.1144377.
B. S. Swartzentruber (1996). «Direct measurement of surface diffusion using atom-tracking scanning tunneling microscopy». Physical Review Letters 76 (3): 459-462. Bibcode:1996PhRvL..76..459S. PMID 10061462. doi:10.1103/PhysRevLett.76.459.
«STM carbon nanotube tips fabrication for critical dimension measurements». Sensors and Actuators A. 123-124: 655. 2005. doi:10.1016/j.sna.2005.02.036.
R. V. Lapshin (1995). «Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope» (PDF). Review of Scientific Instruments 66 (9): 4718-4730. Bibcode:1995RScI...66.4718L. doi:10.1063/1.1145314.
R. V. Lapshin (2007). «Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition» (PDF). Measurement Science and Technology 18 (3): 907-927. Bibcode:2007MeScT..18..907L. doi:10.1088/0957-0233/18/3/046.
R. V. Lapshin (2004). «Feature-oriented scanning methodology for probe microscopy and nanotechnology» (PDF). Nanotechnology 15 (9): 1135-1151. Bibcode:2004Nanot..15.1135L. doi:10.1088/0957-4484/15/9/006.
R. Wiesendanger, I. V. Shvets, D. Bürgler, G. Tarrach, H.-J. Güntherodt, and J.M.D. Coey (1992). «Recent advances in spin-polarized scanning tunneling microscopy». Ultramicroscopy. 42-44: 338. doi:10.1016/0304-3991(92)90289-V.
J. Bardeen (1961). «Tunneling from a many particle point of view». Phys. Rev. Lett. 6 (2): 57-59. Bibcode:1961PhRvL...6...57B. doi:10.1103/PhysRevLett.6.57.
R. Young, J. Ward, F. Scire (1972). «The Topografiner: An Instrument for Measuring Surface Topography». Rev. Sci. Instrum. 43: 999. doi:10.1063/1.1685846. Archivado desde el original el 8 de marzo de 2012.

harvard.edu

adsabs.harvard.edu

Pan, S. H.; Hudson, EW; Lang, KM; Eisaki, H; Uchida, S; Davis, JC (2000). «Imaging the effects of individual zinc impurity atoms on superconductivity in Bi2Sr2CaCu2O8+delta». Nature 403 (6771): 746-750. Bibcode:2000Natur.403..746P. PMID 10693798. arXiv:cond-mat/9909365. doi:10.1038/35001534.
R. V. Lapshin, O. V. Obyedkov (1993). «Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes» (PDF). Review of Scientific Instruments 64 (10): 2883-2887. Bibcode:1993RScI...64.2883L. doi:10.1063/1.1144377.
B. S. Swartzentruber (1996). «Direct measurement of surface diffusion using atom-tracking scanning tunneling microscopy». Physical Review Letters 76 (3): 459-462. Bibcode:1996PhRvL..76..459S. PMID 10061462. doi:10.1103/PhysRevLett.76.459.
R. V. Lapshin (1995). «Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope» (PDF). Review of Scientific Instruments 66 (9): 4718-4730. Bibcode:1995RScI...66.4718L. doi:10.1063/1.1145314.
R. V. Lapshin (2007). «Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition» (PDF). Measurement Science and Technology 18 (3): 907-927. Bibcode:2007MeScT..18..907L. doi:10.1088/0957-0233/18/3/046.
R. V. Lapshin (2004). «Feature-oriented scanning methodology for probe microscopy and nanotechnology» (PDF). Nanotechnology 15 (9): 1135-1151. Bibcode:2004Nanot..15.1135L. doi:10.1088/0957-4484/15/9/006.
J. Bardeen (1961). «Tunneling from a many particle point of view». Phys. Rev. Lett. 6 (2): 57-59. Bibcode:1961PhRvL...6...57B. doi:10.1103/PhysRevLett.6.57.

issn.org

portal.issn.org

G. Schitter, M. J. Rost (2008). «Scanning probe microscopy at video-rate» (PDF). Materials Today (UK: Elsevier) 11 (special issue): 40-48. ISSN 1369-7021. doi:10.1016/S1369-7021(09)70006-9. Archivado desde el original el 9 de septiembre de 2009.

materialstoday.com

G. Schitter, M. J. Rost (2008). «Scanning probe microscopy at video-rate» (PDF). Materials Today (UK: Elsevier) 11 (special issue): 40-48. ISSN 1369-7021. doi:10.1016/S1369-7021(09)70006-9. Archivado desde el original el 9 de septiembre de 2009.

nanoworld.org

R. V. Lapshin, O. V. Obyedkov (1993). «Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes» (PDF). Review of Scientific Instruments 64 (10): 2883-2887. Bibcode:1993RScI...64.2883L. doi:10.1063/1.1144377.
R. V. Lapshin (1995). «Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope» (PDF). Review of Scientific Instruments 66 (9): 4718-4730. Bibcode:1995RScI...66.4718L. doi:10.1063/1.1145314.
R. V. Lapshin (2007). «Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition» (PDF). Measurement Science and Technology 18 (3): 907-927. Bibcode:2007MeScT..18..907L. doi:10.1088/0957-0233/18/3/046.
R. V. Lapshin (2004). «Feature-oriented scanning methodology for probe microscopy and nanotechnology» (PDF). Nanotechnology 15 (9): 1135-1151. Bibcode:2004Nanot..15.1135L. doi:10.1088/0957-4484/15/9/006.
R. Young, J. Ward, F. Scire (1972). «The Topografiner: An Instrument for Measuring Surface Topography». Rev. Sci. Instrum. 43: 999. doi:10.1063/1.1685846. Archivado desde el original el 8 de marzo de 2012.

nih.gov

ncbi.nlm.nih.gov

Pan, S. H.; Hudson, EW; Lang, KM; Eisaki, H; Uchida, S; Davis, JC (2000). «Imaging the effects of individual zinc impurity atoms on superconductivity in Bi2Sr2CaCu2O8+delta». Nature 403 (6771): 746-750. Bibcode:2000Natur.403..746P. PMID 10693798. arXiv:cond-mat/9909365. doi:10.1038/35001534.
B. S. Swartzentruber (1996). «Direct measurement of surface diffusion using atom-tracking scanning tunneling microscopy». Physical Review Letters 76 (3): 459-462. Bibcode:1996PhRvL..76..459S. PMID 10061462. doi:10.1103/PhysRevLett.76.459.

nist.gov

nvl.nist.gov

«The Topografiner: An Instrument for Measuring Surface Microtopography». NIST. Archivado desde el original el 5 de mayo de 2010. Consultado el 29 de septiembre de 2011.

nobelprize.org

G. Binnig, H. Rohrer (1986). «Scanning tunneling microscopy». IBM Journal of Research and Development 30: 4. </rComunicado de prensa para el Premio Nobel de Física 1986

web.archive.org

C. Julian Chen (1993). Introduction to Scanning Tunneling Microscopy. Oxford University Press. ISBN 0195071506. Archivado desde el original el 23 de enero de 2013. Consultado el 29 de septiembre de 2011.
G. Schitter, M. J. Rost (2008). «Scanning probe microscopy at video-rate» (PDF). Materials Today (UK: Elsevier) 11 (special issue): 40-48. ISSN 1369-7021. doi:10.1016/S1369-7021(09)70006-9. Archivado desde el original el 9 de septiembre de 2009.
R. Young, J. Ward, F. Scire (1972). «The Topografiner: An Instrument for Measuring Surface Topography». Rev. Sci. Instrum. 43: 999. doi:10.1063/1.1685846. Archivado desde el original el 8 de marzo de 2012.
«The Topografiner: An Instrument for Measuring Surface Microtopography». NIST. Archivado desde el original el 5 de mayo de 2010. Consultado el 29 de septiembre de 2011.